Showing results: 16 - 30 of 257 items found.
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iWave Systems Technologies
iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces
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Thermal Engineering Associates, Inc.
Thermal test system combines the test and measurement capability of dedicated instruments with the ease of operation and data collecting capability offered by graphical-user-interface-driven software operating on an integrated computer.Diodes (PN, Schottky, LED, varactor, PIN), Stacked Diodes (Hi-V Rectifiers & LEDs), Laser Diodes, Transistors (Bipolar, MOSFET, IGBT) & Diodes, Integrated Circuits (Application & Thermal Test Die).
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Yelo Ltd.
Laser reliability testing consists of a series of tests that laser diodes can be put under in order to ensure their reliability for post-production use. There are different types of tests that can be carried out and there are multiple measurements that can be taken in order to evaluate the reliability of the device. One of these tests is laser diode burn-in.
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QT-4000 Series -
PowerTECH Co,Ltd.
Discrete device test system is developed for Transistor Diode Zener diode MOS-FET J-FET Current Sence FET IGBT LDO(78XX 79XX Tl431 TL432 regular test) and 4 pin Photoelectric Coupler Wafer etc.
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METRAHIT Series -
GMC-I Messtechnik GmbH
All multimeters measurevoltage, resistance, frequency, continuity and diode test.
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QT-3000 Series -
PowerTECH Co,Ltd.
Developed for thermal resistance test of Transistor MOSFET IGBT DIODE.
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WeiMin Industrial Co., Ltd.
LASER DIODE TESTER LD-607 Basic Functions LIV curve test. LD horizontal and vertical test. LD Spectrum test
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FT4310 -
HIOKI E.E. Corp
Hioki is pleased to announce the launch of the Bypass Diode Tester FT4310 for Photovoltaic Systems. The FT4310, which is designed to test bypass diodes in strings of crystalline photovoltaic cells, can be used to detect open and short-circuit faults in bypass diodes by string either in daylight or at night. The instrument is the first portable device capable of detecting bypass diode open faults in operating panels (without requiring the panels to be shielded from sunlight).
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JT-820 -
Rinch Industrial Co.,Limited
3 1/2 digital Automotive meter. Maximum Display:1999. Continuity test. Diode test. Weight: 180g(with battery)
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Skyworks Solutions, Inc.
Skyworks diode product offering includes PIN, limiter, Schottky, and varactor diodes for a wide variety of microwave applications including WLAN, infrastructure, handset, Satcom, automotive, military, aerospace and defense, test & measurement, metering, medical and RDID.
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58620 -
Chroma ATE Inc.
The Chroma 58620 Laser Diode Characterization Station is a state-of-the-art full turnkey system specially designed for laser diode testing. Features range from macro inspection of the facet or aperture active area to a full suite of electro-optical parametic tests.
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KT-3060 -
KILTER ELECTRONIC CO.,LTD
3 1/2 digits LCD,1999 counts ● Jaw size :Φ40mm ● Date hold● Black Light● Diode ,Continuity test● Resistance ,Frequency test