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Product
Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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Product
In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Product
Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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Product
High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Product
Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Product
LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Product
Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Product
Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Product
NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Product
Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Product
PXI Electronic Load Module
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PXI Electronic Load Module provides the electronic load capabilities of sinking DC power with high-accuracy measurements in a compact form factor optimized for design validation, characterization, and production test.
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Product
Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
Load Cells
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Selection of load cells must always be guided by the end users particular system requirements and by the application. The PIAB Load Cells range from typical compression/tension load cells to S-beam and shear beam types for stationary applications as well as for mobile weighing systems.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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Product
High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
DC Electronic Load Module, 1U Height, 60 V, 20 A, 100W
N6791A
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The Keysight N6791A is a 100W, 1U electronic load module for the N6700 series modular mainframe.
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Product
Load Cells
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The heart of each weighing system is a load cell. Load cells are mechanical components which act as force sensors by employing strain gages to provide an electrical output proportional to the applied force. Typically the electrical output is either analog (voltage or current) or digital. Load cells have specific mechanical packaging and sensing orientation to fit into electronic scales, and testing and monitoring systems. Load cells can be used for tension, compression, and/or shear measurement.
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Product
VLSI Test System
3380D
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
SoC Test System
T2000
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SoC devices require small-lot high-mix manufacturing methods in the present era of rapid generation change. Semiconductor makers struggle with requirements to replace their testers on a 2-3 year cycle. The T2000 addresses their needs by enabling rapid response to market needs with minimum capital investment.
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Product
Beam Load Cell
EST-70
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Technopark Automation & Control
The EST-70 Shear Beam Load Cell is commonly used on platform, hopper weighing and pallet weighing applications. It is low cost and available in capacities from 500 kg to 2000 kg.
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Product
Automated Compliance and Device Characterization Tests
N5990A
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The Keysight N5990A test automation software platform is the most powerful tool for serial and multi-lane gigabit testing. It is the unique universal platform for testing a wide range of digital buses such as PCI Express, USB, HDMI or MIPI. The same graphical user interface and operating principles are used for all applications. This boosts productivity, especially when testing devices which support multiple digital buses. The N5990A can be tailored to your individual test needs with the flexible test sequenzer and controls all instruments needed for your tests. The configurable database interface of the N5990A test automation platform enables the convenient storage of all test results. A web interface allows an effective and easy operation. Custom calibration and test procedures can be implemented easily with User Programming.
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Product
Load Cell Transmitter
MODEL SST-HV
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The SST-HV is a Plug & Play Smart TEDS IEEE 1451.4 compliant Transmitter. Just plug in a TEDS compatible Load Cell or Torque Sensor and the SST-HV will automatically self-calibrate. When used with a non-TEDS Load Cell or Torque Sensor, the SST-LV Transmitter is easily programmed using a PC with an RS232 port and Instrument Setup (IS) software, which provides a graphical user interface. The SST-HV may be powered from 95-240 Vac ±10%. The SST-HV has an Isolated transducer excitation output that is selectable between 5Vdc or 10Vdc. There are Dual solid state relays and an Isolated 4-20 mA, 0-20 mA or 0-10V analog output. There are three Isolated serial data transmitter output ( RS232 , Half-duplex RS485, full-duplex RS485 ) and three serial protocols that are software selectable (Modbus RTU, Modbus ASCII and Custom ASCII). Isolation to 250V rms is provided for power, signal input, analog output, relay outputs, and communications. Isolation adds safety and avoids possible ground loops. The transducer excitation output is isolated to 50V from signal ground.
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Product
Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
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The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Load Cell Tester
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Xiamen Elane Electronics Company, Ltd
Large six-digit LED display < Easy to use and small in size < Accuracy of 0.005%FS/10ppm < 2 channels CH0 : -12mV/V~+12mV/V, with resolution 0.1uV/V CH1 : -1.6mV/V~+4.8mV/V, with resolution 0.01uV/V < Four user selectable output units (N, kgf, lbf and mv/V) < Peak Hold function to capture and holding the peak value for the immediate or later reference < Clear key to clear the peak value < Presence of tare key and foot switch to zero the display (tare function) < Great for monitoring and testing load cell characteristics (repeatability, linearity, creeping, temperature drift, etc
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Product
Canister Load Cell
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Futek Advanced Sensor Technology, Inc.
FUTEK provides a wide range of Canister Load Cells designed for high capacity compression applications. These models offer robust construction with a capacity range beginning
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Product
Photonics Wafer Probing Test System
58635
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The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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Product
Tabletop Single Site Test Handler
3111
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The Chroma 3111 is an automated pick & place handling system ideal for small lot engineering samples and/or NPI test development parts.
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Product
250 Watt Electronic Load Module
N3307A
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The Keysight N3307A is a 250 W (0-30A, 0-150V) electronic load module for use in either the N3300A or N3301A electronic load mainframe in system applications. The N3307A load module is fast and accurate, for programming in constant current, constant voltage, or constant resistance modes, or for making voltage, current or power measurements. The N3307A can also digitize waveforms.
