Showing results: 46 - 60 of 1014 items found.
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BCO, Inc.
• Developed for DRS Codem Systems, Inc. to test the CTM-IP product line of the Multi-Interface Protocol Converter.• Manufacturing Test support for the CTM-IP chassis and Interface Modules. Functional test of signaling, protocol and software configurations for various communication interface configurations.• Regression Test support for Engineering Product Development. Configurable test sequencing allows engineer to select specific tests for execution, with the ability to exercise all combinations of data rates and interface configurations.
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AMETEK Programmable Power, Inc.
*Provides eight channels of programmable DC power with output isolation function*Output disconnect function*Total control via Ethernet within power supply.*Mounted in custom in transportable shock-mount case.
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STAr Technologies, Inc.
STAr partners with key industry leaders to deliver the highest Automated Test System in a scalable, open architecture platform. With powerful software tools that aid the developer in the setup and control of test configurations, errors are absolutely minimized. Whether LXI, VXI, PXI or proprietary, consistently deliver accurate, repeatable data for applications worldwide.
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AL663 -
6TL Engineering
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
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AmFax Ltd
Fill out your core test system with high quality NI hardware
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MP5800 / MP5806 -
Adivic RF Test & Measurement
*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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S790 Series2 -
DiagnoSYS Systems Ltd
The Diagnosys S790 Series2, with its high technical specification hardware and technology, represents the ultimate high-performance, precision test ATE system.
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5300HX -
Scientific Test, Inc.
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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yieldWerx Semiconductor
For decades engineers have used STDF as the standard format for ATE test output- data logs, and yieldWerx automatically parses this format. However, with the increase in engineer’s usage of the general data record type (GDF) this usage often results in every product test program’s data log having a unique format from which you need to extract your data. Our support team can assist your company in this data extraction from STDF generated data logs using GDF record types.
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Copper Mountain Technologies
With our USB VNAs your automated test equipment works as one software system running on a single computer. We can customize the analyzer module to fit in your system, provide extra frequency range coverage as compared to our standard VNA models should you need it in your specific application or characterize the expected performance outside the frequency limits of our standard VNAs.
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5000E -
Scientific Test, Inc.
Same Proven Technology as all 5000 Series Testers. High Speed Single Test Measure. Capable of Testing Multiple and Mixed Devices. 1KV Standard, 2KV Optional. 1NA to 50A Standard, 100A Optional. 0.1NA Resolution. Complete Self Test. Auto-Calibration. RDSON to 0.1MOHM Resolution. Windows Application Software. Optional Scanner. Optional Wafer Mapping. Optional Curve Trace. MOSFET, IGBT, J-FETTriac, SCR, Sidac, Diac, Quadrac, STS, SBS Transistor, Diode, Opto, Zener Regulator, MOV, Relay. UNDER $23,000.00
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GT98901 -
Terotest Systems Ltd.
The GXT98901 Demo board is a USB controlled, cost-effective, multi-function PCB assembly. The module is completely self-contained and includes an LCD display, measurement and stimulus resources, digital I/O, relays, and switches – all which can be accessed and monitored via the USB port using a SCPI command set via a USBTMC interface which supports the USB488 protocol.
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Keysight Technologies
TE solution design, development, and integrationMeasurement / Test Process analysis and consultationEasy-to-use software interfaces for Engineers and UsersFactory automation for test processesAll major instrument brands available & supported
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AB Controls, Inc.
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.