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See Also: Instrument Cables, Modular Instruments, Instrumentation Amplifiers


Showing results: 4726 - 4740 of 4983 items found.

  • Shield Level / Pathloss Equipment

    PAMS & PAMS-C - Praxsym

    PAMS is a user-friendly, transmitter and receiver system that measures shielding effectiveness in RF shielded enclosures.   Lightweight and compact, each PAMS unit measures approximately 12” x 5” x 5” and weighs 5.5 lbs., making PAMS ideally suited to field measurement tasks.  Rugged construction insures instrument survivability in a field test environment. PAMS-C is a simple and efficient solution for quickly identifying shielding faults in an RF shielded enclosure.  Cousin to the original PAMS used extensively by customers operating RF Shielded Enclosures, PAMS-C gives commercial end-users everything needed to measure shielding effectiveness levels of critical infrastructure - all with minimal or no interruption to normal operations.

  • Vacuum Technologies

    Agilent Technologies

    Agilent vacuum pumps, pumping systems, measurement instruments, components, and helium leak detectors allow you to create, measure, and maintain vacuum for your applications, processes, or research. Learn about Agilent's clean, dry, quiet IDP scroll pumps, high performance, high compression TwisTorr turbo pumps, optimized, UHV/XHV ready ion pumps and controllers, and rugged, reliable helium leak detectors.Agilent leverages its Varian Vacuum roots to fulfill your vacuum needs with product value and experienced, knowledgeable support. Agilent pumps, systems, and components enable advanced research in physics, analytical instrumentation, and nanotechnology, they are also a perfect fit for industrial processes.

  • Duplex Double Test Insertion/Return Loss Test Station

    JW8302 - Shanghai Joinwit optoelectronic Tech,co.,Ltd

    JW8302 Duplex double test Insertion/Return Loss Test Station is a professional equipment to test CWDM device, multi-wavelength device, PLC, fiber optical patch cord and other passive optical devices. It is a new-generation precision optical instrument of JOINWIT who combined with so many years  experience in optical passive detection. It equipped with VFL or 850 light source , supporting threshold determination, automatic multi-wavelength detection, system integration, secondary development, upper computer solution, etc. Double LC interface or other different interfaces can be tested simultaneously which is convenient for testing and improves efficiency; The  VFL function could automatic on and off, no need to replace the connector.

  • High Frequency LCR Meters up to 30MHz

    11050 - Chroma Systems Solutions, Inc.

    The Chroma 11050 Series HF LCR Meter is a precision test instrument designed to accurately measure and evaluate passive components at high speeds. Its measurement capabilities cover the primary and secondary parameters required for testing the inductance, capacitance, resistance, quality factor and loss factor of passive components. The HF LCR Meter has a broad testing frequency range 75kHz~30MHz/1kHz~10 MHz/60Hz~5MHz suitable for analyzing component characteristics under different frequencies. Its 0.1% basic measurement accuracy provides stable and highly reliable results. A fast 7ms measurement speed effectively increases productivity when working in an automated environment.

  • Ultrasonic Thickness Gauge

    QTG Series - Qualitest International Inc.

    Ultrasonic Thickness Gauge - QTG Series are economical, user-friendly, menu driven, and multi-functional units offering extensive features from basic measurements (model: QTG I) to extended memory (5000 reading storage) and USB output capabilities (model QTG II). The instrument can measure with very high resolution (0.01 mm or 0.001 inches) the thickness of metallic and non-metallic materials such as steel, aluminum, titanium, plastics, ceramics, glass and any other good ultrasonic wave conductor. The Ultrasonic Thickness Gauge - QTG Series accurately displays readings in either inches or millimeters and is equipped with special features like Automatic recognition of probes with different frequencies and Automatic zeroing of the unit.

  • Versatile quality control testing system

    QuickSun® 550Ei - Endeas Oy

    QuickSun 550Ei is a versatile testing system for qualifying of PV modules with dimensions up to 105 x 205 cm2. Basic set up includes a top class solar simulator which measures modules in sunny side up position enabling e.g. soiling simulations. Several additional measurement methods can be integrated to the same system including high resolution EL imaging with analysis software from one of the most recognized EL system suppliers. Also hot spot revealing IR images can be recorded by applying either forward or reverse bias current, and true nA scale leakage current measurements can be performed with sensitive enough instruments.

