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Testing of individual hardware or software components or groups of related components.


Showing results: 2011 - 2025 of 2779 items found.

  • Electro Fatigue Testing Machine

    EPS Series - Jinan Testing Equipment IE Corporation

    EPS series Electro Fatigue testing machine are fast acting table-top testers ideally suitable for performing static and dynamic fatigue tests on a variety of materials and components. These electro-dynamic machines use a linear electric motor with an adjustable upper cross-head of a stiff dual column frame. The electro-dynamic actuator is connected to single phase power, which resulting in a clean low maintenance solution. With dynamic force capacities, the Electro Fatigue testing machines are used to evaluate the mechanical properties of biologic materials, composites, orthopedic fixation devices, prostheses, spinal constructs, stents, dental implants, elastomeric materials and others.

  • Helium Leak Detectors

    Agilent Technologies

    Agilent’s range of leak detection solutions ensure the safety, security, and consistent performance of research, vacuum, and industrial process systems. Our Helium Leak Detector (HLD), PHD-4 sniffer and C15 component leak detector are rugged, precise, and easy-to-use instruments that accurately and efficiently detect leaks in an array of industrial applications. For clean research applications, HLD configurations employ clean, dry, quiet scroll vacuum pumps. Our leak detectors feature automated start-up and calibration for maximum productivity, built in application set-ups, and an array of accessories to make any leak detection process simple.

  • Solder Joint Reliability Testing

    National Technical Systems

    Solder joint reliability is defined as the ability of your product’s solder joints to function under given conditions and for a specified period of time without exceeding acceptable failure levels.Whether you are trying to implement a new solder type or new component types, solder joint reliability testing is essential in providing confidence that your product will perform within its intended operating limits. The results from different test programs can be compared to provide an understanding of design requirements for adequate reliability. This provides you with useful technical information for future designs, saving you time and money.

  • Force Sensors

    Kistler Instrument Corp.

    Piezoelectric force sensors, respectively piezoelectric force transducers or load cells, are perfectly suited for the precise measurement of compressive and tensile forces, both in highly dynamic applications and in quasi-static processes. In universities and industry, for basic research or quality assurance: exact data is always essential in order to measure force characteristics and make processes more cost-effective. Thanks to their rugged design, piezoelectric force sensors from Kistler keep precise track of quasi-static and highly dynamic force processes, even when conditions are difficult. Our force sensors can also handle simultaneous measurements of multiple orthogonal force components.

  • PXIe-5450, 145 MHz Bandwidth, 16-Bit, 128 MB, I/Q PXI Waveform Generator

    780419-01 - NI

    PXIe, 145 MHz Bandwidth, 16-Bit, 128 MB, I/Q PXI Waveform Generator—The PXIe‑5450 is a 145 MHz, dual‐channel arbitrary waveform generator optimized for I/Q communications signals. It is an ideal instrument for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator. The PXIe‑5450 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5450 also features advanced synchronization and data streaming capabilities.

  • PXIe-5450, 145 MHz Bandwidth, 16-Bit, 512 MB, I/Q PXI Waveform Generator

    780419-02 - NI

    PXIe, 145 MHz Bandwidth, 16-Bit, 512 MB, I/Q PXI Waveform Generator—The PXIe‑5450 is a 145 MHz, dual‐channel arbitrary waveform generator optimized for I/Q communications signals. It is an ideal instrument for testing devices with I/Q inputs, or as the baseband component of an RF vector signal generator. The PXIe‑5450 also features onboard signal processing (OSP) functions that include pulse shaping and interpolation filters, gain and offset control, and a numerically controlled oscillator (NCO) for frequency shifting. The PXIe‑5450 also features advanced synchronization and data streaming capabilities.

  • Millimeter-Wave Noise Source, R-band, 26.5 to 40 GHz

    R347B - Keysight Technologies

    The Keysight R347B noise source covers a 26.5 to 40 GHz frequency range. This waveguide noise source allows you to make accurate and convenient noise figure measurements on millimeter-wave devices. The R347B provides highly precise broadband noise at the input of the system or component under test. The noise figure meter then processes the ON/OFF ratio of noise power present in the system IF, and provides an accurate reading of noise figure and gain. The R347B noise source has remarkable ENR stability over time, which allows longer recalibration cycles and more accurate noise figure measurements.

