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IOL & Power Cycling Test Systems
Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Blackbody System
IR-518/301
Infrared Systems Development Corp.
The IR-518 Radiation Source provides an accurate, stable source of infrared radiation of known flux and spectral distribution. It can be used as a standard radiation source for the calibration of other laboratory sources, detectors, or other infrared devices requiring calibration against a standard.
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Simulation Systems
GSIM
The GSIM avionics IO platform builds on The Goebel Companyʼs long historyin computer architecture and realtime simulation. Weather your IOrequirements are simply driving a cluster of displays, or driving a fullcomplement of avionics IO, GSIM has the solution for you. GSIM providesthe highest IO count in single chassis rack mount or desktop configurations.GSIM configurations are delivered with Linux Real-time systems.
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Burn-in Systems
Incal Offers A Line Of State-Of-The-Art Burn-In Testing Hardware And Software For Retrofit And/Or Total, Customized Burn-In System Configurations.
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FMET Systems
The Failure Mode and Effect Testing system allows the shorting of any I/O pin to any other I/O pin, including one of 4 common "Rails". Users can establish rules to prevent unwanted shorting conditions.
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Quadrature Position & Rate Meter
Accepts low-level differential or single-ended 5 V logic level quadrature signals from shaft encoders to display scaled position or scaled rate. One, two or four transitions may be counted at a maximum combined rate of 250 kHz and be mathematically scaled to display in engineering units from -999,999 to +999,999. An analog output scaled to the display and relay outputs are optional.
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Metrology Systems
VIEW offers a full line of optical metrology systems for wafer, photomask, slider, MEMS, semiconductor package, HDD suspension, probe card, and micro-component process measurements.
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Fixed Systems
Low cost versatile solutionCompact, weatherproof, NEMA 4X enclosure115/220 VAC or 24 VDC operationLong life sensors (2+ years typical)Accepts RKI LEL/O2/H2S/CO direct connect sensorsAccepts any 4-20 mA transmitterAudible alarm with reset buttonTwo programmable alarm levelsBuilt-in trouble alarm with relayRelay rating 10 amps, form CProvides 4-20 mA output
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Tap Position Indicator
This instruments serves to indicate the angular or linear movement of any number of mechanism / Temperature at remote point particularly for OLTC panel to indicate - tap Position, winding / Oil Temperature Indicator.
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Test System
USB Explorer 280
The Ellisys USB Explorer 280 is a sophisticated protocol test and analysis system for USB SuperSpeed traffic monitoring, driver and software stack debugging, and performance analysis.
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System Integration
The provision of a basket of services for Auditoriums such as audio-visual systems, stage lighting, stage rigging, building control systems, communication systems and information technology systems. A proper understanding of the various disciplines involved is the key to successfully integrating the diverse component parts. The final solution must perform as one unit with a high degree of simplicity to the end-user. The result will be a solution that, while extremely complex, appears simple, logical and easy to use. Sri Comm has successfully designed, installed and commissioned several projects of this nature.
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System Instruments
bsw TestSystems & Consulting AG
Many tasks in the area of semiconductor characterization as well as in the testing of electronic assemblies are routine tasks. Test series of new building elements or samples from production are routinely measured in a large number of electrical parameters. For this, you do not need a measuring device with a complex graphical user interface. A simple interface for remote control with a PC is sufficient. The evaluation and visualization of the results is also carried out on the PC. With the Keysight E5270B and its "little brother" the E5260A two powerful modular SMU units are available for the purpose of the integration into automatic test systems.
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Burn-In System
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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Humidification Systems
The Humidity bottles are made from type 316 stainless steel. Swagelok fittings for gas inputs and outputs are welded into the bottle. Nafion tubing inserted into a type 316 stainless steel spring for support is coiled in the bottle to provide dew-point humidity level for the gas passing through the tubing. The bottle is insulated and heated using a silicone rubber flex-pad.
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Engineering/Development System
ULTRA L
The ULTRA L is a high performance “Lab” system that provides thermal conditioning, mechanical stimulus and an electrical ATE signal path for testing Micro-Electro-Mechanical Systems (MEMS) Accelerometers and Gyroscopes.
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Thermocouple System
Model TCIC
Industrial Measurement Systems Ltd.
