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Product
Electronics Testing Solutions
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Don’t cut corners when it comes to developing high-quality electronics functional testing solutions. Ball Systems helps you ensure you deliver the quality your customers expect by providing open and reliable advanced technical testing solutions.
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Product
Test Handler
M6242
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Optimal Test Handler for Mass-Production DRAM, with Double the Throughput.
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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
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80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Test Port Cable, 1 Mm
11500K
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Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
I-Pi SMARC Development Kit Based On NXP® I.MX 95 Six-Core Arm® Cortex-A55, M7 & M33
I-Pi SMARC IMX95
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The ADLINK LEC-IMX95 is a powerful and versatile SMARC module that delivers high-performance computing, graphics, machine learning, and vision capabilities for IoT and industrial applications. It is based on the NXP i.MX95 processor, which integrates six Arm Cortex-A55 cores, one Arm Cortex-M7 core, one Arm Cortex-M33 core, an Arm Mali GPU, an ISP, and an eIQ Neutron NPU that can run at up to 2 TOPS.
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Product
Test development service
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Test development may be a complex task, because each emulated session must be unique and consistent. Unless the website consists of exclusively static pages, there is no testing tool that can fully automate the test design process. In many cases the implementation may require considerable research of the client-server communication scheme.
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Product
Development Switch
AFDXSwitch Lab v2.0
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The AFDXSwitch Lab v2.0 is identical to the TTESwitch A664 Lab v2.0, which fully supports AFDX® and operates in accordance with all requirements specified in the ARINC 664 part 7 standard. Features include traffic policing and frame filtering functions as well as integrity and error checking of frames. Additionally, the switch comes with advanced features like 1 Gbit/s speeds and flexible physical layer configuration. The TTESwitch A664 Lab v2.0 is based on the TTESwitch Module A664 Pro, thus providing the full range of technical functionalities of TTTech’s certifiable AFDX switch modules and making it the optimal switching solution for a large variety of different application areas.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Development Tools
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Automotive Ethernet (BroadR-Reach) development tool for bidirectional media conversion and coupling (Ethernet Tap) from Automotive Ethernet (BroadR-Reach). In addition, the Media Converter BroadR-Reach can diagnose connection quality, status, and errors .
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Product
Development Switches
TTESwitch A664 Lab
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The TTESwitch A664 Lab supports multi-environment development efforts for hard real-time operations in distributed systems. The Deterministic Ethernet switch enables the design of highly dependable systems with focus on high availability, reliability, integrity, security, maintainability and safety.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Development System
FE-51RD2
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* Emulates Atmel AT89C51RD2, AT89C51ED2 and others * 60K Code Memory * Real-Time Emulation * Frequency up to 20MHz/3V, 33MHz/5V * ISP and X2 Mode Support * MS-Windows Debugger For C And Assembler * Emulation Headers and Signal Testpoints * Target Board and Programmer Included * Serially Linked to IBM PC at 115Kbaud
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Development Tools
C251
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The Keil 251 Development Tools are designed to solve the complex problems facing embedded software developers.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Development Platform
LaunchPad™
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Begin rapid prototyping applications in minutes with our microcontroller-based LaunchPad kits, Sitara™-processor-powered BeagleBoards and SimpleLink™ wireless connectivity SensorTags. The Sidekick line of kits from Seeedstudio offer customers a quick way to evaluate custom circuits with many of the popular microcontroller development kits available on the market.
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Product
Functional Testing for Developers
TestLeft
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TestLeft is a powerful yet lean functional testing tool for dev-testers working in Agile teams. It fully embeds into standard development IDEs. A built-in access to object and method library is also available with TestLeft. Dev-testers can thereby easily and quickly create robust functional automated tests without leaving their favorite IDEs such as Visual Studio. It also works well with other tools in dev eco-systems such as source control or continuous integration systems.
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Product
Eclipse Test Development Environment
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The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
