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elemental component of knowledge able to be processed.

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Showing results: 5206 - 5220 of 8105 items found.

  • Time Domain Replication (Road Load Simulation)

    M+P International

    The powerful graphical editor makes it easy to review and compile your field sample data for use in the test lab. The point editor, filters, velocity and displacement compensation ensure the test feasibility is evaluated at an early stage. The continuous closed-loop controller then replicates the test files with very high levels of precision. The control algorithms use a continuous coherence averaging technique to ensure a stable proactive control loop that will not only provide accurate replication but will also respond to changes in test item dynamics.

  • Transistor-Level Defect Simulator

    Tessent DefectSim - Mentor Graphics Corp.

    Tessent DefectSim is a transistor-level defect simulator for analog, mixed-signal (AMS), and non-scan digital circuits. It measures defect coverage and defect tolerance. Tessent DefectSim is perfect for both high-volume and high-reliability ICs. Tessent DefectSim replaces manual test coverage assessment in AMS circuits needed to meet quality standards such as ISO 26262 and provides objective data to guide improvements in DFT. Tessent DefectSim dramatically reduces SPICE simulation time compared to simulating every potential defect.

  • Transportable NOx-O2 Gas Analyzer

    NOA-7100 - Shimadzu Corp.

    The NOA-7100 adopts the normal pressure chemiluminescence method is adopted for NOx measurement, and the zirconia method is adopted for O2 measurement. NOA-7100 is “All-in-one portable analyzer” that incorporates the pretreatment parts needed for measurements. Switching between eight ranges from 25 to 4,000 ppm supports a wide range of NOx measurements.  The NOA-7100 has wireless communication capability, so measurement values and charts can be displayed on PCs or smart devices. And measurement data can be exported using a USB flash drive.

  • USB Products

    Keysight Technologies

    Keysight´s compact USB modular products are a series of modules that are flexible to be used standalone or plugged into a compatible chassis to make synchronized measurements as a modular unit. Essential measurements can be made with a laptop PC and these modules through USB high-speed 2.0 connections. Through individual windows, the Keysight Measurement Manager (AMM) software provides a friendly soft front-panel interface for each of the modular products. This helps to perform quick configuration and measurement acquisition as well as flexible analysis of measured data.

  • VPX

    Data Patterns Pvt. Ltd.

    The VPX standard defined by ANSI/VITA 46.0 is a modern derivative of the older VME standards that is primarily targeted at defence applications, leveraging latest technologies in high speed electronics in order to provide higher performance computing, improved ruggedisation and thermal management capability, higher I/O densities and improved maintainability due to better immunity to ESD. Data Patterns has designed and manufactured a broad range of VPX products required for high end Radar / Electronic Warfare / Image Processing and Sonar applications.

  • VUV Spectroscopy Detector

    VUV Analytics, Inc.

    All gas phase molecules absorb strongly in the vacuum ultraviolet region (120 – 240 nm), yet application of VUV absorption technology to routine analytical detection and measurement has not been addressed…until now. The VGA-100 is the world’s first benchtop VUV spectrometer. It is a universal mass-sensitive gas chromatography detector that provides both qualitative and quantitative data. The strong absorption of gas phase molecules in the VUV spectrum provide excellent sensitivity, and the compound-specific absorption spectra provide unparalleled selectivity.

  • Ytterbium-doped Fiber Amplifier

    YDFA - Amonics Ltd.

    Ytterbium-doped Fiber Amplifier (YDFA) is another Amonics specialised product line. Like our highly recognized optical amplifiers, the YDFA offers high output power and high gain with exceptional reliability. ideal for high power YDFA applications. The turnkey microprocessor controlled benchtop YDFAs manage alarms and status indicators. An integrated RS232 or Ethernet computer interface enables easy control, diagnostic functions and data acquisition. Available options include single frequency operation, linearly polarized operation.

  • 3 3/4 Digits AC/DC Current Digital-Clamp Multimeter

    KT7193 - Ketai instrument (kunshan) Ltd.

