Showing results: 1756 - 1770 of 1796 items found.
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N1231B -
Keysight Technologies
The Keysight N1231B PCI Three-Axis Laser Board with External Sampling is a register based PCI bus board that implements three axes of laser interferometer measurement for position monitoring and closed-loop servo control. There are four external sample inputs along with four data hold inputs that allow easy synchronization with user systems. Several threshold compare registers, with both hardware outputs and interrupt capability, can be used for travel limit and in window or out of window detection functions. The dual mode hardware position outputs, controlled by the hold inputs, provide either a 32-bits/axis parallel interface or a 36-bit multiplexed interface to the 36-bit axis position data at rates up to 20MHz. The user can programmatically access the externally sampled position and velocity data, as well as software sampled position and velocity data, over the PCI bus at rates up to 100kHz (3 axes of position and velocity) or 200kHz (position or velocity only).
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Cole-Parmer Instrument
We have an extensive range of flow controllers and flow indicators for both liquid and gas applications. We specialize in flow measurement and control of media in flow lines less than 2". Our level control instrumentation is perfect for use with small to medium process and industrial tanks and storage vessels. Choose from level sensors, float switches, optical switches, and ultrasonic transmitters/controllers for single-point control, dual-point control, continuous-level control, and leak detection. Our valve selection offers solutions to meter and control fluids in laboratory, process, and industrial applications. Types of valves available include options from simple and inexpensive plastic ball valves to actuated solenoid and manifold valves. Other types of valves include check, diaphragm, elliptical, metering, needle, pinch, proportioning, and stopcocks. To fit your fluid path, connection types include barbed, compression, luer, sanitary clamp, NPT, and true-union.
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XF1 set -
Langer EMV-Technik GmbH
The XF1 set of near field probes consists of 4 passive near field probes and one passive E field probe for making measurements in the development phase of the magnetic and electric fields in ranges from 30 MHz to 6 GHz. Due to their integrated impendance matching, the probes are less sensitive in the lower frequency range than the RF type probes. The probe heads of the XF1 set allow for the step by step identification of interference sources of the magnetic field on an electronic assembly. At first, for example the XF-R 400-1 detects the fields which the assembly emits in total. Next, using higher resolution probes the interference sources can be more precisely detected. The E field probe is used for the detection of electric interfering fields near the assemblies. With trained use of the near field probes, field orientation and field distribution can be detected. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
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CB51 -
CAMI Research Inc. (CableEye®)
CAMI Research Inc. (Acton, MA) announces another new board for its CableEye cable and harness testing systems. Populated with solder pads to accept both aligned and staggered, 1.25mm and 1.5mm pitch, surface mount and through hole (TH) connectors, the board addresses any market with a demand for board-to-board connections. Rated to 700Vdc/500Vac, the CB51 may be used on all CableEye models. The CB51, sold without connectors, contains four sets of 60 solder pads accommodating numerous configurations of surface mount and TH connectors aligned or staggered pins at 1.25mmm and 1.5mm pitch. There are four preset locations for automatic detection & display of any-pin-count connector up to 60-pins. Yet, any single set may be fitted with any combination of lower pin count connectors that total to 60 or less (e.g. a 40-pin with a 10-pin). Connectors soldered in non-preset positions will also appear graphically correct once they are mapped with PinMap (optional software).
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Amida Technology, Inc.
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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MCX-32 -
Teledyne Gas & Flame Detection
The MCX-32 controller features a flexible design that allows the user to customize a system by choosing from a selection of individually addressable field devices or use addressable input and output modules. Detcon’s full range of gas sensors (purchased separately) can be used to create a gas detection system consisting of toxic gas, combustible gas, and/or oxygen deficiency. A wide range of field devices such as liquid level, temperature, pressure, flow, etc., can also be configured for input to the control system. Four standard I/O modules are available: a 4-channel 4-20mA input module (DA-4), a 4-alarm relay output module (RL-4), a 4-channel 4-20mA output module (AO-4), and a 4-relay contact input module (DI-4). I/O modules are din-rail mounted and stackable allowing for seamless system expansion. The I/O modules may be mounted within the main system enclosure or in separate enclosures suitable for the area classification where installation will occur. In many cases using distributed I/O nodes can significantly reduce wiring and installation costs.
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DCS-120 -
Becker & Hickl GmbH
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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DCS-120 MP -
Becker & Hickl GmbH
*Multiphoton FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*Excitation by Ti:Sa Laser*Two Non-Descanned Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage*Laser Control via SPCM Software
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Black Magic Probe V2.3 -
Black Magic Debug Probe
In most cases Black Magic Debug takes the form of a firmware for the Black Magic Probe hardware, and implements a GNU DeBugger (GDB) server.The Black Magic GDB server features: - Automatic target detection- No need for target specific configuration scripts- All protocol and target specific control is done through GDB monitor commands- No “software in the middle” like OpenOCD required- Easily scriptable thanks to the GDB scripting capabilities- Interface to the host computer is a standard USB CDC ACM device (virtual serial port), which does not require special drivers on Linux or OS X.- Targets ARM Cortex-M and Cortex-A based microcontrollers- Provides full debugging functionality, including: watchpoints, flash memory breakpoints, memory and register examination, flash memory programming, etc.- [Semihosting / Host IO support] as well as [Serial Wire Debug TRACESWO support].- Implements USB DFU class for easy firmware upgrade as updates become available.- Works with Windows, Linux and Mac environments.
