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Saturable Spectroscopy Laser Lock Module
A compact, mechanically-robust laser frequency reference.
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Website Analysis Software
Site Content Analyzer 3
Site Content Analyzer 3 is new generation in website analysis software. It parses website on- and offline for keywords, suggests the most relevant and weighty phrases, analyzes link structure, and many more.
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Dynamic Signal Acquisition and Analysis
m+p Analyzer systems are available for field and laboratory use from 4 to many hundreds of measurement channels. From gathering simple time history data to narrowband (FFT) spectra, fractional octaves, wavelets, shock response spectra and much more, m+p Analyzer real time analyzers can be used with a wide range of instrumentation hardware including our own m+p VibPilot, m+p VibRunner and m+p VibMobile systems, National Instruments (CompactDAQ USB, PCI, PXI) and VTI Instruments (PCI). Low cost portable instruments to systems for distributed measurements can be configured for maximum flexibility. Measurement data from all sources are stored in a common format so it is easy to compare and handle results from any measurement source.
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CS/ONH-Analysis
G8 GALILEO
All state-of-the-art detectors used in the G8 GALILEO are equipped with internal reference channels for utmost stability and allow detection limits in a sub-ppm range (based on 1g sample mass)
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Gas Analysis
HPR-20 DLS
The Hiden HPR-20 DLS gas analysis system is configured for continuous analysis of gases and vapours at pressures near atmosphere in standard form, alternative inlet systems being offered for applications requiring direct sampling from higher pressures to 30 bar.
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Embedded Analysis Software for the 2000 X-Series
D2000GENB
Test and debug I²C, SPI, RS232/422/485/UART designs with triggering, decoding, and pass / fail mask limit testing.
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DCME Analysis System
DCME Analysis System (SCL-DAS) is a software based application, which is designed to classify, process and decompressed the compressed signals transmitted over the satellite links.DCME Analysis System supports most of the commercially available DCMEs including PCM, ADPCM, DX-3000, DX-7000, DTX-600, DTX-360, DTX-240 (D,E,F,T), CELTIC-3G, OKI TC-2000 etc. While processing the compressed/normal E1 carrier, the SCL-DAS provides the processed intelligible output in the form of Voice and Fax along with Originating Point Country, Destination Point Country, Outgoing Number, Incoming Number etc.
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Data Analysis Software
APP ClearView
APP ClearView™ is the ideal data analysis software for engineeres and managers that need system information and answers quickly. It has a wide varity of graphics, math functions, reports, and file manipultion features that allow the user to easily navigate through their data. It supportsimporting of indisustry standrad formats such as COMTRADE (Common Data Transient Data Exchange) version 1996, 1997, and 1999.
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Finite Element Analysis (FEA) Solution
Femap
Siemens Digital Industries Software
Femap is an advanced engineering simulation software program that creates finite element analysis models of complex engineering products and systems, and displays solution results. Femap can virtually model components, assemblies or systems and determine the behavioral response for a given operating environment.
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DFT Testability Analysis Software
Landrex Technologies Co., Ltd.
DFT Testability Analysis Software
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Wi-Fi Site Surveys, Analysis, Troubleshooting App
Netspot
NetSpot is the only professional app for wireless site surveys, Wi-Fi analysis, and troubleshooting on Mac OS X. It''s a FREE Wi-Fi analyzer. No need to be a network expert to improve your home or office Wi-Fi today! All you need is your MacBook running Mac OS X 10.6+ and NetSpot which works over any 802.11 network.
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Data Collection And Analysis Software
The MESUR™ software series expands the functionality of Mark-10 force and torque gauges, indicators, testers, and test stands. MESUR™ Lite is a basic data acquisition program included free with all Mark-10 products, while MESUR™gauge is a more advanced software package which also plots, calculates statistics, generates reports, and provides other analysis tools. MESUR™gauge Plus adds motion control of certain test stand models.
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Quantitative Analysis Software
Electron Probe X-Ray Analyzer (EPXA)
The software runs on standard PC’s and operating systems (Windows XP and later). Complete ZAF analysis is possible, with or without standards, using an internal database of fundamental parameters (FP) such as absorption coefficients, fluorescence yields, transition probabilities, etc. There is also an integrated spectrum display.
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Carbon/Nitrogen Analysis by Combustion
928 Series
By incorporating state-of-the-art hardware and an on-board touch-screen software platform, the 928 Series allows you to easily handle the most demanding sample applications. The core capabilities and performance of previous generations of LECO macro combustion instruments have been maintained, while key improvements have been made in throughput, uptime, and reliability. Macro sample mass ability (up to 3 grams for Nitrogen/Protein model regardless of sample carbon content) with rapid cycle times and a resulting low cost-per-analysis make the 928 Series ideal for analysis of characteristically heterogeneous, difficult to prepare, or low analyte level samples.
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AXIe Logic Analysis & Protocol Test
Keysight's AXIe Modular Logic Analysis and Protocol test modules and powerful analysis software provide essential capabilities for engineers working on fast digital designs and chipsets using high speed parallel and serial buses, such as DDR and PCI Express Gen 3.
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Characterization Of VCSEL Arrays Including Polarization Analysis
Konica Minolta Sensing Americas, Inc
Laser diodes are becoming indispensable in a multitude of everyday and industrial applications, thereby expediting new applications and technologies. These include: facial and gesture recognition in consumer electronics, LiDAR (light detection and ranging) in the car and material processing with high-performance diode lasers.
