Showing results: 1156 - 1170 of 1323 items found.
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LabRAM Odyssey -
HORIBA, Ltd.
Special 50 years anniversary series: true confocal Raman microscope enabling the most detailed images and analyses to be obtained with speed and confidence. Ideally suited for both micro and macro measurements, it offers advanced confocal imaging capabilities in 2D and 3D. With guaranteed high performance and intuitive simplicity, the LabRAM Odyssey™ is the ultimate instrument for Raman spectroscopy, widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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LabRAM HR Evolution -
HORIBA, Ltd.
The LabRAM HR Evolution Raman microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence. With guaranteed high performance and intuitive simplicity, the LabRAM HR Evolution is the ultimate instrument for Raman spectroscopy. They are widely used for standard Raman analysis, PhotoLuminescence (PL), Tip Enhanced Raman Spectroscopy (TERS) and other hybrid methods.
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I-Pi SMARC IMX8M Plus -
ADLINK Technology Inc.
The I-Pi SMARC IMX8M Plus is a SMARC-based smart solution development kit powered by NXP i.MX8M Plus (Quad-core Arm Cortex-A53) processor with a Neural Processing Unit (NPU) at up to 2.3 TOPS.This is the first SMARC R2.1 development kit focused on machine learning, vision, advanced multimedia, and industrial IoT with high reliability. As such, it supports dual image processors and two camera inputs for an effective Vision System, as well as applications beyond, including smart homes, building cities, and industry 4.0.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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LIGHTiX -
Unity Semiconductor SAS
Next generation macro inspection system (AOI).• All-side wafer inspection: Front, back and edge inspection.• 100% defect images without throughput impact.• Integrated high-end microscope review.• True Color Inspection (TCI) technology.• Advanced CD, 2D/3D, OVL and EBR metrology.• Automatic defect classification• Best in class cost of ownership for high resolution AOI• High-speed patterned wafer inspection• High defect sensitivity• ISO Class 1 certified• Tool – to – tool matching
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MX63 / MX63L -
Olympus Corp.
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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LEC-IMX8MP -
ADLINK Technology Inc.
ADLINK LEC-IMX8MP, based on the powerful NXP i.MX8M Plus (quad core Arm Cortex-A53) processor with an optional Neural Processing Unit (NPU) operating at up to 2.3 TOPS., is the first SMARC revision 2.1 compliant module focusing on machine learning and vision, advanced multimedia, and industrial IoT with high reliability. Additionally, it supports dual Image Signal Processors and two camera inputs for an effective Vision System. The LEC-IMX8MP is suited for applications such as smart home, building, city and industry 4.0.
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FLIR CM85 -
Teledyne FLIR
The FLIR CM85 is an industrial power clamp meter with advanced power analysis and variable frequency drive (VFD) filtering functions required by electrical troubleshooters for full-scale equipment. The CM85 helps users accurately analyze voltage in complex machinery by including harmonics, inrush, current, and phase rotation testing. The meter also features Bluetooth® for remote viewing and data sharing from compatible mobile devices, and METERLiNK technology to wirelessly embed readings into infrared images on compatible FLIR cameras.
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802 Series -
Teledyne LeCroy quantumdata
The Teledyne LeCroy quantumdata 802 series video signal generators support testing for CRTs, flat panels, projectors and TVs including HDTV. The 802 is optimal for testing DTV, digital and analog displays and allows production and engineering users to create the most complex test images. You get the flexibility required to meet a tough production budget with the wide range of outputs the 802 series offers. And a PCMCIA slot makes it easy to copy the configuration of one generator to another.
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Star SAFIRE®380-HLD -
Teledyne FLIR
The Star SAFIRE®380-HLD provides superior image stabilization, ultra long-range imaging performance, and true metadata embedded in digital video, all with laser designation (LD) and rangefinder. The Star SAFIRE 380-HLD also provides the ability to operate continuously in all conditions — even while sitting on the tarmac with no airflow. The world’s most widely deployed single LRU for ISR&T missions, the Star SAFIRE 380-HLD provides HD multi-spectral imaging, accurate target location, and laser spot positioning.
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Tau® 2 -
Teledyne FLIR
Made in USA, the Tau® 2 OEM thermal imaging cameras offer an unmatched combination of features and reliability, making them well-suited for demanding applications including unmanned vehicles, thermal sights, and handheld imagers. Improved electronics provide powerful image processing modes that dramatically improve detail and contrast through continuous histogram equalization. Radiometry is available in every pixel for both 640 × 512 and 336 × 256 resolutions and all three camera grade levels. All Tau 2 configurations share electrical, mechanical, and optical interfaces allowing integrations to be designed that work seamlessly with all formats. Available in Commercial, Performance, and Industrial variants, each with unique sensitivity and pixel operability thresholds to meet operational requirements. Radiometry is an optional feature for Performance-grade cameras, and standard feature with Industrial-grade. All Tau 2 configurations and resolutions share electrical, mechanical, and optical interfaces allowing integrations to be designed that work seamlessly with all formats.
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ace Series -
Basler Vision Components AG
Enjoy a new class of digital cameras that will help you to be even more successful and efficient at what you do. High quality and performance levels combined with a low starting list price of only 199 and a small 29 mm x 29 mm housing make Basler ace cameras one of the world''''s best-selling cameras with thousands of satisfied customers. It is available with several resolutions and speeds and with sensors from all leading manufacturers so that you can easily find the right ace camera model for your application. Choose from the most popular and standard proven data interfaces in the vision market: With the ace Gigabit Ethernet models, you benefit from our GigE market leadership, easy multi-camera setups and 100-meter cable length. Camera Link is the interface for high image data transfer. And with USB 3.0 there is an interface technology which is easy to use and real-time capable.
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DemiYG1020 -
YEC Co. LTD
Supports SATA 6Gbps. ATA storage is supported by using optional products sold separately.Ultra high speed data transfer at 37GB (*1) per minute.(*1 Theoretical value. Varies according to performance of connected devices.)Execution logs can be immediately saved to USB memory connected to the main unit.Deletion reports can be created based on saved logs. *2(*2 Host program sold separately is required to create deletion reports.)Rugged built-in evidence preservation functions including hash value generation (MD5, SHA1, and SHA256), DD image creation and E01 creation.Deletion function conforms to various standardsSupports NSA (National Security Agency) recommended, DoD (Department of Defense) conforming, U.S. military and NCSC systems.Enables deletion operation report creation by using optional terminal software (sold separately).Built-in deletion function and quick diagnosis functionDeletion report can be created using host software (sold separately).
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Applied Image, Inc.
The Sinusoidal Visual Demonstration Array is designed to demonstrate the Modulation Transfer Function (MTF) of the human eye. Its transmittance varies sinusoidally and increases in spatial frequency from 0.2 to 20 c/mm, following a logrithmic scale. The modulation increases linearly from top to bottom. One can see, in the image, where the visual contrast contour disappears which is the MTF of the eye. Ideally suited for teaching and demonstration, the Array is available on film mounted in glass (-G), or mounted in a 2″x 2″ projection slide.(-SL)
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ams AG
Linear array sensors consist of a linear array of integrating photosensing pixels which measure incident light over a user-defined exposure time and generate a voltage or digital output which represents the light exposure at each pixel. The sensors are available in a variety of lengths and pixel resolutions. The analog output may be directly interfaced to an ADC for digital processing or for comparing black/white thresholds. Applications include contact image sensing, optical character recognition, edge detection, and object measurement in products such as copiers, document scanners and spectroscopy.