  • 3 Phase Reference Standard

    ZERA® COM5003 - Powermetrix Systems

    The COM5003 Reference Standard is part of the ZERA/Powermetrix high precision measuring instrument series. With the highest accuracy of 0.005 % (50 ppm), the COM5003 presents its new innovative digital technology and extended features for measurement. As a primary standard, the COM5003 is designed for testing current and voltage meters as well as single- or three-phase power and energy meter testing systems. This precise technology is especially useful in metrological institutes, official utility lab applications, and other environments for energy suppliers or manufacturers of electric meters and designed for integration of existing systems. All operation, measurements and data visualizations can be viewed using by the COM5003’s simple user interface and 9“ touchscreen.

  • GPIB General Purpose Interface Bus

    Amida Technology, Inc.

    The design of the GPIB control card is fully compatible with the IEEE 488.1 and IEEE 488.2 standards, using the PCI interface, supporting the Plug & Play specification, and supporting Windows 95/98/Me /NT4.0/ 2000 /XP/7 Operating system, driver function library includes Windows development software tools such as Visual C++, Borland C++ Builder, Labwindows, Visual Basic, Delphi and Labview. This GPIB-supported library provides an NI-like command control syntax format, which is convenient for users to develop and transfer applications smoothly. This interface card also provides a conversational window GPIB interface program, which is convenient for users to directly control the instrument without writing a program.

  • 6TL36 Plus In-line Test Handler w/Bypass

    EA923 - 6TL Engineering

    - Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE

  • Vector Signal Generator

    SMBV100B - Rohde & Schwarz GmbH & Co. KG

    The state-of-the-art R&S®SMBV100B vector signal generator sets standards for its class. Ultra high output power, fully calibrated wideband signal generation and intuitive touchscreen operation make the R&S®SMBV100B ideal for all kinds of applications.Always in line with the latest major digital communications standards, such as 5G NR, LTE and WLAN, the SMBV100B is the preferred test solution for receiver and component characterization.The R&S®SMBV100B has many GNSS options that transform the instrument into a reliable, full-featured GNSS simulator. Advanced simulation capabilities can run realistic and complex yet repeatable GNSS scenarios under controlled conditions.

  • JTAG Functional Test

    JFT - JTAG Technologies Inc.

    JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)

  • PXIe-5170, 4- or 8-Channel, 100 MHz Bandwidth, 14-Bit, Reconfigurable Oscilloscope

    783691-01 - NI

    PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T FPGA Reconfigurable PXI Oscilloscope—The PXIe‑5170 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe‑5170 also features a programmable Kintex‑7 325T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.

  • PXIe-5451, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator

    781204-01 - NI

    PXIe, 145 MHz, 16-Bit, 128 MB, PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.

  • PXIe-5451, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator

    781204-03 - NI

    PXIe, 145 MHz, 16-Bit, 2 GB PXI Waveform Generator—The PXIe‑5451 is a 145 MHz, dual‐channel arbitrary waveform generator capable of generating user-definied waveforms, standard functions, and I/Q communications signals. It is an ideal instrument for including in systems for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator as wells as time-domain signals like envelope tracking. The PXIe‑5451 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5451 also features advanced synchronization and data streaming capabilities.

  • PXIe-5172, 250 MS/s, 14-bit Reconfigurable Oscilloscope

    784226-01 - NI

    PXIe, 100 MHz, 4- or 8-Channel, 14-Bit, Kintex-7 325T or 410T FPGA Reconfigurable PXI Oscilloscope—The PXIe 5172 high-density PXI oscilloscope has eight simultaneously-sampled channels with flexible settings for coupling and voltage range. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for applications with many channels that require up to 250 MS/s or 100 MHz of analog bandwidth and advanced PXI synchronization. The PXIe 5172 also features a programmable Kintex-7 325T or 410T FPGA that can be used for custom acquisition, triggering, signal processing, and data streaming.

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