High Speed 8 Channel Thermocouple Interface CardPDF VersionModel TCIC Thermocouple Interface Card with USB or RS232 / 485Main FeaturesLow cost high speed thermocouple measurement 400 channels / second
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Blackbody System
IR-563/301
Infrared Systems Development Corp.
IR-563 is a ideal source for the Near (1-3 um), Mid (3-8) and Far (8-30+ um) infrared bands. The IR-563 has been the industry standard 1000º C blackbody for more than 30 years, and continues to provide excellent service to infrared applications throughout the industry. The IR-564 extends the temperature range of the IR-563 to 1200º C by changing cavity materials to Silicon Carbide and high purity Alumina ceramics, otherwise the two units are virtually identical.
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XRD System
SmartLab®
SmartLab includes as standard Rigaku's patented Cross Beam Optical™ (CBO) technology. CBO technology uses simultaneously mounted, simultaneously aligned optical components for both focusing (Bragg-Brentano) and parallel beam diffractometer geometries. Users can switch between the two geometries without the need to remove, replace, or realign optical components.
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2-Axis Rate and Position Tables
When a device under test needs to be stimulated with simultaneous movements around two axes, then a product from the ACUTRONIC two-axis motion simulator range is the right choice. Due to their independent motion simulation in two axes they are very versatile: they are used as Inertial Guidance Test Systems (IGTS), for HardWare-In-the-Loop (HWIL) testing, for the test of optronic pointing devices, and many more applications.
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System Components
System components and accessories complete the Bender product portfolio:Coupling devices for ground-fault monitoring at high voltages, analog measuring instruments, power supply units, interface converters and interface repeaters.Please contact us for advice regarding these and other system components.
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Complete Systems
Micma GmbH specializes in individual hardware solutions. According to customer requirements, a team of hardware developers, software developers and IT specialists plan, develop and manufacture.
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On-Line Systems
SKF Condition Monitoring Center
For critical plant equipment or equipment where access is difficult or user safety is at risk, an SKF on-line machine condition monitoring system is a viable solution. On-line systems allow reliability and maintenance personnel to focus on diagnosing and correcting equipment problems rather than spending precious time collecting condition monitoring data.
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Vision Systems
Our GEVA vision systems offer the performance and flexibility to inspect multiple parts, assemblies or surfaces at the same time. These systems are equipped with multi-core processors, high-speed camera ports and versatile I/O options to match your application and factory integration requirements.
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Control Systems
GCA leverages decades of electronics and software experience as we build control panels and PLC software that bring machines to life and orchestrate how the machine's various components work together.
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System Amplifier
SAM100
The R&S®SAM100 system amplifier is an ultra-broadband solid state microwave amplifier with a frequency range from 2 GHz to 20 GHz. With a power of up to 20 W, outstanding linearity and very good noise characteristics, the R&S®SAM100 amplifier is ideal as a compact system amplifier in various measurement setups e.g. design (DVT) and product validation test (PVT) or EMC. In measurement environments with R&S generators, frequency analyzers or network analyzers, they can act as drivers or boosters and amplify the measurement signals
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Inspection System
X-eye 7000B
Appropriate for the inspection of medium•large size components and detection of surface structure and defects (inside voids and cracks etc).Due to high-energy, high-power Micro-focus X-ray Open Tube, maintenance cost's significantly reduced and long-term use possible with only replacing consumables.Customization is available with selecting main parts by customers depends on their needs for size and material.
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Test Systems
Ball Systems delivers best-in-class automated testing systems, software programming, integrated manufacturing systems, and industrial engineered solutions. Our team has former corporate test engineers, quality assurance engineers, industrial engineers, and test managers who have decades of experience to assist customers in meeting their automated test challenges by offering:
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Autofocus System
CRISP
Applied Scientific Instrumentation
The CRISP system is designed to maintain focus over time i.e. compensate for thermal & other factors that may cause the sample to drift out of focus over time. It also can be used to maintain a given focal point while scanning the sample in XY. If you are looking to find the optimal focal point while scanning through the sample in Z phase.
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System Colorimeter
C 3300
System colorimeter for fast measurements on temporal changing light colors with display of the tristimulus values X,Y,Z on three 4¾-digit displays, measurement rates up to 120 readings/s, with system colorimeter head CHS 60, by partial filtering very fine adjusted to the CIE color matching functions.
