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Product
In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
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Product
Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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Product
16-CH 12/16-Bit 100 kS/s Low-Cost Multi-Function DAQ Cards
PCI-9111 Series
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ADLINK PCI-9111 series are 16-CH, 100 kS/s low cost multi-function DAQ card. The PCI-9111 series feature flexible configurations on analog inputs. A RC filter is implemented on each A/D input channel for user to attenuate or filter input signal. The PCI-9111 series provide analog inputs with 5 programmable input ranges for bipolar inputs. The PCI-9111 series also support automatic analog input scanning. PCI-9111DG provides 12-bit A/D resolution while PCI-9111HR provides 16-bit A/D resolution. The PCI-9111 series also feature 1-CH 12-bit analog output, 16-CH TTL digital inputs and 16-CH TTL digital outputs. ADLINK PCI-9111 series deliver cost-effective and reliable data acquisition capabilities, and is ideal for a broad variety of applications.
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Product
Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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Product
ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Product
Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
4-CH 24-Bit Universal Input USB DAQ Modules (OEM Version Available)
USB-2401
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The USB-2401 is a 24-bit, 4-channel simultaneous-sampling universal input USB DAQ modules featuring built-in signal conditioning circuitry, providing direct measurement of commonly used sensors including current output transducers, thermocouple, RTD, load cell, strain gauge, and others. Individual channels can be programmed to measure different signal types. The USB-powered USB-2401 is equipped with removable screw-down terminals for easy device connectivity, and the included multi-functional stand fully supports desktop, rail, or wall mounting.
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Product
PXI Data Acquisition
DAQ
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Installation and configuration is fast and easy with standard connectors, soft front panels and Keysight connection expert. In addition, software drivers support the most common programming environments such as Visual Studio®, C, C++, Visual Basic, MATLAB® and LabVIEW™.
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Product
16-Channel 250kSa/s USB Modular Multifunction Data Acquisition
U2351A
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The U2351A offers multifunction capabilities in a module. It can be used like a digital multimeter in polling mode. It can be transformed to be a simple scope using the continuous mode with simple triggering capabilities. No matter if it is used as a standalone module or when plugged into a U2781A USB modular instrument chassis, the synchronization and triggering capabilities allow great flexibility in making the desired measurements. With the analog output being able to send out predefined or arbitrary waveforms make this a good tool when closed loop feedback or stimulus is required. The digital IO channels allows for closed loop control through connections to switches, relays and solenoids. The burst mode enables the U2351A to simulate simultaneous analog input acquisition.
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Product
19” Rackmount Data Collection System
DCS-211
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- Intel Atom® x5-E3930 processor- Up to 8x DI and 6x DO with two 2A relays- 3x M12 GbE, 1x RJ-45 GbE, 2x isolated RS232/422/485, 2x USB and one lockable HDMI port- Up to 3x PCI Express mini slots with one USIM card slot each- Storage: up to 64GB eMMC 5.0, 1x 2.5” SATA drive bay
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Digital I/O Module
ND-6050
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- Interface: RS-485- 7 TTL digital inputs- 8 open collector DO- Output up to 30V, 30mA max. load- Programmable input polarity
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Product
Decoder Compliance Tests
Sarnoff Bitstreams™
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Using SRI’s Emmy® award-winning technology, the Sarnoff® Bitstreams™ suite is the de facto standard for systematically and unambiguously testing decoders against industry standards. The Bitstreams visual and automated decoder tests work in a matter of seconds and do not require a reference signal or specialized decoder.
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Product
Passive Component Storage Module Series
TrayPXIe
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The TrayPXIe is an accessory tray that stores your fragile passive fiber optic components such as splitters, connector adaptor patchcords, WDM couplers, and isolators in one handy module in the PXI chassis.
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Product
VLSI Test System
3380D
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
Intelligent 16 Bit Data Acquisition
CPCI-AD16
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The CPCI-AD16 module provides a 3U high performance data acquisition subsystem. The Local DSP can be used to simply move data samples to the CPCI bus or can provide processing functions such as limit checking, FFT’s, digitalfiltering, etc. Application software can be downloaded to the DSP via the CPCI interface. Instrumentation amplifiers provide over-voltage protection, gain and filtering on a per channel basis. Internal scan and trigger clocks are derived from either the CPCI bus clock or the local DSP clock. Dual 32 bit timers can programmed to pace the acquisition process. The CPCI-AD16 can also accept external scan and trigger signals from a front panel connector.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
