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Product
Image Sensor Testing
IP750Ex-HD Family
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The IP750EX-HD has been the test platform that has enabled the industry to manufacture high quality CCD and CMOS image sensors, and it is the most economical platform to meet the needs of newer technologies such as Time of Flight (ToF) sensors. When you use a smartphone, high performance digital still camera, or in-home security and surveillance system, these applications have image sensors most likely tested by Teradyne’s IP750ExHD.
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Product
Laser Diode Burn-in Reliability Test System
58604
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The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Product
8-Ports Gigabit Ethernet ITA Interface
YAV90058A
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8 RJ45 LAN connectors to VPC ITA 192 pins module
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Product
PCI Mezzanine Card
PNIC1G
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Each Ethernet interface supports 10, 100 and 1000 Mbits transmission rates with auto-negotiation for full duplex operation; 10 and 100 Mbit/s transmissions for half duplex operation, and is equipped with a 32 Kbit Serial EEPROM.
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Product
HV Test System up to 20000 Volt
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Insulated test booth with large space for test items. 2 banana sockets for AC connection and 4 banana sockets for the DC connection of the DUTs. IC’s are tested in a long-term test. These are checked in an oil bath so that there are no air gaps to reduce the insulation. Maximum voltage 20 kV. Therefore, insulation tests must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
PXIe-8245, 4-Port, 10/100/1000BASE-T PXI Ethernet Interface Module
787313-01
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The PXIe-8245 supports Ethernet-based communication between PXI hardware and external instruments and devices. This PXI Ethernet Interface Module includes four RJ45 10/100/1000BASE-T Ethernet interface ports in a single-slot PXI Express module.
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Product
Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
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General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Product
VXI Digital Multiplier
4152A
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The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Product
EBIRST 200-pin LFH To 160-pin DIN Adapter
93-002-410
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Test System for Detecting Exact PCB Short Circuit Locations
QT25
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Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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Product
Positioning Test System
TS-LBS
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The R&S®TS-LBS is a comprehensive test solution for network and satellite based location technology testing of wireless devices and chipsets.It is highly configurable for testing various location technologies and uses Rohde & Schwarz location based test systems.The R&S®TS-LBS test system family fulfills the requirements of LBS conformance testing and operator acceptance testing on GSM, WCDMA, LTE and 5G devices and chipsets as well as regulatory testing consisting of adjacent channels and spurious emissions for EN 303 413 receiver testing. It also fulfills the requirements of E112 (EU) 2019/320 testing consisting of GNSS testing such as Galileo and AML mobile testing.
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Product
Wafer-Level Parametric Test
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Wafer-level reliability engineers need to reduce test time without sacrificing measurement quality and accuracy.
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Product
High Throughput 1 ns Pulsed IV Memory Test Solution
NX5730A
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Precise and fast characterization of new memory, such as spin transfer torque magneto resistive random access memory (STT-MRAM) from DC to high-speed pulsed IV measurement on silicon wafers Apply accurate and high-speed pulsed voltages (down to 1 ns pulse) to magnetic tunnel junction (MTJ) for STT-MRAM and precisely measure the resistance of MTJ Perform all typical MTJ characterization tests in one solution10 to 100 times faster cycle test, such as a bit error rate test (BERT)Capture and visualize MTJ switching waveforms clearly during the writing pulse Dedicated solution with Keysight Technologies’ technical expertise
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Product
Scienlab Charging Discovery System (CDS) – High-Power Series
SL1047A
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The Scienlab Charging Discovery System – High-Power Series from Keysight enables you to test charging interfaces of electric vehicles (EVs) and EV supply equipment (EVSE) during high-power charging up to 1,500 V DC and ±600 A DC. With the CDS can perform all necessary conformance and interoperability tests according to worldwide charging standards. Our new solution, which features the separate Scienlab Cooling Unit with interchangeable liquid-cooled charging adapters, also enables a high-power upgrade of the SL1040A Scienlab Charging Discovery System - Portable Series.
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Product
Physical Layer Test System
N19301B
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The N19301B Physical Layer Test System (PLTS) 2022 software is a powerful signal integrity tool for today’s high-speed digital designers.
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Product
SAS Protocol Test System
M124A
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The SAS Sierra M124A Protocol Test System is Teledyne LeCroy's 7th generation protocol analyzer system that provides 100% accurate protocol capture of both SAS (SAS 3.0) and SATA (SATA 3.0). The industry's most widely used test platform for SAS and SATA features unmatched analysis and debug capabilities to help pinpoint problems at every layer of the protocol.
