Showing results: 1 - 3 of 3 items found.
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NorCom 2020-WL -
NorCom Systems Inc.
The NorCom 2020-WL is specifically designed for wafer-level inspection and leak tests up to 1000 devices per cycle. The system can inspect up to an 8” wafer on or off a saw frame. It is designed to test MEMS and other wafer level devices that have a cavity.
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SolarWIS Platform -
ASM Assembly Systems
Eliminating the opportunity for problematic wafers to enter cell manufacturing lines greatly improves output and yield. ASM AE’s wafer sorter features 3D area inspection capability to inspect wafer thickness, total thickness variation (TTV), saw marks, as well as wafer bow and warpage. SolarWIS also includes modules that can inspect for stain, geometry, micro-cracks, edge chips, resistivity, P or N conductivity and lifetime.
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SRT-301 -
HenergySolar
SRT-301 Saw Mark Tester is used to Measure Line-mark depth of the wafer surface,it has the advantages such. As easy carried, Conveniently operated Liquid crystal display, energy conservation and so on, At the same time,it has the built-in printer and rechargeable batteries , All design are up to the standards of JIS,DIN,ISO,ANSI.