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Showing results: 46 - 49 of 49 items found.

  • Non-contact Radar Level Transmitter

    2290 - Georg Fischer Signet

    The 25 GHz (K-band) 2290 Pulse Radars are the most progressive non-contact level transmitter technology for industrial processes. With an excellent accuracy, compact antennas and a user-friendly set-up the 2290 is an effective, simple, low cost choice for demanding level applications. GF’s new K-band radar featuring ±3 mm (±0.1inch) accuracy and short dead band excels with its full plastic housing. Its antenna range incorporates a stainless steel horn and enclosed plastic tube choices.

  • Near Field Probes

    Com-Power Corporation

    A typical emi emission test is performed using broadband EMC antennas such as biconical, log periodics, Combilogs and horns. These antennas usually placed at 1, 3 or 10 meter distance as required by the test specification. These is considered far field measurements and the emission limits are given for the specific distance by the specification. During EMI compliance measurements, the emissions levels from products are compared with these limits. If the product exceeds these limits it is considered failing. These tests are typically conducted in a open area test site IOATS) or inside an anechoic chamber.

  • Vector 2D Electromagnetic Solver

    QuickWave-V2D - QWED Sp. z o.o.

    QuickWave V2D is a unique on the market and ultra fast Vector 2D (QW-V2D) electromagnetic solver is applicable to the analysis of axisymmetrical devices (which are also called Bodies Of Revolution) as large as 2100 wavelengths, including antennas (horns, rods, biconical), circular waveguide discontinuities, and resonators. It is based on the Maxwell equations re-expressed in cylindrical coordinates. Definition of a 2D long-section of the structure allows for hundreds times faster simulation than brute force 3D analysis.

  • AMMP Spot Probes

    Compass Technology Group, llc

    Incorporated into a number of CTG products are specialized antennas or probes that enable measurement of materials in various environments. These probes can be purchased as part of a system or separately for your own application. The spot probe technology we developed is called AMMP, or Advanced Microwave Mapping Probe. It is a significant improvement over traditional dielectrically loaded horns because the metal radiating elements and dielectric loading and shape were optimized together using the latest in CEM tools.

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