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See Also: Atomic Clocks, GPS Clocks, Time Reference


Showing results: 466 - 480 of 691 items found.

  • Advanced Measurement Package For M8000 Series Of BERT Test Solutions

    M8070ADVB - Keysight Technologies

    The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.

  • 4 Channel 1.0 ~ 17.0 Gb/s Pulse Pattern Generator and Error Detector

    CA9806 - UC Instruments, Corp.

    The UC INSTRUEMNTS CA9806 is a high performance, flexible four channel Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (consult factory for higher or lower operation speeds). It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build‐in 8.5 ~ 15 Gb/s eye diagram testing function.

  • Computer-Based Instruments

    GT668PXIe - Guide Technology, Inc.

    GuideTech’s GT668PXIe PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 100MHz time base with NIST traceable calibration. Some of the GT668PXIe-1 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.

  • FMC Loopback Test Board

    Kaya Instruments

    The FMC loopback tester board enables developers and assembly factories to test and characterize the FMC carrier board interfaces. The board features full differential loopbacks on all the FMC high pin count (HPC) connector interfaces including LA, HA, HB, DP and CLK. It also provides a 125MHz transceiver LVDS reference clocks on GBTCLK signals. The FMC loopback board is based on VITA 57 standard with ruggedized conduction or air cooling.

  • Continuous Time Interval Analyzers

    GT668PXIe-40 - Guide Technology, Inc.

    GuideTech’s GT668PXIe-40 PXI 3U form factor, meets industrial standard chassis with an expandable platform, achieving optimal test system at low cost. High accuracy 50MHz time base with NIST traceable calibration. Some of the GT668PXIe-40 measurements include Jitter measurements, PLL & Clock Jitter, Spread Spectrum Modulation, PLL Lock Time, Frequency, Period, Pulse Width, Skew, Tpd, Rise/Fall Time, Time Interval Error and more.

  • For Conduction Cooled ΜTCA Chassis

    UTC003 - Vadatech Inc

    The VadaTech UTC003 is the most feature-rich MCH (MicroTCA Carrier Hub) for the Conduction Cooled μTCA chassis in the market. It’s management software is based on VadaTech’s proven Carrier Manager and Shelf Manager. The MCMC manages the power modules, the two CU (Cooling Units) and up to 12 AMCs within the μTCA chassis. It also interfaces to and manages the on-board fabric interfaces. The module is available with PCIe, SRIO, 10GbE Layer 3 managed, and GbE Layer 2 managed. The UTC003 runs Linux 2.6 on it’s MCMC CPU and is hot-swappable and fully redundant when used in conjunction with a second instance of the module. The firmware is HPM.1 compliant which allows for ease of upgrade. The UTC003 provides Fabric (100 Mhz HCSL) clock to each AMC.

  • General Purpose Low-side MOSFET Drivers

    Renesas Electronics Corp.

    Renesas' family of low-side FET drivers are very high-speed matched dual-drivers capable of delivering peak currents of 2.0 amps into highly capacitive loads and excellent at driving large capacitive loads with minimal delay and switching times. The high-speed performance is achieved by means of a proprietary "Turbo-Driver" circuit that speeds up input stages by tapping the wider voltage swing at the output. Improved speed and drive capability are enhanced by matched rise and fall delay times. These matched delays maintain the integrity of input-to-output pulse-widths to reduce timing errors and clock skew problems. This improved performance is accompanied by a 10 fold reduction in supply currents over bipolar drivers, yet without the delay time problems commonly associated with CMOS devices. Dynamic switching losses are minimized with non-overlapped drive techniques.

  • 12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector

    CA9806-12 - UC Instruments, Corp.

    The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.

  • LVDS Digital I/O with Virtex-6 FPGA - XMC

    Model 71610 - Pentek, Inc.

    - 32 bits of LVDS digital I/O- One LVDS clock- One LVDS data valid- One LVDS data suspend- Supports LXT and SXT Virtex-6 FPGAs- DMA controller moves data to and from system memory- Up to 2 GB of DDR3 SDRAM- PCI Express Interface- Optional user-configurable gigabit serial interface- Optional LVDS connections to the Virtex-6 FPGA for custom I/O to the carrier board- RoHS Compliant Lead-Free Version Available

  • Test Solution Offering BER Testing

    Eye-BERT Micro LR - Spectronix

    The Eye-BERT Micro LR is a low cost, easy to use test solution offering BER testing at any rate between 6.312 and 125Mbps on either optical or electrical interfaces. Features include: continuously variable bit rate, user programmable pulse generator, internal CDR with retimer mode, bit rate measurement, and recovered clock output. The Unit is supplied with anti-skid bumpers for bench use, and is small enough to be integrated into larger systems for dedicated link verification.

  • 1100-Channel GSM Channelizer wih Quad A/D - 3U VPX

    Model 52663 - Pentek, Inc.

    - Complete GSM channelizer with analog IF interface- Four 180 MHz 16-bit A/Ds- Two banks of 375 DDCs for upper GSM band- Two banks of 175 DDCs for lower GSM band- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multiboard synchronization- PCI Express Gen. 2 x4- 3U VPX form factor provides a compact, rugged platform- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe

  • 1100-Channel GSM Channelizer wih Quad A/D - XMC

    Model 71663 - Pentek, Inc.

    - Complete GSM channelizer with analog IF interface- Four 180 MHz 16-bit A/Ds- Two banks of 375 DDCs for upper GSM band- Two banks of 175 DDCs for lower GSM band- Sample clock synchronization to an external system reference- LVPECL clock/sync bus for multimodule synchronization- PCI Express Gen. 2 x8- RoHS Compliant Lead-Free Version Available- Synchronize up to eight modules with Model 7893 System Synchronization and Distribution Amplifier - PCIe

  • PXI Digital Pattern Instrument

    NI

    The PXI Digital Pattern Instrument is designed for semiconductor characterization and production test. It provides 32 channels, a voltage range of -2 V to 6 V, a PPMU force voltage range of -2 V to 7 V, up to a 200 Mb/s data rate, and a clock generation rate up to 160 MHz. The module includes Digital Pattern Editor software as well as debugging tools like shmoo, digital scope, viewers for history RAM, pin states, and system status.

  • PXI Power Supplies

    Salland Engineering

    PXI is an abbreviation for PCI eXtensions for Instrumentation. It is based on the PCI architecture, a commonly-used standard in personal computers, with an industrial connector. A second connector adds instrumentation-specific signals to the backplane, like clock and trigger signals. Applicos is providing PXI modules that intend to close a gap in the portfolio of the big players such as National Instruments, Keysight, ADlink and others. We focus on special functions and above average performance. Also in PXI the Applicos culture yields excellence on noise, accuracy and other analog properties.

  • Power System Recorder

    TESLA LITE - ERLPhase Power Technologies Ltd

    The new TESLA LITE is an economical user-friendly multi-timeframe power system recorder: Economical yet complete power system recording for custom applications in smaller substations. Easy to use intuitive software Simultaneous transient fault, dynamic swing and trend recording and event logging Fault location derived from single and calculated currents IRIG-B clock synchronization (modulated and unmodulated) Smallest footprint among recorders allows easy retrofit and installation 12 current, 6 voltage and 38 digital inputs

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