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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Application Gauging
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Bowers Group offers a range of both standard and bespoke measurement solutions for a variety of gauging applications. As the world’s leading bore gauge manufacturer, our application heads can be fitted directly onto our XT range of internal micrometers to create a flexible, modular measuring system. Whether you’re measuring threads, grooves, splines, sphericals, or deep holes, we have a standard solution to suit. If you’re looking for something completely bespoke, our team has the skills and expertise to solve your measurement problem.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Applications Services
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DXC is your trusted partner to help you simplify, modernize, and accelerate mission-critical applications that support business agility and growth. Take advantage of the latest digital platforms with both custom and packaged applications, ensure resiliency, launch new products and enter new markets with minimal disruption.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Applications
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Whenever safety and cost efficiency are at stake, SuessCo sensors and monitoring systems are the first choice. Individual solutions can be developed for a large number of application areas.
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
Mobile Application Penetration Testing
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A Mobile application is an application that runs on mobile devices. It has become a dominant and popular business tool today. Corporates are empowering mobile devices by offering more and more services on mobile and handheld devices. Unfortunately, mobile devices like notebook computers, PDAs, Pocket PCs, smartphones, and BlackBerrys are all attractive targets for malicious attackers. By accessing your corporate network via email, VPNs, and other means of remote access, a successful compromise can result in the exposure of Personally Identifiable Information, corporate secrets, customer data, and additional sensitive information.
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
Application Solutions
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Here you will be able to find our most commonly asked questions. If the question you are looking to be answered is not here please do not hesitate to Contact Us.Still have questions? Feel free to contact us.
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Product
In-Circuit Test Applications
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With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
VXI Chassis for Digital Test Applications
1263 Series
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The 1263 Series includes medium-power (1263MPf) and high-power (1263HPf and 1263HPr) models that leverage all the features of the VXI 4.0 standard for performance that meets your most demanding test requirements. The 1263 series is ideal for digital test applications.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Software for Test, Analysis and Simulation applications
AIM Software Solutions
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AIM offers PBA.pro Software for Test, Analysis and Simulation applications. PBA.pro is compatible with Windows and LINUX Operating Systems and supports most of the AIM interface hardware modules. The flexible, scalable and open PBA.pro concept supports a wide spectrum of customer applications.
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Product
Parametric Test Fixture
U2941A
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The Keysight U2941A is a parametric test fixture that is designed to complement the usage of U2722A USB source measure unit in the testing of semiconductor components, including SMT and DIP ICs.
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Product
Femtocell and Application Testing
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About the size of a home ADSL Router, a Femtocell (also known as an Access Point Base Station) is designed to allow 3G enabled devices (Phones, PDAs, Laptops) to connect to a carrier's core 3G network even where the carrier does not provide a signal themselves. It does this by bridging between the Wireless 3G devices and the carrier’s network using the Internet. Specifically, it will be connected to a Router (ADSL, Cable or other) already providing access to the Internet. Calls made and data services used on the 3G device are then sent to the carrier (and received from the carrier) over IP.
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Product
Enterprise-Wide Application and Security Testing
PerfectStorm ONE
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Keysight Network Applications and Security
Enterprises and government organizations are making major investments in consolidating and rebuilding data centers and enterprise -wide networks. The stakes have never been so high to get it right the first time.
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Product
Anite Application Testing
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Verify higher level protocols and application enablers for a more effective roll-out of LTE-IMS based services to end-usersPerform rapid and cost-effective application testing associated with device acceptance test plans mandated by major mobile operators such as China Mobile, Verizon Wireless, AT&T and T-MobileGain access to comprehensive IMS LTE test plans mandated by standardization organizations such as GCF and PTCRB
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Product
Edge Applications
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Provide more powerful digital experiences with less overhead, using pre-built edge applications integrated with your CDN.
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Product
Application Tooling
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Using the proper interconnect manufacturer’s tooling is essential to meet many of the industry standards and to maintain the connector manufacturer’s product warranty.
