Showing results: 16 - 30 of 141 items found.
-
779363-01 -
NI
The PCI‑7811 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. The PCI‑7811 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, custom communications protocols, bit error rate test, and other applications that require precise timing and control.
-
Spectra Film Gate -
Spectra Cine, Inc.
The Spectra Film Gate Photometer II offered by Spectra Cine is a significant advance in the field of photometry. It is extremely sensitive and solid state throughout. Reads directly in printer steps of 0.025 log exposure units. The large, uncrowded scale has an 80 printer point range and affords ease and accuracy in reading. A variety of probes are available for use in Acme optical printers, Bell & Howell Model "C", "J", and "A" contact printers, ARRI printers and Oxberry printers.
-
DFX-7+ -
Dakota Ultrasonics
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
-
DFX-8 -
Dakota Ultrasonics
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms
-
DFX-8+ -
Dakota Ultrasonics
Measurement Gates: Two independent gates (Flaw), and three gates (thickness). Start & width adjustable over full range. Amplitude 5-95%, 1% steps. Positive or negative triggering for each gate with audible and visual alarms.
-
5000E -
Scientific Test, Inc.
Current Ranges:Standard: 2.0nA – 50AUp to 100A with Mainframe ExtensionVoltage Ranges:Standard (anode): 10mV – 1000V2000V with 2kV Anode OptionStandard (gate): 10mv – 20V80V with 80V Gate Option
-
Smiths Interconnect
A complete line of Ku-Band and Ka-Band SATCOM antenna systems featuring TECOM technology for non-stop gate to gate in-flight connectivity for commercial large Air Transport, Business Jet and various military applications.
-
Holding Informtest
Field Programmable Gate Array enable reconfigurable integrated circuits.
-
CGF Series -
Coda Systems Ltd.
Advanced test jig, using a cam-operated, fully adjustable gate - self customisation.
-
Concurrent Fault Simulator -
Syntest Technologies
TurboFault combines high performance, versatility and accuracy. It is highly competitive with hardware accelerators for classical test fault grading. It supports synchronous and asynchronous designs at the gate level, including tri-state gates, latches, flip-flops, single and multi-port RAMs, complex bus resolution functions, and User Defined Primitives (UDPs).
-
Q1 Test, Inc.
Q1 Test Inc. is known for producing high quality Genrad fixtures at a great price. We offer several fixture sizes from small to extra large, including Single and Dual Well options. Our Genrad kits are available in any gate configuration from vacuum isolated overclamp to pneumatic gate designs.
-
ITC59100 Rg/Qg -
Integrated Technology Corp.
The ITC59100 Test Measurement Unit (TMU), which plugs into the ITC59000 Test Platform, performs gate charge (Qg) measurements that conform to MIL-STD-750C, Notice 2, Method 3471 and JEDEC Standard JESD24-2. In addition the ITC59100 TMU performs an internal gate resistance (Rg) test method that conforms to JEDEC Standard JESD24-11.
-
CAM/GATE -
Test-X Fixture Products
The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
-
Global Testing Services Inc.
Our Capabilities*Dielectric Withstand*Hi-Potential Testing*Voltage Drop*Contact Resistance*Gate Leakage*Insulation Integrity*Dielectric Integrity
-
STMicroelectronics
Gate drivers, FETs and protection circuitry integrated into a single package to drive loads in industrial and home-appliance applications, with increased power density per cm². ST’s high-density power drivers are System in Package (SiP) solutions integrating in compact QFN packages the STDRIVE gate drivers and MOSFET-based power stages, responding to the industrial market trend towards higher levels of integration and lower development costs.