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Product
Current Injection Sets
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Built in c based Time Interval Meter measuring from1 millisec to 9999 sec. Panel with easy and clear legends to read. Continuosly variable outputs. Auto Cut-off & output isolated. Self sensing of contacts i.e. NO or NC Potential free star stop signals Available in Portable / Lab type models with metal cover
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
Rogowski AC Current Probe,30 MHz, 300 A
N7042A
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The Keysight N7042A Rogowski coil current probe measures AC currents up to 300 A, with bandwidth ranging from 9.2 Hz to 30 MHz. The probe has a thin, lightweight, flexible, and simple-to-use clip-around Rogowski coil that enables current measurement in the most difficult-to-reach parts and confined spaces of a circuit under test. It can also measure large AC current without an increase in transducer size.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
High-Voltage Differential Probe, 100 MHz
N2790A
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Use the N2790A 100-MHz high-voltage differential probe to make safe and accurate floating measurements with an oscilloscope. The N2790A probe allows conventional earth-grounded Keysight oscilloscopes to be used for floating signal measurements of up to 1,400 V of differential voltage and 1,000 V of common mode voltage.
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
NI-9203, 200 kS/s, ±20 mA, 8-Channel C Series Current Input Module
779516-02
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200 kS/s, ±20 mA, 8-Channel C Series Current Input Module - The NI‑9203 is intended for high-performance control and monitoring applications. It features programmable input ranges and variable connectivity options. To protect against signal transients, the NI‑9203 includes a channel‑to‑earth ground double‑isolation barrier (250 Vrms isolation) for safety and noise immunity.
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
HPC High Current Probes, 100 – 187 mil (2.54 – 4.75 mm)
HPC
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100 – 187 mil (2.54 – 4.75 mm)
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Product
Secondary Injection Relay Test Set
TD 1000 PLUS
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TD1000+ is a protective relay test set especially designed to give the commissioning engineers a multitasking and highly reliable testing equipment. In comparison with T 1000 PLUS model, TD 1000 PLUS has two current outputs to test the differential relay characteristic curve, besides the pick-up current.
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Product
Primary Injection Test System
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HAOMAI Electric Test Equipment Co., Ltd.
Primary injection testing is suitable for testing over-current trip relays attached to a circuit breaker.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Injection Transformer
J2100A
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The injection transformer is presently the prevalent method for connecting the network analyzer to the circuit being tested, and is primarily used for control loop stability measurements. The goal of the transformer is to inject a signal into the control loop being measured, without impacting the performance of the loop. In order to accomplish this to a reasonable degree, The transformer is isolated and therefore is capable of floating on a high voltage, such as a Power Factor Corrector (PFC), which is often close to 400VDC. Measuring voltages that exceed the voltage rating of the FRA inputs require attenuation probes.
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
High Current Probes
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*Low internal resistance to minimize arching*PogoPlus bias ball design*High current optimized base material and plating*Higher temperature spring design*Specialized high current tip geometry
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Current Transformers
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The Institute of Electrical and Electronic Engineers defines a current transformer (IEEE Std C57.13) as “a transformer intended to reproduce in its secondary circuit, in a definite and known proportion, the current of its primary circuit with the phase relations substantially preserved”. Its primary winding is connected in series with the conductor carrying the current to be measured or to be controlled and its secondary winding is connected to the measuring, protection or control devices. Osborne designs and manufactures current transformers which are used for instrumentation applications, others which are used for power system synchronizing applications and others which are used in protection circuit application. They have been designed to meet specified current ratios, burden impedance and transformation errors.
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Product
CP400X, 400 MHz, ±60 V, 10X Attenuation, Single-Ended Passive Oscilloscope Probe
784254-01
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The CP400X is a coaxial passive probe with fixed 10X attenuation for oscilloscopes that provide 1 MΩ input impedance. It is 2 meters in length. The CP400X attaches to BNC connections on both the signal input and instrument sides.
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Product
Current Transformer Analyzer
CT Analyzer
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Current transformer testing in a multifunctional instrument performing excitation, ratio, polarity and winding resistance tests on current transformers as well as burden impedance measurement.
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VLSI Test System
3380D
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
NI-9207, 500 S/s, 16-Channel C Series Voltage and Current Input Module
781068-01
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500 S/s, 16-Channel C Series Voltage and Current Input Module - The NI‑9207 is a combination voltage and current input module designed with industrial systems in mind. It features eight current and eight voltage input channels, with built-in noise rejection.
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Product
NI-9246, 50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module
783920-01
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50 kS/s/ch, 20 Arms, 30 Apk, 24-Bit, 3-Channel C Series Current Input Module - The NI‑9246 is designed to support direct ring lug connectivity to the three-phase high-current measurements of 1 A and 5 A current transformers (CTs). It is optimized for power, energy, and industrial applications. The safety features, certifications, input ranges, overvoltage ranges, and connectivity are well suited for applications such as power quality monitoring and metering, utility pole-mounted smart switches, utility pole-mounted smart grid reclosers, substation merging units, industrial machine measurements, health monitoring, predictive maintenance and prognostics, and phasor measurement units (PMUs).
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Product
Primary Injection Test Set
T1000
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T1000 primary injection test set is the model featured with light weight and 2 minutes continuous output time at 1000Aac.
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Product
Primary Current Injection Tester
SLQ
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Chongqing Gold Mechanical & Electrical Equipment Co.,Ltd
It's a high voltage generator insutrment for tesitng.





