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Material Identification Spectroscopy
ChipCHECK
Gastops specializes in advanced fluid sensing and analysis systems specifically designed and developed for critical equipment condition monitoring applications. ChipCHECK offers the fastest way of making on-site equipment maintenance decisions. It is a field deployable analyzer designed for rapid on-site identification of equipment lube oil. This automated maintenance decision-support tool employs innovative laser spectroscopic technology, which enables on-site analysis of microscopic chip debris. ChipCHECK provides the maintainers with quick, reliable, and conclusive information, including the total number of particles, and the size, shape, and specific alloy classification for each individual particle on the sample.
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Shock Response Spectrum Analysis
A Shock Response Spectrum (SRS) is a graphical presentation of a transient acceleration pulse’s potential to damage a structure. It plots the peak acceleration responses of a bank of single degree-of-freedom (SDOF) spring, mass damper systems all experiencing the same base-excitation as if on a rigid massless base. Each SDOF system has a different natural frequency; they all have the same viscous damping factor.
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Fluid Analysis Information Management System
SpectroTrack
SpectroTrack is an Information Management System (IMS) optimized for laboratories that specialize in the analysis of in-service (used) lubricants for machine condition monitoring. The browser-based system is the ideal tool for accessing historical and trend information about an organization’s high-value assets. The software provides a single end-to-end view of a sample lifecycle from sample submission and receipt to results entry. The software also provides all trending, imaging, numerical and textual asset data in one secure location. Clients can see a comprehensive, historical view of fluid condition for an engine, department or an entire fleet.
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrades ensure the investment for many years. Together with bsw AG you will get an optimum solution for your application. Our experts provide not only support for the instrument itself but have also working knowledge of all the solutions surrounding it. This includes Cabeling and Adapters, Fixturing for packaged Parts and of course Wafer Probing. We help customers from replacements of broken or worn-out parts to planning and deployment of turn-key-systems.
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Inductively Coupled Plasma Spectroscopy (ICP-OES/MS), ICP Analysis Services
ICP-OES measures the light emitted at element-specific characteristic wavelengths from thermally excited analyte ions . This light emitted is separated and measured in a spectrometer, yielding an intensity measurement that can be converted to an elemental concentration by comparison with calibration standards. ICP-MS (ICP-Mass Spec) measures the masses of the element ions generated by the high temperature argon plasma. The ions created in the plasma are separated by their mass to charge ratios, enabling the identifcation and quantitation of unknown materials. ICP-MS offers extremely high sensitivity (i.e. low detection limits) for a wide range of elements
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Failure Analysis
MicroINSPECT 300FA
The MicroINSPECT 300FA is an automated wafer inspection tool used for semiconductor wafer failure analysis. Its small footprint, high speed, and low cost relative to its rich features yield a superb cost of ownership and makes this an ideal tool for your fab or failure analysis lab. The MicroINSPECT 300FA combines advanced robotics, wafer sorting, an intelligent wafer inspection microscope together with SiteVIEW Software to produce an integrated failure analysis tool.
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Infrared, Near Infrared and Raman Spectroscopy
rom the very compact FTIR spectrometer to the world’s highest resolution: Bruker offers the industry's largest selection for demanding routine and High End FTIR research application including the new and unique verTera cw THz functionality.Process monitoring with FTIR / FT-NIR process spectrometers.A complete line of Near Infrared Spectrometers to fit all your needs, including Process Monitoring.FTIR Microscopy and Raman Microscopy and Spectral Imaging for high sensitivity at high spatial resolution.High spectral resolution, high performance Raman and FT-Raman spectrometers for advanced routine solutions.FTIR Gas Analyzers for the fully automated and high precision real-time monitoring of gas compoundsImaging Remote Sensing systems for analysis of gases, liquids and solids.CryoSAS semiconductor material quality control for photovoltaic and electronics industry.OPUS, the "all-in-one" IR and Raman spectroscopy software consists of a suite of software packages that cover both standard and specialized applications.ONET, software for the setup, administration and control of large FT-NIR spectrometer networks.
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Root Cause Failure Analysis
Maintenance Reliability Group, LLC
Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.Root Cause Analysis of Grease Lubricated Components: Root cause analysis includes a complete root-cause failure report and recommendations for further monitoring and corrective actions. MRG will test for grease consistency, oxidation, product contamination and wear metals utilizing Grease Thief® Analyzer die extrusion test, FTIR, RULER and RDE Spectroscopy. Testing includes Analytical Ferrography and Rheometer testing. Testing can include the submission of a failed component for extraction of grease from failed component and visual inspection for Root Cause Analysis.
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Data Acquisition and Analysis Software
Magnifi®
Eddyfi® Magnifi® is a constantly evolving, integrated electromagnetic inspection data acquisition and analysis software. It boasts an intuitive graphical user interface (GUI) suited to modern devices, powerful reporting functions and data management, as well as simple inspection configurations.
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Picosecond-Diode Lasers for Spectroscopy
Designed and manufactured by Becker & Hickl – bh delivers prominent picosecond diode lasers with wavelengths from the NUV to the NIR. All bh pulsed diode lasers work with simple +12V power supply or pull their power from the USB port of a PC or Notebook Computer. Other features are high repetition rate, short pulse width, unprecedented timing and power stability, and extremely low electrical noise level.
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Green House Gas Analysis
Gas chromatographs help analyze green house gases in air and soil. In addition to nitrous oxide, which is known by its high global warming potential, CO and CH4 are measured by a single analysis.
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Cloud-Based RF Signal Analysis Software
Cloud4Testing
Our next-generation software as a service (SaaS) platform is an ideal choice for your test and measurement needs. With the R&S®Cloud4Testing, you can enjoy a quick and easy access to Rohde & Schwarz testing essentials without having to make a big investment. Simply measure, analyze and process your individual RF data, on demand and on the go.
