Showing results: 541 - 555 of 1390 items found.
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UNIVANS Co., Ltd.
The semiconductor manufacturing process is divided into a front process (WAFER) and a post process (PACKAGE). The LOAD BOARD is an INTERFACE device for inspecting the function and performance of a package state IC, which is a post process, It is an INTERFACE key device for inspection. In particular, LOAD BOARD is widely used in non-memory semiconductor inspection equipment.
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T-CLIP -
Taiyo Industrial Co., Ltd.
T-CLIP is a brand new inspection fixture that is incredibly durable and accurate. T-CLIP uses bump FPC technology that allows for 60 μm fine pitch inspection, which is normally difficult for pin probes. However unlike pin probes, T-CLIP causes very little damage on objects being inspected.
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Socket-Scan -
The Phased Array Company
For inspection of welds in small bore piping as well as other small pipes, you’ll need a specific solution. No need to look any further, Socket-Scan gives you:*Specific Probes, Wedge and other necessary equipment*Abundant Field Application Experience -Proven inspection in actual nuclear power plants
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Advanced Inspection Technologies Inc.
For remote viewing large areas, tanks, pressure vessels and pipes where limited access, radiation or safety makes inspection difficult. Each inspection camera system features a color camera module, high-intensity lighting, pan-and-tilt mechanism and industrial waterproof hosing for protection from extreme environments.
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VHX-6000 Series -
Keyence
Next-generation optical microscope with a large depth-of-field and advanced measurement capabilities for inspection and failure analysis.
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KI-TK082 -
Kingfisher International
Power meter, VFL pen, inspection microscope, cleaning materials. Interchangeable SC / LC connectors
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EasyTom -
RX Solutions SARL
Versatility for a wide variety of applications and analysable products. 6 motion axis. Large volume Inspection.
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U-UVF248 -
Olympus Corp.
Model Capable of High-magnification/High-contrast Deep Ultraviolet (DUV) Observation. A Semiconductor / FPD Inspection Microscopes.
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MFD620C -
Mitech Co., LTD.
The MFD620C is an advanced digital ultrasonic flaw detector featuring a multi-color TFT LCD and a host of new features to meet challenging inspection requirements. It combines powerful flaw detection and measurement capabilities, extensive data storage, and the ability to transfer detailed inspection data to the PC via its high-speed USB port.
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X-Scan M -
Detection Technology Inc.
X-Scan M series makes quick and accurate inspection of large-scale objects easy. The modular linear detector arrays are scalable to different inspection system lengths up to 4.1 meters with one controller and single Gigabit Ethernet interface. With network connected units even longer scanners can be built efficiently for high-energy applications.
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Opto GmbH
We optimize and supplement microscopes in coordination with the respective manufacturer to enable new setups and demanding inspection tasks.
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HT Italia Srl
With the new family of Boroscopes, HT now also allows inspections and diagnostics, even in dark and deep places.
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KI-TK032 -
Kingfisher International
850/1300 nm source & power meter, inspection microscope, cleaning materials. Interchangeable SC & LC connectors
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