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Product
3-Axis Non-Robotic Automated Testing System
AT3
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The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Test Fixture, Axial And Radial
16047A
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The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) DisplayPort
510171116
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PCB Adapter, ITA, SIM, VTAC, 32 Pos, 6 Slot, to (1) DisplayPort.
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Product
Coaxial Waveguide Adapter, APC-7, 12.4 to 18 GHz
P281B
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The Keysight P281B adapter transforms waveguide transmission line into 50-ohm coaxial line. Power can transmitted in either direction, and each adapter covers the full frequency range of its waveguide band with SWR less than 1.3.
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Product
Adapter, 1.0 mm (m) to 2.4 mm (m), DC to 50 GHz
11922A
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The Keysight 11922A precision 2.4 millimeter coax in adapter offers a simple way of measuring coaxial devices at higher frequencies. It is designed for the measurement of components with 50 ohms impedance and a frequency range from dc to 50 GHz.
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Product
PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Pin Female SCSI Connector
510109339
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PCB Adapter, ITA, QuadraPaddle, 192 Position, to PCB-Mounted 2x68 Pin Female SCSI Connector.
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
NI-5783, 40 MHz Bandwidth Transceiver Adapter Module for FlexRIO
784364-01
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The NI‑5783 has DC‑coupled inputs with two variants: an elliptic filter variant optimized for frequency-domain applications and a Butterworth filter variant optimized for time-domain applications. The NI‑5783 is particularly well suited for applications in software defined radio, electronic warfare, high-performance machine control, and medical imaging. The NI‑5783 is compatible only with the PXI FPGA Module for FlexRIO modules that have a Kintex‑7 FPGA and the stand-alone Controller for FlexRIO.
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Product
Adapter Plate, 9050 Enclosure to 9025 ITA
410112422
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This Adapter Plate allows a 25 Module ITA to accept standard 50 Module Enclosures.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-2
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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Product
ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
510140125-2
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PXI Pull-Thru Adapter, PCB, QuadraPaddle, 68-Pin Male VHDCI
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Product
PXI Pull-Thru Adapter, PCB, QuadraPaddle, to 68 Pin VHDCI Plug
510109473
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PCB adapter from a 192 position QuadraPaddle receiver module to one 68 pin VHDCI plug
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Thermocouple (K-Type) And Temperature Probe Adapter
U1186A
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Consists of a K-type thermocouple bead and a mini connector to dual banana plugs.
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Product
Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
PXI Pull-Thru Adapter, Double Slot, 6.75"
510109566
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The PXI Pull-Thru Adapter can house discrete wiring that connects from a VPC i2 MX Receiver module to a PXI card. The Adapter has a removable side plate and thumb tabs for easy removal from the Receiver frame. Accepts all i2 MX Receiver modules.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
