Showing results: 46 - 60 of 513 items found.
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Sidartec
We have available with us diverse array of Vision System. These systems are based on high-end technologies and meet the requirements of diverse sectors. Further, our systems are an epitome of quality and available at economical prices. Details of different systems.
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ASML
Our optical and e-beam wafer metrology and inspection products quickly and accurately measure pattern quality before and during high-volume chip manufacturing.
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7940 -
Chroma ATE Inc.
Chroma 7940 wafer chip inspection system is an automated inspection system for postdiced wafer chip inspection.
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INSPECTRA® IR Series -
Toray Engineering Co., Ltd.
An infrared internal defect inspection system has been added to the INSPECTRA® series.It is now possible to inspection with both infrared and visual light in one system.
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7945 -
Chroma ATE Inc.
Chroma 7945 wafer chip inspection system is an automated inspection system for pre and post diced patterned wafers. Change kits enable switching between various applications by allowing different carriers including metal frame or grip ring.
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VERSAMag -
FS Inspection
Advanced technology and a sleek design come together in the VERSAMag High-Magnification Inspection System. The HD high-resolution camera generates sharp images, resulting in exceptional inspection of objects at all magnification levels. This portable visual inspection system has magnification up to 155x with real-time video inspection and intuitive controls. The VERSAMag has a multi-axis positioning camera and adjustable Z-height arm for versatility to inspect objects of various shapes and sizes. When paired with FSInspection Software, the VERSAMag has measurement, image capture, and annotation capabilities.
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INSPECTRA® PL Series -
Toray Engineering Co., Ltd.
This system uses luminescent images created using photoluminescence (PL) to perform high-speed, high-sensitivity automatic inspection for crystal defects, cracks, and luminescence defects which cannot be detected with conventional visible light surface inspection!
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AT-940 -
Airfield Technology, Inc.
The AT-940 is a mobile and deployable flight inspection system providing high performance in the smallest possible package.
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CIX90 -
Olympus Corp.
The OLYMPUS CIX90 technical cleanliness inspection system is a dedicated, turnkey solution for manufacturers who maintain high quality standards for the cleanliness of manufactured components. The OLYMPUS CIX90 system makes it easy to quickly acquire, process, and document technical cleanliness inspection data to comply with international standards. The system is intuitively designed to guide users through each step of the process so that even novice inspectors can acquire important cleanliness data quickly and easily.
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Automated Precision Inc.
API, recognizing manufacturing industry’s increasing demand for part measurement automation, with a higher degree of accuracy, has developed its Smart Factory Inspection System with true 6 Degrees of Freedom (6DoF) real-time 3D robotic measurement incorporating its proven metrology technology and calibration components.SFIS can be delivered as a customized integrated solution or as a standard production inspection cell.
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X-eye NF120 -
SEC Co., Ltd.
Nano-focus Tube of 400 nano resolution is installed which is specialized for Semiconductor Packaging, Wafer Level Packaging(WLP) requiring detection of Sub-micron defects.Able to trace and inspect defected area precisely by precise movement of axis with Anti-vibration table.Tomography is available if 3D CT module is added and Wafer Bump Automatic Inspection is available from loading to inspection with wafer handler systems.
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Ofil Ltd.
Manual and Automatic inspection systems mounted on vehicles such as motortruck, van, railway testing wagons etc. Operation is either on the move or during a stop. Ideal for inspecting transmission and distribution lines and for electric transportation.
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Cantrell-Gainco Group
Choosing the best inspection system is critical to meeting the ever-stricter food quality standards of the world’s leading poultry and meat processors. That’s why Cantrell•Gainco is an authorized distributor for Anritsu X-ray detection equipment, a leading technological powerhouse in the industry.
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Intego GmbH
Due to their special material properties, ceramic and glass components are the basis of many high-tech products. The same properties make the production complex and costly. Substrate defects that lead to failure of finished components should be avoided at all costs. For this reason, early automated optical inspection is essential.For the inspection of sapphire and quartz glass Intego has developed systems to detect both external and internal defects and can also provide cutting suggestions. Using index matching it is possible to test rough or uneven glass profiles.For the inspection of ceramic components Intego offers solutions specifically tailored to the respective testing task. Our modular design uses standard components that have already been developed and tested and in most cases only requires minimal adaptation.
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KY8030-3 -
Koh Young Technology
The new KY8030-3 delivers 3x fasterinspection without compromisingperformance and accuracy.Using patented dual projection,the system eliminates the criticalShadow problem that all 3D SPI systemscan be vulnerable to.Additionally, the new KY8030-3 has solvedthe PCB Warp problem that seriouslyimpacts inspection accuracyand reliability of result.