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Product
Test Fixture Kits
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More then ten years of experience in special, customized engineering and manufacturing brought us to the highest level of creating reliable, flexible and robust Test Fixtures. Currently our HQ is located in Vecsés, Hungary together with our R&D. Equip Group has Test Fixture Kit manufacturing plant in Serbia, focusing on supplying competitive, high – quality and high – volume products for the global market.With more then 180 employees, Equip – Test is able to offer our customers turnkey solutions in fixturing with test program generation. No matter if you have a simple or complex, high-density PCB (Printed Circuit Boards), or if you have DUT (Device Under Test) already assembled into metal or plastic housing, we can offer you a very stable technical solution.
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Product
Functional Test System Optimized For Real-Time Digital Bus Test
Spectrum HS
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Spectrum HS is Teradyne’s fully integrated functional test system. Optimized for real-time test of low latency buses, it’s a high-performance system delivering excellent test coverage of current and future products.
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Product
IoT Ethernet I/O Modules
ADAM-6000/6200
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Supporting Modbus & IoT protocols, Ethernet remote data acquisition modules offer analog, RTD, thermocouple, digital, relay and counter I/O.
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Product
4-Module ICT System, I307x Series 6
E9903G
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Test efficiency, test system stability, and seamless equipment integration. Keysight’s i3070 Series 6 family provides those improvements built upon a proven technology foundation. With time-tested software, hardware, and programmability, the Series 6 are fully backward compatible with previous systems, and they make highly repeatable measurements.
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Product
5GE Unmanaged Ethernet Switch
EKI-2725
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Provides 5 Gigabit Ethernet ports with Auto MDI/MDI-X, Supports 10/100/1000Mbps Auto Negotiation, Supports jumbo frame transmission up to 9kbytes, Provides Slim size, DIN-rail with IP30 metal mechanism.
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Product
4GE PoE+1G+1G SFP, Unmanaged Ethernet Switch
EKI-2706G-1GFPI
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Supports 10/100/1000 Mbps Auto Negotiation (EKI-2706G) Supports jumbo frame transmission up to 9 kbytes, DIN-rail with IP30 metal mechanism, Redundant 24~48 VDC power input(BE Version) 4 x IEEE 802.3 af/at PoE ports + 1 x Gigabit Copper + 1 Gigabit SFP ports.
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Product
At-Speed Non-Intrusive Functional Testing
ScanExpress JET
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Functional circuit board testing presents many challenges that are often costly and time consuming. Most functional tests need to be customized for each design, limiting reusability. This results in software engineers vying for time between development code and test code. Even when functional tests become available, the diagnostic details are often inadequate to give clear visibility on a given problem.ScanExpress JET is a tool designed to overcome these challenges by automating the functional test generation process on CPU–based IEEE-1149.1 compliant circuit boards. Coined JTAG Embedded Test, JET is the preferred method for at-speed, non-intrusive functional testing.
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Product
Test Port Cable, 1 Mm
11500J
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The Keysight 11500J test port connector has a length of 16 cm and a frequency range of DC to 110 GHz. The 11500J integrates with the Keysight N5250A network analyzer and Keysight 8510XF network analyzer systems.
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Product
Parallel Electrode SMD Test Fixture
16192A
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The 16192A test fixture is designed for impedance evaluations of side electrode SMD components. The minimum SMD size that this fixture is adapted to evaluate is 1(L)[mm].
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Product
VR/AR/MR Calibration Platform
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AR, VR and MR device calibration is critical for product performance. Leverage Averna’s standardized alignment platform to efficiently calibrate cameras and Inertial Measurement Unit (IMU) modules with supreme accuracy. Easily customize or upgrade the base platform into the automated quality solution to best fit your manufacturing requirements.
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Product
Eagle Test Systems
ETS-200T
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The ETS-364 is a general-purpose precision analog and mixed-signal test platform designed for high volume production testing of integrated circuits; optimized for high throughput applications with a fully integrated multisite software and hardware architecture.
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Product
8FE Managed Ethernet Switch Support Modbus/TCP,-40~75℃
EKI-5528I-MB
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8 ports Fast Ethernet RJ-45 (EKI-5528/I-MB)Entry-Level Managed SwitchIXM function enables fast deploymentManagement: SNMP v1/v2c/v3, WEB, Standard MIB, Private MIB
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Product
10 Gbit Ethernet Card, PXIe Form Factor
ADQ10GBE
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The ADQ10GBE module enables fast network connection from a cPCIe/PXIe chassis to an external host computer. It occupies a single slot in an 3U cPCIe/PXIe chassis and can be used with backplanes supporting up to x8 Gen2 PCIe. All necessary software drivers are included and can be installed on the PXIe controller. ADQ10GBE can be used under Windows 7 (32 or 64 bit), Windows 8 and 8.1, and Linux (native support or ixgbe source code).
