Showing results: 166 - 180 of 514 items found.
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AXI XS Series -
Nordson Corporation
The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept designed for sophisticated high-speed inspection of semiconductor samples, wire bonds and PCB-assembly boards for single/multipanels or samples in trays. The inspectable applications range from component level inspection to mid-sized SMT boards.
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GP Solar GmbH
Solar developed a complete solution for stand-alone optical quality sorting, complete with inspection, classification and handling. The system allows implementation of automated optical inspection without changing existing machines.
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IV-T3300 -
In.D Solution
IV-T3300 is a post wire and die bond inspection machine with Dual JEDEC Tray Feeder System. It features a large inspection area of 600x500mm and a quick trays change of 5-7 seconds.
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AXI XT-6 Series -
Nordson Corporation
The XT-series provides the advanced inspection capability of Nordson TEST & INSPECTION's inline system in a smaller footprint manual load/island of automation system. The platforms are designed for flexibility and ease of use for a wide variety of products requiring 2D and 2.5D automated X-ray inspection. The XT-6/XT-6A platform is a highly flexible automated X-ray inspection system with minimum footprint and a parallel-kinematic Hexaglide manipulation unit for extreme-angle off-axis image acquisition with high resolution. It is suitable for high-quality X-ray analysis of electronic assemblies and material analysis of parts that require flexible part manipulation with multiple inspection angles. For batch modes and volume inspection the XT-6 can be equipped with a single-sided conveyor setup and magazine load/unload station (XT-6A).
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EagleView -
Microtronic, Inc.
EagleView automated macro defect semiconductor wafer inspection system provides industry leading throughput, defect detection accuracy, and wafer classification for semiconductor manufacturing. EagleView systems have inspected over 100 million semiconductor wafers worldwide. The EagleView macro defect inspection tool resolves many of the problems and pitfalls of manual and micro wafer inspection by automating and standardizing semiconductor wafer inspection processes while creating complete images of every wafer in the cassette. Unlike manual micro defect wafer inspection, EagleView’s automated wafer inspection is always consistent, tireless, reliable, and fast. EagleView helps find macro defects while there’s still time to take corrective action.
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TR7502DT -
Test Research, Inc.
Equipped with a 1-CCD high resolution color camera, the TR7502 DT desktop automated optical inspection system offers TRI' hallmark Dynamic Imaging technology for powerful pre/post reflow inspection in a compact economical solution. The system features a highly flexible coaxial RGB+W lighting system with low-angle lighting for better inspection of polarity and black components and is capable of inspecting 01005 fine pitch components in both lead-free and legacy PCB assemblies
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GP Solar GmbH
INSPECTION SYSTEMS FOR PROCESS OPTIMIZATION AND QUALITY CONTROL IN THIN-FILM MODULE PRODUCTION
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Nidec-Read Corporation
NIDEC-READ's inspection systems serve to locate open/leak circuits on printed substrates forming different conductor patterns within inner/outer layers. These vision inspection systems are also used to measure the shape of via holes and solder bumps and to find scratches and stains on them.
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SIGMA Link -
Vi Technology
SIGMA Link software suite links altogether solder paste inspection (SPI), automated optical inspection (AOI) and manufacturing execution system (MES). For Smart Factories, SIGMA Link is the essential element to connect inspection machines to Manufacturing Execution System. This real-time interface ensures full traceability and enables interlocking of machines to automate SMT lines while driving yield to new levels.
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LIGHTiX -
Unity Semiconductor SAS
Next generation macro inspection system (AOI).• All-side wafer inspection: Front, back and edge inspection.• 100% defect images without throughput impact.• Integrated high-end microscope review.• True Color Inspection (TCI) technology.• Advanced CD, 2D/3D, OVL and EBR metrology.• Automatic defect classification• Best in class cost of ownership for high resolution AOI• High-speed patterned wafer inspection• High defect sensitivity• ISO Class 1 certified• Tool – to – tool matching
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XT V 130C -
Nikon Metrology, Inc.
The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system.
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Radiodetection
Radiodetection and Pearpoint provide a wide array of Pushrod and Crawler pipeline inspection systems.
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Verifier -
LITE-CHECK LLC.
This system consists of the a trailer interface tool and tire probe/pressure tool that are controlled by and communicate with a tablet with up to 150′ of range. This system walks technicians through the inspection process and sends all collected data to the cloud where inspection results and collected data can be archived, accessed, printed, and analyzed.
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DWFritz Automation, Inc.
The ZeroTouch® Rotational Metrology System is a precise, high-speed, in-line or near-line metrology, and inspection system that measures critical dimensions of rotors, stators, brake discs, and other cylindrical parts, providing manufacturers with real-time metrology, and inspection data to optimize production processes, detect defects, and improve ROI.