Showing results: 61 - 75 of 104 items found.
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ELEMENTRAC CHS‑r -
ELTRA GmbH
The ELEMENTRAC CHS-r elemental analyzer determines the elements carbon, sulfur and hydrogen by combustion of the sample in an oxygen stream and subsequent measurement of the combustion gases CO2, SO2 and H2O in selective infrared measuring cells. A high sample weight of up to 500 mg ensures excellent reproducibility of the measurement results, even for heterogeneous samples.
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EMGA-920 -
HORIBA, Ltd.
EMGA-920 O/N analyzer: It's a "New flagship model” for O/N analyzers and user friendly product.This is an oxygen and nitrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology's R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user's requests.
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JEOL Ltd.
X-ray fluorescence spectrometer that provides quick, easy elemental analysis using touch screen operation. It is equipped with functions for conventional qualitative and quantitative analysis (FP method, calibration curve method), as well as screening for RoHS elements. With a variety of both hardware and software options available, it is customizable to cover a wide range of analysis needs.
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EMGA-921 -
HORIBA, Ltd.
EMGA-921 Hydrogen analyzer: It's a "New flagship model” for H analyzer and user friendly product.This is an hydrogen elemental analyzer with high accuracy and repeatability suiting to cutting-edge technology's R&D as well as quality control in the market of steel, new materials, catalyst and so on. This is a new generation model optimized to fit to user's requests.
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Evident Scientific
XRF stands for X-ray fluorescence. It’s a powerful, nondestructive technique for measuring elemental composition from magnesium (Mg) to uranium (U), from parts per million to 100%. Handheld XRF analyzers are portable devices that can be used on location for immediate, lab-quality results to help you determine the next course of action and where it’s needed.
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Optokey, Inc.
Optokey's products offer complete sample characterization solutions and yield situationally sensitive spectrum data and detailed insight into the elemental and molecular composition of the sample. These systems and proprietary software can be precisely tailored to customer's requirements to sense a wide range of analytes, including organics, heavy metals, and biomolecules (DNA, peptides, lipids, etc.) and other materials.
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PX-375 -
HORIBA, Ltd.
There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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ZSX Primus II -
Rigaku Corp.
High performance WDXRF for rapid quantitative elemental analysis. Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.
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Accolade Engineering Solutions
To ensure product environmental compliance or to gain better understanding of your materials or processes, chemical testing is often required. AES has state of the art the equipment for chemical analysis. For elemental analysis XRF, SEM/EDS or ICP can be used. For molecular analysis GCMS, HPLC and FTIR may be used. FTIR may also be used for surface analysis of contamination and our microFTIR system is suitable for the smallest samples.
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LIBS -
HORIBA, Ltd.
HORIBA designs and manufactures for Laser-induced Breakdown Spectroscopy (LIBS) very high resolution OEM spectrometers. Thanks to a low stray light aberrations corrected concave holographic grating (Jobin Yvon Technology), HORIBA LIBS spectrometer offers in a ~90x70x30mm footprint (without electronics) a very robust and accurate spectrometer.Adopt the HORIBA LIBS spectrometer to monitor the elemental fingerprint of your liquid, solid or gas samples.
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Elemental Analysis, Inc.
Elemental Analysis Incorporated, utilizing Proton Induced X-ray Emission (PIXE), provides a non-destructive, simultaneous analysis for the 72 inorganic elements from Sodium through Uranium on the Periodic Table for solid, liquid, and thin film (i.e. aerosol filter) samples. The PIXE technique offers the advantage of analysis, without the necessity for time consuming digestion, thereby minimizing the potential for error resulting from sample preparation.
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PerkinElmer Inc.
Tens of thousands of installations worldwide rely on PerkinElmer spectrometers to obtain accurate results from inorganic elemental analyses quickly, efficiently, effortlessly. No matter what your field, application or sample type, we have the tools and expertise to help -- all based on more than 50 years at the forefront of atomic spectroscopy technology. Take advantage of our complete array of solutions for unparalleled performance, accuracy, and confidence.
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Evans Analytical Group®
The Materials Characterization division of Evans Analytical Group is the leading global provider of surface analysis and materials characterization services. Our international network delivers world-class analytical services directly to you. EAG''s expertise in surface analysis, composition and contamination measurement, trace elemental analysis and microscopy can help you and your company meet your goals, no matter what high technology industry you work in.
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GDS900 -
Leco Corp.
LECO's Glow Discharge Spectrometer (GDS) offers you state-of-the-art technology designed specifically for routine elemental determination in most conductive ferrous and nonferrous materials. The GDS900 features improved performance, stability, accuracy, and precision in steel, iron (including as-cast), aluminum, copper, zinc, nickel, cobalt, tungsten, and titanium materials, while featuring our user-friendly Cornerstone® brand software to help streamline your analysis.
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Kratos AXIS Nova -
Shimadzu Corp.
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The The AXIS Nova photoelectron spectrometer can collect X-ray photoelectron spectra and images from any material that is stable under the ultra-high vacuum conditions required for the technique.