-
Product
64-Channel 500kSa/s USB Modular Multifunction Data Acquisition
U2356A
-
The U2356A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2356A to simulate simultaneous analog input acquisition.
-
Product
Automated Compliance and Device Characterization Tests
N5990A
-
The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
-
Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
-
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
-
Product
Photonics Wafer Probing Test System
58635
-
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
Product
Tabletop Single Site Test Handler
3111
-
The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
-
Product
200 Vdc External Voltage Bias Fixture
16065A
-
Measure a DUT with up to +/-200 V DC bias and also measure axial/radial lead components
-
Product
Data Acquisition & Control
-
With these DAQ systems, you can acquire and digitize signals from variety of sources and sensors, store the data, analyze it, and present the results in local and remote locations.
-
Product
6TL29 Semi-Automated Test Platform
AQ377
-
- Compact, transportable and modular test platform.- Ready for ICT, FCT, Boundary Scan, HiPot, Vision or any combination of the previous technologies.- Mass interconnect 9025 Receiver from Virginia Panel.- 100% Compatibility with Inline Test Fixtures (P/N: AT799, AN133 and EB773).- Free available rack space: 47U height- Multi-stage pressure at 3 levels.- FastATE Technology & YAV Modules compatible.- Phi6 Dispatcher Interface.- CE Compliant.
-
Product
Standardize Production Test Software For PCBAs And Electronic Devices
-
The vast majority of test project man-hours are spent on software development, so the choices that teams make in software tools and architecture have significant impact on deployment schedules. Standardizing software across a team or organization increases both efficiency and proficiency, lowering the risk of missed deadlines and improving test quality and reliability. Test software must:
-
Product
Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196A
-
The 16196A surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results - reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement - now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
-
Product
ATE Self Test Fixtures
AL663
-
AL663 fixtures include all the electronic parts required to perform an effective test platform diagnostic. The AQ818 device allows to perform a series of tests, obtaining a report of the faulty instruments or switch modules and also a report about the relay contacts estimated life.
-
Product
Photodiode Burn-in Reliability Test System
58606
-
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
-
Product
Test System Optimized for High Throughput, Low Cost of Test for Single Site, Multi-site and Index Parallel Applications
ETS-88RF
-
Targeting the needs of power amplifier (PA) and front-end-module (FEM) semiconductor manufacturers, the ETS-88RF test system is aligned with the test challenges associated with these direct RF radio wave interface components. The precision with which the ETS-88RF can measure high-gain, wideband frequency performance, adjacent channel leakage and power supply efficiency makes this test system the most cost-effective alternative to bench set-ups. Teradyne routinely provides timely updates to a substantial library of RF Standards (such as 802.11xx and 3GPP) targeted for PA and FEM test.
-
Product
Isolated Digital I/O 60VDC, 150mA
OTP2 module no.186
-
The National Instruments PXI-6528, PCI-6528, and PXI-6529 Digital I/O Modules are isolated digital I/O interfaces for PCI and PXI. These modules can use inputs from NI 6528 and PXI 6529 devices to capture the status of sensors, actuators, and logic devices. NI 6528 devices have 24 SSR outputs for switching external devices with input currents up to 150 mA. The NI 6528 and PXI-6529 devices are suitable for a variety of applications, from automotive development and industrial factory automation to aerospace, laboratory research, and biomedical applications due to their high current handling capacity and isolation.
-
Product
64-CH 12/16-Bit Up to 3 MS/s Multi-Function DAQ PCI Express Cards
DAQe-2200 Series
-
ADLINK DAQe-2200 series are highdensity and high-performance multi-function DAQ PCI Express cards. The devices can sample up to 64 AI channels with different gain settings and scan sequences. It makes them ideal for dealing with high-density analog signals with various input ranges and sampling speeds. These devices also offer differential mode for 32 AI channels in order to achieve maximum noise elimination.
-
Product
BSD (Test Diagnostics)
-
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
-
Product
Functional Test
UTS
-
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
-
Product
Test Management Software
ActivATE™
-
Easily create and run robust test programs in semiconductor automated test systems with ActivATE™ test management software. Designed by test engineers for test engineers, ActivATE™ tames automated test complexities with elegant simplicity.