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DCS-120 Macro -
Becker & Hickl GmbH
*FLIM of Macroscopic Objects*Scan Field Up to 15 mm Diameter*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Tuneable Excitation by Super-Continuum Laser with AOTF*Two Fully Parallel Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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IT8300 Series -
I-TECH Electronic Co., Ltd
ITECH newly launched IT8300 Regenerative DC Electronic Load, it not only can simulate various load characteristics, but also can feed power back to grid without pollution. IT8300 series unique regenerative function can convert the absorbed DC power into AC power and feed it back to local grid. This eliminates the usual heat dissipation to a minimum and saves energy costs, adapts requirements of global energy-saving and emission reduction at the same time. IT8300 adopts shigh power density design, e.g. for 3 U size, it can absorb power up to 10.5kW. IT8300 supports master-slave paralleling and current equalized distribution, which can expand the power up to 105kW or more. Moreover IT8300 has multiple functions such as the automatic grid-state detection, on-grid electricity accumulation, anti-islanding protection, battery-test function, dynamic mode, LIST function, etc. The built-in interfaces include LAN/USB/RS232/RS485/CAN interfaces. The various functions make IT8300 series suitable for high-power power supply, storage battery, photovoltaic battery,electric vehicle, energy storage system, etc.
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MT-2XCF -
Mitech Co., LTD.
MITECH MT-2XCF rechargeable frequency conversion rotating magnetic flaw detector is based on principle that the leakage magnetic field can absorb the magnetic powder. Make use of magnetic yoke magnetized the workpiece of ferromagnetic material. If there has defects it will produce leakage magnetic field that will adsorb magnetic powder. We could detect the flaw by observing the density of adsorption magnetic powder. It adopts large capacity lithium battery. By the inverter and the phase shifted signal processor to provide power for the detector, it solves the shortcomings of traditional magnetic particle detector relying on the 220V power supply. It has low power consumption and can continuous work for more than 6 hours. And the battery can be charged when the detector is on and off. Especially suitable for the field testing. It can choose the current frequency according to the flaw depth with unique frequency conversion communication design, that improve the detection sensitivity. It’s widely used in aircraft manufacturing, boiler and pressure vessels and other fields. It is a necessary professional precision instrument of quality control, in-service safety monitoring and life assessment.
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Thorlabs, Inc.
Thorlabs' Scientific-Grade Cameras are specifically designed for microscopy and other demanding applications. The Zelux™ CMOS cameras have small footprints and provide cost-effective solutions for general-purpose imaging applications. Kiralux® cameras have CMOS sensors with high quantum efficiency in a compact housing and are offered in monochrome, color, NIR-enhanced, and polarization-sensitive versions. Our polarization-sensitive CMOS camera is ideal for materials inspection, flaw detection, and other advanced techniques using polarization. The Quantalux® monochrome sCMOS cameras are fast frame rate imagers that combine high dynamic range with extremely low read noise for low-light applications. They are available in either a passively cooled compact housing or a hermetically sealed TE-cooled housing. We also offer scientific CCD cameras with a variety of features, including versions optimized for operation at UV, visible, or NIR wavelengths; fast-frame-rate cameras; TE-cooled or non-cooled housings; and versions with the sensor face plate removed. An intuitive software package, API and SDK for developers, and third-party software support provide options for custom system control and image acquisition.
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1553-USB-PIU -
Western Avionics Ltd.
The 1553-USB-PIU is a Portable Interface Unit providing full MIL-STD-1553 test, simulation and bus analysis capability in a compact self-contained unit, to connect via a USB interface to suitable host systems. The unit provides support for all 1553A, 1553B, McAir and STANAG 3838 variants in a self contained battery operated unit, and is supplied with a matching power supply and battery charger unit for desk-top use. The 1553-USB-PIU supports concurrent Bus Controller (BC) and up to 31 Remote Terminals (RT) with Bus Monitor (BM). An additional stand-alone Chronological Bus Monitor (CBM) facility is also provided, with comprehensive multi-level triggering capability. Full error injection capability is provided in BC and RT modes, with full error detection in BC, RT, BM and CBM modes. The unit provides a variable amplitude dual redundant 1553 interface. 2 Mbytes of dual ported RAM are provided. The unit is supplied with "C" Driver library, together with a Windows GUI, providing a user friendly software tool for all 1553 set-ups, data management and storage.
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Bruker Corporation
Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker’s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled worldwide customer service and support, 75% of the world's top 25 semiconductor manufacturers rely on Bruker metrology tools for front-end and back-end applications, including development of their next-generation thin films. Bruker commitment to innovation and technology leadership drives the continued release of new advancements in metrology, and has garnered numerous awards and industry recognition. In applications ranging from C-S thin films materials characterization to wafer substrate analysis and defect detection, Bruker’s systems provide simulation analysis and fit. HRXRD, XRR, WA-XRD, and XRDI measurement types are fully supported, enabling researchers, production engineers, and process developers unparalleled capabilities. Whether you are a semi and C-S fabricator, R&D center or academy, or an industry materials research facility, Bruker has a specifically designed solution for your metrology needs.
