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Showing results: 1771 - 1785 of 1804 items found.

  • Multiphoton FLIM System

    DCS-120 MP - Becker & Hickl GmbH

    *Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software

  • Confocal FLIM for Macroscopic Objects

    DCS-120 Macro - Becker & Hickl GmbH

    *FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage

  • Regenerative DC Electronic Load

    IT8300 Series - I-TECH Electronic Co., Ltd

    ITECH newly launched IT8300 Regenerative DC Electronic Load, it not only can simulate various load characteristics, but also can feed power back to grid without pollution. IT8300 series unique regenerative function can convert the absorbed DC power into AC power and feed it back to local grid. This eliminates the usual heat dissipation to a minimum and saves energy costs, adapts requirements of global energy-saving and emission reduction at the same time. IT8300 adopts shigh power density design, e.g. for 3 U size, it can absorb power up to 10.5kW. IT8300 supports master-slave paralleling and current equalized distribution, which can expand the power up to 105kW or more. Moreover IT8300 has multiple functions such as the automatic grid-state detection, on-grid electricity accumulation, anti-islanding protection, battery-test function, dynamic mode, LIST function, etc. The built-in interfaces include LAN/USB/RS232/RS485/CAN interfaces. The various functions make IT8300 series suitable for high-power power supply, storage battery, photovoltaic battery,electric vehicle, energy storage system, etc.

  • Frequency Conversion Rotating Magnetic Fla

    MT-2XCF - Mitech Co., LTD.

    MITECH MT-2XCF rechargeable frequency conversion rotating magnetic flaw detector is based on principle that the leakage magnetic field can absorb the magnetic powder. Make use of magnetic yoke magnetized the workpiece of ferromagnetic material. If there has defects it will produce leakage magnetic field that will adsorb magnetic powder. We could detect the flaw by observing the density of adsorption magnetic powder. It adopts large capacity lithium battery. By the inverter and the phase shifted signal processor to provide power for the detector, it solves the shortcomings of traditional magnetic particle detector relying on the 220V power supply. It has low power consumption and can continuous work for more than 6 hours. And the battery can be charged when the detector is on and off. Especially suitable for the field testing. It can choose the current frequency according to the flaw depth with unique frequency conversion communication design, that improve the detection sensitivity. It’s widely used in aircraft manufacturing, boiler and pressure vessels and other fields. It is a necessary professional precision instrument of quality control, in-service safety monitoring and life assessment.

  • Scientific Cameras

    Thorlabs, Inc.

    Thorlabs' Scientific-Grade Cameras are specifically designed for microscopy and other demanding applications. The Zelux™ CMOS cameras have small footprints and provide cost-effective solutions for general-purpose imaging applications. Kiralux® cameras have CMOS sensors with high quantum efficiency in a compact housing and are offered in monochrome, color, NIR-enhanced, and polarization-sensitive versions. Our polarization-sensitive CMOS camera is ideal for materials inspection, flaw detection, and other advanced techniques using polarization. The Quantalux® monochrome sCMOS cameras are fast frame rate imagers that combine high dynamic range with extremely low read noise for low-light applications. They are available in either a passively cooled compact housing or a hermetically sealed TE-cooled housing. We also offer scientific CCD cameras with a variety of features, including versions optimized for operation at UV, visible, or NIR wavelengths; fast-frame-rate cameras; TE-cooled or non-cooled housings; and versions with the sensor face plate removed. An intuitive software package, API and SDK for developers, and third-party software support provide options for custom system control and image acquisition.

  • Portable Interface Unit

    1553-USB-PIU - Western Avionics Ltd.

    The 1553-USB-PIU is a Portable Interface Unit providing full MIL-STD-1553 test, simulation and bus analysis capability in a compact self-contained unit, to connect via a USB interface to suitable host systems. The unit provides support for all 1553A, 1553B, McAir and STANAG 3838 variants in a self contained battery operated unit, and is supplied with a matching power supply and battery charger unit for desk-top use. The 1553-USB-PIU supports concurrent Bus Controller (BC) and up to 31 Remote Terminals (RT) with Bus Monitor (BM). An additional stand-alone Chronological Bus Monitor (CBM) facility is also provided, with comprehensive multi-level triggering capability. Full error injection capability is provided in BC and RT modes, with full error detection in BC, RT, BM and CBM modes. The unit provides a variable amplitude dual redundant 1553 interface. 2 Mbytes of dual ported RAM are provided. The unit is supplied with "C" Driver library, together with a Windows GUI, providing a user friendly software tool for all 1553 set-ups, data management and storage.