-
Product
128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
-
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
-
Product
Test Port Adapter Set, 3.5 Mm To 3.5 Mm
85130D
-
The Keysight 85130D test port adapter protects the test set port from being directly connected to the device under test. These adapters have a special rugged female connector that connects to the network analyzer test port. This special connector does not mate with a standard male connector but converts the rugged test set port to a connection that will mate with the device under test. This set contains a 3.5 mm to PSC-3.5 mm male adapter and a 3.5 mm to PSC-3.5 mm female adapter. The frequency range for these adapters is dc to 26.5 GHz with a return loss of 28 dB or better.
-
Product
Standard Test Systems
WaveCore™ Products
-
Textron Systems’ WaveCore family offers a variety of standard test systems with a primary application of satellite payload lab testing. Our systems can be deployed affordably for both production and engineering applications, providing industry-leading levels of data correlation with high system mean time between failures and low mean time to repair.
-
Product
PXIe SSD Storage Unit
DM-4M.2-3U
-
The Big River™ DM-4M.2-3U PXI Express storage unit provides up to 3.8TB* of M.2 SSD storage capacity. With a PCIe x8 Gen3 host interface, the DM-4M.2 delivers high-speed data rates for sequential writes of 3.25GB/s** and sequential reads of 3.41GB/s** to PXI Express based systems. The single slot design of the DM-4M.2 increases the availability of valuable chassis space, allows for maximum storage flexibility. The DM-4M.2 complies with PCIe Gen3 protocol standards. The product is commonly used in the industrial control, test and measurement fields. The DM-4M.2 operates under Windows, Linux, Unix, Solaris and VxWorks.
-
Product
SAS Protocol Test System
Sierra M124A
-
The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
-
Product
LTE RRM Test System
T4010S
-
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
-
Product
NFC Conformance Test System
T3111S
-
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
-
-
Product
6TL60 Rotary Test Handler
H79006010
-
6TL60 has been designed according to the 6TL philosophy, following the concepts of flexibility, modularity and scalability, and with the aim of improving production efficiency as well as increase production capacity and reduce costs.The 6TL60 is the best production solution to automate test processes to reduce the cycle time and the footprint used in the manufacturing plan
-
Product
Data Acquisition Modules
-
Advantech''s data acquisition modules and ethernet I/O modules provide ideal industrial control and measurement solutions for harsh environments and demanding applications. With wide operating temperature ranges and multiple mounting methods, Advantech''s ADAM series, such as RS-485-based and ethernet I/O, can be implemented in diverse applications. The Advantech ADAM-3000 series consists of cost-efficient, field configurable, isolated signal conditioning modules that can be easily installed to protect instruments and signals from the harmful effects of electrical interference.
-
Product
Functional Test
cUTS
-
Get the essentials of measurement automation to power tests of simpler PCBAs and subassemblies. compactUTS (cUTS) is a cost-effective platform for automating manual tests of devices with fewer than fifty cable-accessible test points in manufacturing environments with moderate production volume. DUT-specific electrically keyed cables make changeover quick and easy.
-
Product
32-CH 16-Bit Up to 250 kS/s Multi-Function DAQ Cards
PCI-9114 Series
-
ADLINK PCI-9114 series are 32-CH, 16-bit, high resolution multi-function DAQ Cards. The PCI-9114 device features flexible configurations on analog input. The devices are divided into 2 kinds: normal gain version and high gain version. Both versions provide 4 programmable input ranges for bipolar and unipolar inputs. The A/D on the PCI-9114DG device features a sampling rate of 100 kS/s with resolution at 16 bits, while PCI-9114A-DG/HG device features a sampling rate of up to 250kS/s with resolution at 16 bits. The device supports automatic analog input scanning, and offers a differential mode for 8-CH analog inputs and maximum noise elimination, as well as single-ended modes for 16- CH analog inputs. The PCI-9114 also features 1-CH 16-bit general purpose timer/counter, 16-CH TTL isolated digital inputs and 16-CH TTL isolated digital outputs. ADLINK PCI-9114 delivers cost-effective and reliable data acquisition capabilities and is ideal for a broad variety of applications.
