Showing results: 2191 - 2205 of 2545 items found.
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Ponovo Power Co., Ltd.
In the super (ultra) high-voltage transmission field, UHVDC converter stations are mainly composed of three parts: AC system, valve system, and DC system. Each part consists of primary and secondary electrical equipment. PONOVO, relying on its core technology, extensive system testing experience and high-efficiency production capabilities, have continuously explored super (ultra) high-voltage test technologies, and nearly 10 types of test equipment have been developed for converter system substations and system debugging.
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OptCom Company, Ltd
O-E probe is the unit to convert optical signals to electrical signals. It can be connected to Oscilloscopes or data loggers via a BNC connector and monitor the conversion waveform. It can acquire the optical signal easily by just pointing the optical fiber probe at the light source. Recently, more and more light sources utilize optical modulation for next generation lighting such as LED. Acquiring the emission timing is required to measure the emission phenomenon of the light source. This O-E probe unit is the ideal tool for these tasks.
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40-860-222-M50 -
Pickering Interfaces Ltd.
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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40-860-222-M62.5 -
Pickering Interfaces Ltd.
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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40-860-522-M50 -
Pickering Interfaces Ltd.
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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40-860-522-M62.5 -
Pickering Interfaces Ltd.
Pickering PXI Fiber Optic MEMS Switching cards are available in many high density formats with a choice of 5 different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications. Fiber optic multiplexers create a signal path by redirecting the optical signal into a selected output fiber. This is achieved using Micro-Mechanical Mirrors driven by a highly precise mechanism and activated via an electrical control signal.
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Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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Holding Informtest
The 6-slot VXI portable rack is intended for use in modular measurement information systems based on the VXI version of the standard. The 6-slot portable VXI crate is designed to accommodate the system module, in the first slot and VXI instrumental modules placed in the remaining slots, to provide their electrical power supply, as well as to provide information interconnection via the VXIbus bus between the modules and with the control computer. The chassis meets the requirements of GOST R 51884-2002 and the document System Specification VXI-1 Revision 1.4.
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G Systems, l.p.
G Systems develops fully integrated systems and we know that both software and hardware are equally important to system design. Our focus on code quality and optimization ensures customers receive efficient and maintainable code. We specialize in LabVIEW development and all of our LabVIEW developers are certified developers or architects. We’re also highly skilled in mechanical and electrical hardware design and builds on a wide variety of data acquisition, signal conditioning, RF, and distributed communication platforms.
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TimeSpy -
Brandywine Communications
The TimeSpy precisely measures the time accuracy of a wide range of inputs (such as: NTP, IRIG B, 1PPS, and ASCII) against an internal precision GPS-controlled oscillator, displayed on the large, full color windows-based touch screen. The TimeSpy can precisely measure the time error at the point of use for systems where time is distributed over large distances. The TimeSpy can also measure free-running clocks and timing systems which are synchronized from untraceable sources, such as television and radio broadcasts, electrical power lines and the internet.
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Soken Electric Co. Ltd
Insulation materials in electrical equipment are used between a pair of electrodes; therefore it can be expressed as capacitors. Applying AC voltage to a capacitor with insulation materials causes an energy loss due to the leak current, the dielectric polarization, and the partial discharge. Because of this, the phase of the capacitor current is more delayed than that of a zero-loss current (reactive current) flowing in an ideal insulation material. The delay angle is called "Dielectric Loss Angle", and the tangent is "Dielectric Loss Tangent" (tanδ). Please refer to the technical guide explained in detail.
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Light Laboratory Inc.
LLI. offers a wide variety of services to fulfill your photometric, color and electrical testing needs. Using our custom, rotating mirror, Type-C goniophotometer, in combination with various integrating spheres, we are able to test many different types of lighting fixtures and light sources. LM-79 -08 Test & LM-80 Test, SSL Photometry Testing, Energy Star®, CEC Title 24, DesignLights Consortium® (DLC), Custom Tests and UL / ETL Safety Test Consultation.
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Pulse Instruments
Imaging devices, such as CCDs, IR FPAs, and CMOS image sensors, require DC bias with very low electrical noise to prevent contamination of the image. Image quality can also be enhanced by carefully tuning each bias voltage to extract the maximum signal/noise ratio out of an array. Pulse Instruments has decades of experience providing DC bias supplies with the flexibility required tocharacterize and test a variety of devices while maintaining the noise immunity required for satellite and astronomy applications.
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ACTAS C160 -
KoCoS Messtechnik AG
Stationary test system for carrying out fully automatic final factory tests, type and function tests on all kinds of switchgear devices, such as circuit breakers, disconnectors or earthing switches, regardless of the type of drive unit. All the electrical and mechanical parameters needed for the assessment of switching performance are measured in real time and evaluated without either the main contact chambers or the drive unit having to be opened. The system has analog and incremental input channels for the acquisition of analog quantities.