  • Metrology Solutions for Semiconductors

    Bruker Corporation

    Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.

  • Spectral Response SystemsQuantum Efficiency SystemsIPCE Measurement Systems

    Photo Emission Tech., Inc.

    QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.

  • Proactive Downstream Spectrum Analysis

    SpectraVizion - ZCorum

    SpectraVizion is an innovative, software-based diagnostics tool that leverages new advancements in remote spectrum capture, allowing cable operators to address downstream spectrum impairments proactively, before subscribers call in with service complaints. “Troubleshooting downstream spectrum issues has always been a reactive process for cable operators,” said Arthur Skinner, Vice President of Worldwide Sales for ZCorum. “Often they’re not aware they have an issue until a customer calls, and that’s when they then send a technician to the home with a hand-held meter to start a search for the problem.” SpectraVizion takes the guesswork out of problem identification and location by presenting on a simple dashboard a list of devices that are experiencing common downstream issues like Standing Waves, FM Noise, Suck-outs, Roll-off and Tilt. The tool leverages the spectrum data available from cable modems and set-top boxes that support full band capture, and advanced detection algorithms automatically identify devices experiencing downstream impairments. The operator can click on any device in the list to view a capture of the full spectrum from that day, or up to 30 days in the past.

  • Interface for Two Dual Redundant 1760 Channels

    EXC-1553ExCard/Px-1760 - Excalibur Systems, Inc.

    This credit card sized interface supports up to two dual redundant 1760 channels and is compatible with all common variations of MIL-STD-1760 providing a wide range of features normally found only on full size testers.Multi FunctionEach channel of the EXC-1553ExCard/Px-1760 operates simultaneously as a Bus controller and/or multiple (up to 32) Remote Terminals, or as a Triggerable Bus Monitor. The card supports error injection and detection. The card’s small size and compatibility with notebook computers make it the perfect solution for performing system simulation of the MIL-STD-1760 bus, in the lab and in the field. Single Function Each channel of the EXC-1553ExCard/PxS-1760 operates either as a Bus Controller, Remote Terminal, or Bus Monitor.The EXC-1553ExCard/Px-1760 and EXC-1553ExCard/PxS-1760 cards are supplied with C drivers, including source code, Merlin+ Windows software and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application.Note: Some laptops do not supply the average and peak power voltages required by the ExpressCard specification. The EXC-1553ExCard/Px-1760 may not function properly in these laptops.

  • Test Solution

    Eye-BERT MicroX - Spectronix

    The Eye-BERT MicroX is a compact, easy to use test solution offering high performance bit error rate testing at a fraction of the cost of competing solutions.  The unit is offered in two speed grades including the X10 which operates up to 14.5Gbps, and the X30 which extends the data rate to 29Gbps.  Its broad data rate capabilities and long test patterns make this unit suitable for testing nearly all optical SFP, SFP+, and SFP28 transceivers in production with just one unit. The real-time eye opening monitor and eye scanning capability can aid in troubleshooting by providing the operator with additional link quality information.  Other features include Autonomous pattern detection, SFP diagnostic tools, and wavelength tuning (per transceiver capability).  With a click of a button the Eye-BERT MicroX will automatically test an SFP module based on its advertised capabilities and generate a detailed test report complete with manufacturer, part number, serial number, date code, fiber type, link length, speed, and test results.  The Unit is supplied with anti-skid bumpers and is small enough to be integrated into larger systems for dedicated link verification.

  • Squeak & Rattle Sub-System And Component Testing

    MB Dynamics Inc.

    At MB Dynamics, we’re proud to provide clients in a wide range of industries with quiet, custom turnkey component testing systems for combined squeak & rattle testing as well as durability testing of different components and subsystems (in 1 to 6 DOF). Test items can be excited in one or more axes to understand and characterize the physics and root causes of BSRs. Real-world, on-road vibration conditions are multi-axis simultaneous – vertical, fore-aft or longitudinal, lateral, roll, pitch, and yaw – 6 degrees of freedom or 6 DOF. Affordability drives decisions to find BSRs by exciting in one or two – fewer than 6 DOF. That has been a driving force for MB – be effective at finding BSRs with a lesser number of shakers (DOFs) and thus reduce the test equipment cost of finding BSRs. Vertical-only can be effective; sequential vertical then fore-aft then lateral is one step closer to real-world; creating vibration in four or five axes of response simultaneously is even closer; and full 6 DOF systems that are quiet come closest to duplicating in the lab the on-road conditions. MB offers all these possibilities to meet trade-offs of budget, test time, road replication, and BSR detection effectiveness.