    ● 3 3/4 digits 3999 count● Extra high DC/AC current measurement● Data hold to capture measurements● Backlit display is easy to read under any light condition● AC current measurement up to 1500A● DC current measurement up to 1500A● DC/AC voltage, resistance, capacitance, frequency and temperature measurement● Diode and continuity test● Accessories included: 9V battery, carrying case, test leads, K typetemperature probe, English manual, gift box

  • DAS Antennas

    TE Connectivity Ltd.

    In-Building Distributed Antenna System (DAS or i-DAS) antennas are low profile and designed to be mounted discreetly to a hard or tiled ceiling. Used in a series throughout large buildings, campus areas or even in below ground sections of a building the antennas can provide a distributed LTE or Wi-Fi signal to where it is required most. With a growing demand for in-building connectivity and higher data rates, larger smart or connected buildings require a series of antennas in order to distribute signal around the building or campus area.

  • Enterprise Solutions

    L3Harris Geospatial Solutions, Inc

    Remotely sensed datasets have grown in size and number. As a result, standard desktop computers have been overwhelmed by the processing power needed to extract information from these voluminous datasets. Responding to customer needs, L3Harris Geospatial has developed an array of enterprise geospatial software solutions tailor-made for users at all stages of enterprise deployment.Whether you want to scale up your ENVI/IDL desktop processing or get a rapid answer from a large data set, we have the solution for you.

  • Reticle Manufacturing

    KLA-Tencor Corp

    An error-free reticle (also known as a photomask or mask) represents a critical element in achieving high semiconductor device yields, since reticle defects or pattern placement errors can be replicated in many die on production wafers. Reticles are built upon blanks: substrates of quartz deposited with absorber films. KLA’s portfolio of reticle inspection, metrology and data analytics systems help blank, reticle and IC manufacturers identify reticle defects and pattern placement errors, thereby reducing yield risk.

  • 3D Laser Imager

    Vector-DD - Halo Photonics

    The Vector 3D laser imager offers multi wavelength, full waveform data capture, coupled with the flexibility of an all-sky scanner. The Vector-DD is a direct detection (DD) 3D (range, angle, angle) active imager with an all-sky full hemisphere scanner. It employs a nodal point design so that all the lines-of-sight converge to a single point at the instrument*. In addition, two wavelengths can be transmitted so that differential reflectivity information can be derived. The unit is compact and portable and operates from 24V DC.

  • Mass Detector

    ACQUITY QDa - Waters Corporation

    ACQUITY QDa is as intuitive as an optical detector, with the robustness to handle all of your analyses. Working in harmony with your chromatography, it is pre-optimized to work with your samples, without the sample-specific or user adjustments typical of traditional mass spectrometers. For the first time, any analytical scientist can consistently generate the highest quality mass spectral data, routinely without the need for any special training or expertise thus eliminating any need to contract out and wait for results from specialist analytical service laboratories.

  • X-ray Microscopy

    ZEISS Xradia Versa - Carl Zeiss AG

    Extremely versatile ZEISS Xradia Versa 3D X-ray microscopes (XRM) provide superior 3D image quality and data for a wide range of materials and working environments. Xradia Versa XRM feature dual-stage magnification based on synchrotron-caliber optics and revolutionary RaaD™ (Resolution at a Distance) technology for high resolution even at large working distances, a vast improvement over traditional micro-computed tomography. Non-destructive imaging preserves and extends the use of your valuable sample, enabling 4D and in situ studies.

  • 10 Gigabit Ethernet AdvancedTCA® Fabric Interface Switch Blade

    aTCA-3430 - ADLINK Technology Inc.

    The aTCA-3430 is a high performance 10G Fabric switch blade for AdvancedTCAR platforms. This product is ideal for bandwidth intensive telecom applications such as wireless access controllers, DPI/security network, IPTV, IP multimedia subsystems, RNC/BSC, broadband access/bearer networks, data centers, and LTE/4G network applications. The aTCA-3430 provides 10GbE hub-to-node connectivity and integrated switch silicon that supports load balancing, priority queues, packet classification, and flow control to enable strict bandwidth management for implemented applications.

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