  • Semiconductor Device Parameter Analyzer and Measurement Modules

    B1500A Series - Keysight Technologies

    Keysight B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A’s modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.

  • Bench-top Insertion & Return Loss Test Station

    STC-IRL3201 - Shanghai Stone Communication tech Co., Ltd

    STC-IRL3201 is a high performance loss test station that is designed specially for Optical Passive Components production Test and Lab Test. It combines three different working modes as a return loss meter, optical power and loss meter and a stable laser source in one test station.

  • Testing Electric Pump Motors

    Magtrol Inc.

    This Custom Motor Test System is designed for the testing of 5 different sized electric motors used in various sump, utility, sewage, well, pool and pond pumps. All of the components mentioned above are mounted on a versatile table that can be easily reconfigured and retrofitted to any Magtrol dynamometer.

  • Biaxial Tensile Texting Machine of Membrrane Structure

    BTT Series - Jinan Testing Equipment IE Corporation

    The biaxial tensile testing machine consists of two parts, mechanical system and control system; mechanical system includes load frame, membrane specimen fixtures, servo motors(Japan), load sensors, displacement sensor and other components, while control system with the computer and software;

  • x64 CPU / Motherboard / Memory / HD Tester

    BurnIn64 - 7Byte Computers

    Burnin64 is a burn-in tool designed for AMD64 architecture to test the major components of computer under Windows For 64-bit Extended Systems(x86-64 platform) environment. It is specifically designed to test CPU(s), Motherboard, Memory and Hard drive(s) with the new features of x86-64 architecture in mind.

  • Combined Temperature and Altitude Environmental Test Chamber

    Guangdong Bell Experiment Equipment Co.,Ltd

    DGBell’s Altitude & Temperature Test Chamber combine Altitude and temperature to test various components and products, especially the aircraft avionics. Automatic controlled vacuum system provide a precise altitude simulated condition up to 30000 meters. Available to connect cable for the electronic performance test.

  • Special Version Multi-purpose Transistor Tester

    Shenzhen FNIRSI Technology Co., Ltd

    Key features:• 128 x 160 TFT color display for easy readings, can display measured data and graphics• Powered by 9V battery(not included)• All components are protected by a plastic case, convenient to carry• Automatically detect NPN and PNP transistors, N-channel and P-channel MOSFET, diodes, thyristors, resistors, capacitors and other devices• Automatically test the pins of a component and display on the LCD• Measure the gate threshold voltage and gate capacitance of the MOSFET• Measure bipolar transistor current amplification factor and base-emitter threshold voltage• Two-button operation, automatic shutdown to avoid unnecessary waste• Short detection time: Only 2 seconds (it is normal to cost 1 minute for bulk capacitor detection)

  • Camera Module

    XM Bond HR - Viscom AG

    Viscom AG offers the new XM Bond HR camera module for dependable inspection of wire bonds. Its characteristics include a 21 mm x 21 mm field of view size and exceptionally fine detail resolution. It is ideally suited for the most precise inspection of thin wires in the production line. With the new XM Bond HR camera module, Viscom advances the configuration possibilities in wire bond inspection for higher in-line inspection quality. This module is particularly recommended for safety-relevant electronics, where thin wires with diameters of e.g. only 20 µm are installed. Products of this kind find use, among others, in various types of signal processing in the automotive and aerospace sectors. The high-quality optical components and sensor chips with first-class resolution and sensitivity achieve superb image quality and sharp detail resolution. Together with its 21 mm x 21 mm field of view size, the XM Bond HR offers a resolution of 4.5 µm per pixel. A telecentric lens ensures that regardless of the distance to an object, an inspection window has the same image scale; for example, the end points of an inspected thin wire are always located at the same positions in the inspection window. In addition, the telecentric optics also prevent areas on the electronic assembly next to tall components from being hidden.

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