  • Surface Quality Monitors

    Photo Emission Tech., Inc.

    PET manufactures and markets non-destructive, non-contact surface contamination and thin film detection models and automated systems (surface quality monitoring system) capable of detecting thin layer contamination, thin films and coating down to the Angstrom level. These systems represent a major breakthrough by providing, for the first time, a quantitative measure of surface cleanliness. As surface cleanliness verification instruments, in a part cleaning environment, these products are capable of validating the cleaning quality of all the part cleaning equipment available in the market. Any of SQM model series is capable of verifying metal contamination; monitoring absence/presence of organic and/or inorganic on virtually on surfaces of all metals. They are, price/performance, the most sufficient product available for testing surface of metals for surface cleanliness. These systems operate in an ambient environment, require no sample preparation or deposit of any agents on the surface. In any parts cleaning environment where the quality and efficiency of part cleaning equipment for removal of surface contamination is highly desired, these systems provide a scientific solution by quantitatively measuring the surface cleanliness. The SQM series has the sensitivity and operational simplicity required to provide fast and cost effective surface evaluation for all metals.

  • Audio Test Software

    Soft Hearts LLC

    1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)

  • Universal Programmer Superpro 6100N

    Xeltek

    Until now,Support 401 IC manufacturer, 103004 pcs devices and keeps growing.Features:Supports 87454 types of devices from 305 IC manufacturers (by 3/15/2013) and keeps growing.Supports EPROM、Paged EPROM、Parallel and Serial EEPROM、FPGA、PROM、FLASH(NOR & NAND)、BPROM、NVRAM、SPLD、CPLD、EPLD、Firmware HUB、Microcontroller、MCU;Supports devices with Vcc as low as 1.2V. Socket Adaptors available for DIP、SDIP、PLCC、JLCC、PGA、LGA、SOIC、SOJ、SOT、QFP、TQFP、PQFP、VQFP、MQFP、LQFP、TSOP、SOP、TSOPII、PSOP、SSOP、TSSOP、SON、EBGA、FBGA、FTBGA、VFBGA、μBGA、CSP、SCSP、QFN、HVQFN etc.High programming speed.Built with 144 universal pin-drivers. Universal adaptors are available for varies packages up to 144 pins. Quick new device support. Popular NAND FLASH Platform supported including Samsung (XSR1.0/1.6), QualComm, HYNIX(HIFFS), MTK(Solution V1.1), ICERA (v1.0/2.0), ST (7162、7141等), AMLOGIC(IF2/0), REALTEK, PICOCHIP, DataLight ( Flash FX Pro), Marvell(310/303/920/935…), BroadCom, ZTE, Intel (CE4100),UBI, LEADCORE(L1809OG), MSATR etc. Customer-specific NAND solution available.PC hosted mode and stand-alone dual modes. Under PC hosted mode the programmer is controlled by a PC via USB2.0 (high speed) to program a chip. Under stand-alone mode the programmer is controlled via a 6-KEY keypad and a 20 character by 4 line LCD display. A CF card is used to store the project files.User can operate multiple units to construct a concurrent multiprogramming system thank for the stand-alone mode. IC manufacturer approved programming algorithms are used for high reliability.Testing functions for logic devices.Advanced and powerful software functions.Production mode starts chip operation at the moment the chip is inserted in the socket properly.Project function simplifies processes such as device selection, file loading, device configuration setting, program option, and batch file setting into one touch step.Password can be set for project files and production volume controlBatch command combines device operations like program, verify, security into a single command at any sequence.Dynamic buffer makes it possible that each chip is programmed with different data file. Applications including serial number, MAC address etc.Log file is useful for quality tracking.Many safety mechanisms are built including self-diagnosis, wrong chip placement detection, poor-pin-contacting detection, ID checking, over-current and over-voltage protection etc.Windows XP/Vista/Win7/ Win8/Win10 compatibility.

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