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Product
PXI Vehicle Multiprotocol Interface Module
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PXI Vehicle Multiprotocol Interface Modules use hardware-selectable NI-XNET Transceiver Cables (TRC) to communicate High-Speed/Flexible Data‑rate CAN, Low-Speed/Fault Tolerant CAN, and/or LIN. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN and/or LIN frames and signals. The NI-XNET device-driven DMA engine enables the onboard processor to move frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time. PXI Vehicle Multiprotocol Interface Modules work well in applications such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, and automation control.
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Product
Multi-Channel 1553 Interface for Single Lane PCI Express Systems
PCIE1L-1553
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Alta Data Technologies’ PCIE1L-1553 interface module is a multi-channel (1-2), ½ size, Low Profile, One Lane PCI Express 1553 card with the latest software technologies. The PCI Express card is based on the industry’s most advanced 32-bit 1553 FPGA protocol engine, AltaCore™, and by a feature-rich application programming interface, AltaAPI™, which is a multi-layer ANSI C and Windows .NET (MSVS 2005/08/10 C++, C#, VB .NET) architecture. This package provides increased system performance and reduces integration time.
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Product
Positioning Test System
TS-LBS
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The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
USB-485/4, 4-Port, USB, RS485/RS422 Serial Interface Device
778476-14
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The USB‑485/4 interface transforms your USB port into a single asynchronous serial port for communication with RS485 and RS422 devices. You can use a USB‑485/4 port as a standard serial port from your application, including RTS/CTS hardware handshake lines. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
USB Axis Module
E1735A
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The E1735A USB Axis Module is the electronic interface for the 5519A/B laser head used in the Keysight 5530 Laser Calibration System. It also provides the interface for the 10888A remote control unit (optional) and the A-quad-B encoder input (optional).
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Test Fixture Kits
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More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
2-CH PCI ExpressR IEEE 1394b Frame Grabber
PCIe-FIW62
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The PCIe-FIW62 is an IEEE 1394b (FireWire 800) interface card which provides two high-speed FireWire 800 ports with data transfer rates up to 800 Mb/s on a PCI ExpressR x1 lane. The PCIe-FIW62 provides two direct-connect IEEE 1394b bilingual connectors with a screw-lock mechanism. These screw-lock connectors provide a reliable connection between the PCIe-FIW62 and up to two IEEE 1394b cameras. A 4-pin ATX power connector on the PCIe-FIW62 supports IEEE 1394b cameras that draw power directly from the frame grabber. Each port has a green LED on the front panel that will illuminate when the PCIe-FIW62 is connected to a IEEE 1394b camera for convenient identification of channel connection status.
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Product
NI-9866, 1-Port C Series LIN Interface Module
781963-01
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1-Port C Series LIN Interface Module—The NI‑9866 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The NI‑9866 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals such as hardware‑in‑the‑loop (HIL) simulation, rapid control prototyping, bus monitoring, automation control, and more. You can perform this manipulation while taking other DAQ measurements in the same CompactDAQ hardware platform or while performing low-level FPGA control and embedded monitoring in the same CompactRIO Chassis.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
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Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Mini USB (90º) To 90 Series Interface (R)
J90USBS
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Use in Receiver SideTripaddle modules VPC 510104136 required
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Product
Test Port Cable, 1 Mm
11500J
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The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
Enhanced Serial Interface Module for Excalibur 8000 Family of Carrier Boards, with High Baud Rate & High Throughput
M8KSerial
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The M8KSerial is an enhanced serial interface module for the multiprotocol Excalibur 8000 family of carrier boards, that includes several advanced features such as a high baud rate and high throughput. This module supports up to two independent channels of serial communications, each of which can be selected as RS-485, RS-422 or RS-232. The module operates independently of the host computer, reducing the need for host intervention.The M8KSerial module is based on the Exar XR16M570 Universal Asynchronous Receiver/Transmitter (UART). The device is compatible to industry standard 16550 UARTs. Each of the M4KSerialPlus’s four channels contains a transmit FIFO capable of holding up to 16384 bytes and a receive FIFO capable of holding either 16384 receive bytes or 5460 bytes with a 32-bit Time Tag associated with each byte. These large buffers allow application code to transfer large quantities of data with a single non-blocking subroutine call. The 32-bit Time Tag on receive channels is very useful for synchronizing serial data with data from other modules on the 8000 board or on other interface boards. Each channel has a programmable baud rate of up to 10 Mbps and can be configured as RS-232, RS-422 or RS-485.The M8KSerial module is supplied with C drivers, including source code.
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Product
Parallel Electrode SMD Test Fixture
16192A
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The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
VR/AR/MR Calibration Platform
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AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Eagle Test Systems
ETS-200T
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
PCIe-8431, PCI Express, 2-Port, RS485/RS422 Serial Interface Device
782124-01
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The PCIe‑8431/2 is a high-performance interface for high-speed communication with RS485 and RS422 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. You can also select between … 4‑ and 2‑wire transceiver modes for full‑ and half‑duplex communication. NI serial interfaces also appear as standard COM ports for compatibility with programs that use serial communications.
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Product
In-Line RF Test Platform
AR925
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This functional and RF test platform combines outstanding productivity with substantial equipment savings. The Faraday chamber of the fixture comes with an interchangeable cassette to minimize the testing cost of each new product
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Product
Intelligent ARINC Interface Module
M4K717
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The M4K717 is an intelligent ARINC 717 interface module for the multiprotocol Excalibur 4000 family of carrier boards.The module supports two ARINC 717 receive channels and two transmit channels.In transmit mode, the module sends the four subframes from a pre-defined buffer in dual-port RAM.In receive mode, the module stores all subframes with status and Time Tag information appended to each subframe.The M4K717 comes complete with C-driver software library including the source code.
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Product
Disk Drive Test System
Saturn
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The Saturn HD is the industry leader in 3.5” Near-Line Hard Disk Drive (HDD) testing. It provides maximum throughput while minimizing factory floor space and power consumption. The system is designed to perform single insertion of SSW, BDSW and Burn-In as well as drive configuration. Using Saturn HD on the production floor will reduce drive build times, enable greater responsiveness to data center demands and lower test costs per HDD unit.
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Product
Batterie Inspektor
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By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Product
PXIe-6593, FlexRIO High-speed Serial Module (16 Gbps), KU040
785976-01
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PXIe, 16 Gbps, 8-Channel PXI High-Speed Serial Instrument - The PXIe‑6593 is designed for engineers who need to validate, interface through, and test serial protocols. It includes a Xilinx Kintex Ultrascale FPGA to implement various high-speed serial protocols, and it is … programmable in LabVIEW FPGA for maximum application-specific customization and reuse. The PXIe‑6593 takes advantage of FPGA multigigabit transceivers for up to eight TX and RX lanes.
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Product
2m BNC Test Cable
16048D
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The 16048D test leads extend the measurement port with a 4-terminal pair configuration. It provides a BNC female connector board to allow attachment of user-fabricated test fixtures.
