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ATE

ATE systems are used to test semiconductor devices, printed circuit boards, and electronic systems during manufacturing. AI prompted RL created', prevails upon the UUT to demonstrate It's fulfillment of test requirements.

See Also: Automatic Test Equipment, ATS, Functional ATE, Combinational ATE, Semiconductor Test, PXI Switching, PXI Chassis, PXI Matrix, Automated Test Equipment, Automated Test Systems


Showing results: 76 - 90 of 1015 items found.

  • Bench/System/ATE Programmable DC Power Supply Single Or Dual Outputs, 360 To 840 Watts, With Or Without Remote Interfaces

    CPX Series - Aim-TTi

    PowerFlex design gives variable voltage and current combinations within a maximum power rangeUp to 60 volts and up to 20 amps180 watts or 420 watts maximum per outputIsolated outputs can be wired in series or parallelConstant voltage or constant current operationSettings Locking (S-Lock)PowerFlex or fixed-range operationVariable OVP tripsSelectable remote sense terminalsCompact quarter or half rack 3U case sizeIsolated analogue remote control (CPX400SA only)RS232, USB & LXI compliant LAN (P models only)GPIB Option (P models only)

  • Automated Test Equipment

    ATE - Frontier Electronic Systems Corp.

    The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.

  • Standalone Test System

    1000 Series ATE - Circuit Check, Inc.

    The Circuit Check 1000 Series ATE provides a configurable standard platform that can utilize multiple mass interconnect interfaces while providing ease of maintenance and the ability to accept a wide variety of test fixture solutions. With the 1000 Series ATE, test procedures become automatic, with test steps and go/no-go limits easily programmable.

  • Combination Board Functional Test System

    QT 4256 ATE - Qmax Test Technologies Pvt. Ltd.

    QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.

  • Benchtop Test System

    300 Series Benchtop ATE - Circuit Check, Inc.

    The Circuit Check 300 Series benchtop ATE Test Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 300 Series Benchtop ATE, test procedures can become automatic, with test steps and go/ no-go limits easily programmable in common tabular form. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.

  • Benchtop with Drop-In Test System

    600 Series Compact ATE Platform - Circuit Check, Inc.

    The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.

  • Linear Power Supplies Precision, Analog or Local Control, Ultra Low Ripple/Noise

    Series ATE - Kepco, Inc.

    Series ATE linear power supplies are precision analog-controlled power supplies. They feature high gain and zeroable offsets to follow voltage signals or variable resistance controls precisely. An optional fast mode provides fast programming response into the mid audio range, providing active down programming and active up programming. The voltage and current channels are equally controllable with automatic crossover between modes. These power supplies offer ultra low noise and ultra low ripple at the output and are MIL-STD-461 compliant.

  • Standalone with Drop-In Test Systems

    800 Series ATE - Circuit Check, Inc.

    The Circuit Check 800 Series ATE provides the versatility of utilizing the economical drop-in fixturing present in the 600 Series or an integrated dedicated fixture, while simultaneously providing the increased test equipment capacity of the 1000 Series. This combination produces a cost effective full turnkey test solution.

  • Combination Board Tester

    ATE QT2256-640 PXI - Qmax Test Technologies Pvt. Ltd.

    Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or micro controller based boards. ATE QT2256-640 PXI system is designed as a combination board tester capable of testing highly complex and PCBs employing various techniques on a single platform. It can be easily upgraded to 640 digital channels and with programmable UUT power supplies, IEEE or PXI external instrumentation, Bus cycle signature system, ICE and integrated Boundary scan Test AC/DC parametric testing. The ATE is interfaced to an external host PC using a PCI express interface card allowing a maximum data transfer rate. Most commercial ATEs does only functional test and do not carry out DC/AC parameter testing, which are very essential in increasing the fault coverage and for achieving near zero field returns. The testing challenges get worse when the boards are equipped with BS compatible components, DSP chips and CPUs or microcontroller based boards.

  • Manual Drive Unit

    ATE MA350 - INGUN Prüfmittelbau GmbH

    Parallel contact stroke: 20 mm. Contact force max.: 300 N. Component on PCB: 58 mm. Pressure frame unit-opening angle: 66.Weight: 2,60 kg

  • Manual Drive Unit

    ATE MA260 - INGUN Prüfmittelbau GmbH

    Parallel contact stroke: 20 mm. Contact force max.: 300 N. Component on PCB: 58 mm

  • Electronic Ballast Automatic Test Equipment

    ATE-1 - Lisun Electronics Inc.

    Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.

  • Automated Test Environment

    AS5657-ATE - DapTechnology B.V.

    The AS5657 Automated Test Environment (AS5657-ATE) is designed to automate device compliance testing according to the SAE-AS5657 “Test Plan/Procedure for AS5643 IEEE-1394b Interface Requirements for Military and Aerospace Vehicle Applications”. The purpose of this tool is to automate and simplify the task of AS5643 compliance verification and testing, which of course is essential for device compatibility within avionics and aerospace programs.

  • LED Driver Automatic Test System

    ATE-2 - Lisun Electronics Inc.

    •This system includes 2 groups (left and right); the 2 groups can work in turn, so that to improve the work efficiency. For example, if the left is on working, then the right can make wire connection. •It can test 4 LED drivers input and output at one time. •The equipment can connect with electronic load and LED load, the two difference loads can be fast switch under the control of computer. •Enable to print out the series number and parameters of sub-quality products by working with a micro-printer, •Enable to achieve the bar-code record function by working with a bar-code scanner. •The test report can be saved as Excel file for consult, statistic and analysis purpose. •Good software interface to freely choose the difference parameters combination, so that to meet different demands. All the parameters can set limit, and with the quality analysis function.

  • A Popular Combination Of Flex 10 And Flex 20 In A Compact Footprint

    Flex 30 ATE - A.T.E. Solutions Ltd.

    A combination of both the Flex 10 and 20 system, the Flex 30 is floor mounted system that maintains a small footprint whilst offering that useful additional space. Generally it is fitted with either the G12 or G12X VPC interface allowing a large number of mixed signal connections to be routed to the test fixture.

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