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Showing results: 376 - 390 of 513 items found.

  • Ultrasonic Leak Detector

    Tru Pointe 2100 - Bacharach, Inc.

    Bacgarach’s Tru Pointe® 2100 Ultrasonic Leak Detector is an ultra-versatile ultrasonic leak inspection system that can be used for both leak detection and mechanical PPM/inspection/troubleshooting. It is capable of finding leaks of any gas type, including refrigerants, air (compressed or vacuum) and nitrogen. The Tru Pointe® 2100 can also be used for thermal expansion valves, steam traps, bearings and more.

  • 3D Optical Microscopy

    Bruker Nano Surfaces

    Bruker is the worldwide leader in 3D surface measurement and inspection, offering fast, non-contact analyses for samples ranging in size from microscopic MEMS to entire engine blocks. Our microscopes are the culmination of ten generations of proprietary Wyko® Technology advances that provide the high sensitivity and stability necessary for precision 3D surface measurements in applications and environments that are challenging for other metrology systems.

  • Mobile Optical 3D Measuring System for Online Photogrammetry

    PONTOS Live - GOM GmbH

    PONTOS Live is GOM’s tracking system for positioning components, as for a precise alignment on CNC machines or for the adjustment of fixtures. Combined with the GOM Touch Probe, PONTOS Live allows the inspection of areas that are optically difficult to access. Based on the triangulation principle, PONTOS Live analyzes components of different sizes – from a few millimeters up to several meters – point by point and regardless of the material.

  • In-Sight Explorer Software

    Cognex Corporation

    Ease-of-use is built into the heart of In-Sight vision systems starting with easy to use but powerful vision tools and In-Sight Explorer software interface. A spreadsheet view makes the user experience very simple for maximum control over your optical inspection applications. The In-Sight Explorer software also includes an EasyBuilder configuration environment for deploying reliable applications quickly, with no programming required.

  • Semiconductor & Flat Panel Display Inspection Microscopes

    MX63 / MX63L - Olympus Corp.

    The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.

  • Refrigerant Leak Detector

    Extech RD300 - Extech Instruments Corporation

    The RD300 Refrigerant Leak Detector detects leakages from air-conditioning units and cooling systems. It's easy to use and is ideal for detecting leaks from air-conditioning units and cooling systems that use all standard refrigerants. The multi-colored LED light bar indicates the level of leaking refrigerant detected by the RD300. The built-in, bright LED convenience light located at the sensor tip illuminates dimly lit inspection areas. Complete with leak test bottle, 9V battery, and protective hard carrying case.

  • Laser Radar shop floor CMM

    Nikon Metrology, Inc.

    With the need for shorter and more flexible production cycles, automotive manufacturers are continuously looking to cut time and costs whilst improving product quality. The Laser Radar mounted on an industrial robot introduces an innovative approach to body-in-white (BIW) inspection. This shop floor system provides accurate, dimensional measurements in the car coordinate system allowing direct comparison to CAD without the need for a reference part. Unlike horizontal-arm CMM, its high-speed measurements fit within short production cycle times.

  • Radiant

    Konica Minolta Sensing Americas, Inc

    Radiant Vision Systems engineers advanced imaging systems to critically evaluate light, color, manufacturing integrity, and surface quality of illuminated displays and device assemblies. World leaders in manufacturing rely on Radiant Vision Systems for test and measurement solutions that ensure quality, reduce costs, and improve efficiencies. Radiant products include TrueTest™ Automated Visual Inspection systems for measurement and control, ProMetric® Imaging Colorimeters and Photometers, lenses for view angle performance measurement, and the most extensive machine vision software tool library for production-level measurement and control. We back our systems with outstanding consultative technical support, ensuring that our clients enjoy and leverage all the value built into their systems.

  • Robotics and Machine Vision Standards

    Applied Image, Inc.

    Accuracy in machine vision systems is critical to achieving strategic goals regarding quality, efficiency, and consistency. Use our ACCUplace product lines to calibrate vision systems’ distortion, placement/alignment, or other field parameters in systems used for guidance, identification, gauging, and inspection. Using our specialized ACCUedge® technology, our Robotic and Machine Vision Standards are manufactured with line-edge quality that is second to none in the industry, providing the precision needed to calibrate almost any system. Should you need to alter feature patterns, size, or substrate to fit your needs, fill out our Optical Components and Standards form to start the conversation.

  • CMOS USB3 Cameras

    CELERA One Series - Alkeria Srl

    CELERA One camera series provide the same excellence in quality, flexibility and performances of CELERA cameras, with the only exception of a single USB3 interface, while keeping the original extremely reduced dimensions and rugged design that make CELERA One cameras suitable for most applications: automated optical inspection, high performance sorting systems, industrial metrology, microscopy, medical diagnostics and machine vision.

  • X-Scan U

    Detection Technology Inc.

    X-Scan U series based on the novel digital platform improves image quality, increases maximum scanning speed and saves the overall system cost of industrial in-line and off-line nondestructive testing (NDT) of tires. X-Scan U series is an enhanced product family of U-shaped X-ray line cameras developed and optimized specially for high-speed digital tire inspection utilizing panoramic X-ray sources.

  • Micromachining Laser Workstation System

    Haas Laser Technologies, Inc.

    The enclosure design utilizes extruded aluminum framework construction. The light-tight design with removable interlocked covers, panels and doors provide easy and safe access.Internal lighting and laser safety window for visual inspection during the laser process are included with the ergonomic design. Complies with CDRH requirements as a Class 1 enclosure. The enclosure contains the complete laser head, laser beam delivery and motion system.

  • X-ray Camera

    Pony Industry Co.,Ltd

    Up until the introduction of SID-A50, X-ray inspection systems has been using detectors such as Image Intensifier (I.I.) and C-MOS Flat Panel Detectors, which needs to convert X-ray into optical light first, in order to visualize X-ray.These Indirect Conversion Method X-ray Detectors comes with multitude of issues. These problems include but not limited to; Low Sensitivity, Fuzziness, Time Degradation, Inadequate Life

  • Display Test & Characterization Solutions

    Gamma Scientific Inc.

    The Gamma Scientific line of display measurement solutions leverages the company’s renowned competencies in developing high-sensitivity spectroradiometer-based equipment. Our range of NIST traceable solutions include handheld and portable instruments, laboratory equipment, and fully automated production inspection systems. With over 50 years of experience in the industry, you won’t find another company with the level of combined knowledge and expertise as the team at Gamma Scientific.

  • Wafer & Die Inspection

    SemiProbe

    SemiProbe wafer inspection system (WIS) examines, locates and identifies defects created during wafer manufacturing, probing, bumping, dicing or general handling. This provides microelectronic device manufacturers with accurate, timely quality assurance and process information. The WIS has single sided and double sided wafer mapping capabilities and can improve efficiency, reduce manufacturing costs, increase yields and shorten time to market.

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