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Product
Radar Test System
UTP 5065
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Radar sensors are core elements to realize autonomous driving. The UTP 5065 radar test system from NOFFZ Technologies has a compact vertical design and contains everything needed to allow State-of-the-Art measurement and sensor calibration. The test bench setup and component selection are tuned to get best possible results for highly accurate and cost-efficient testing in production of automotive radar sensors.
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Product
Automotive Ethernet Interface Device
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The Automotive Ethernet Interface Device converts unshielded twisted pair (UTP) Automotive Ethernet to standard Ethernet. This device is ideal for developing applications that require Automotive Ethernet to test and validate automotive electronic control units (ECUs). It includes ports for Automotive Ethernet connections and ports for 100BASE-TX Ethernet connections. You can use switches on the front panel to configure each 100BASE-T1 port as master or slave. The device also provides LED on the front panel so that you can monitor the linkage and activity on the various ports.
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Product
Functional Test for Engineering Lab
Spectrum BT
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Designed to meet the needs of product engineering labs, production lines, test development centers, and repair depots, the Spectrum BT is a configurable and scalable functional test system. This focused system solves typical functional test coverage challenges throughout the defense/aerospace product life cycle—and it’s upgradable as test requirements evolve.
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Product
Modular Functional Test Platform
LX-OTP2
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The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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Product
Inducitive Switch Transient Test Circuit
NSG 5071
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The basic philosophy of this test circuit is better reproducibility of actual switching transients. The reproducibility of this test circuit comes not from the output characteristics as in traditional conducted automotive immunity tests, but from a fixed design of the generator using several pre-defined components. Many of these components are defined in the standard as "critical" with no substitutions allowed. These components are used as required in the standard.
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Product
Automated Test Equipment
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These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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Product
Radio Frequency, Communications, & Navigation Test Systems
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Reduce testing time and costs with the Astronics radio test sets for use in military, avionics, and civil security industries.Available in commercial and military grades, these integrated test systems make it easy to develop test program sets and leverage them securely and instantly across all deployed testers at the factory, depot, and operational levels.
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Product
Flash Memory Test System
T5830
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T5830 memory tester, the latest member of its T5800 product family, optimized for testing a wide range of flash memory devices used in mobile electronic devices. The highly flexible T5830 tester has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories.
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Product
GSM/EDGE Analysis Using NI PXI RF Test Instruments
NI-RFmx GSM/EDGE
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The NI-RFmx GSM/EDGE personality is a highly optimized API for performing physical layer measurements on GSM/EDGE cellular standard signals. NI-RFmx GSM/EDGE is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development effort.
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Product
Lens Module Test Platform
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The Lens Module Test Platform is a flexible solution to deliver the quality that is expected from your brand for all types of lenses and cameras. The system can be configured to measure objective, eyepiece or camera lenses. As the platform can efficiently measure lenses as small as 2 mm3, it is perfect for the critically precise applications of life sciences, consumer electronics, automotive and other industries. With 25+ years of quality experience, the Lens Module Test Platform ensures that all products shipped to market work as intended.
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Product
LTE/LTE-Advanced Analysis Using NI PXI RF Test Instruments
NI-RFmx LTE/LTE-Advanced
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Highly optimized RF measurement experiencePerform physical layer analysis on LTE cellular signals including MODACC, ACPR, CHP, OBW, and SEMIncludes support for TDD, FDD, and LTE-Advanced signals specified in 3GPP standards release 12Simple access to advanced measurement parallelism
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Product
Electric Vehicle
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Chroma Systems Solutions, Inc.
EV Automotive and Battery Test Advancements
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Product
NI Real-Time Test Cell Reference System
780590-35
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VeriStand Full Development License with NI Standard Service , Include 1 Year SSP
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Product
Automotive Radar Echo Generator
AREG800A
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The R&S®AREG800A Automotive Radar Echo Generator is an innovative and versatile solution for testing automotive radar sensors. Thanks to the flexible and scalable concept of the R&S®AREG800A and the full harmonization with the R&S®QAT100 Advanced Antenna Array, the solution fulfills the test requirements of the most advanced radar echo generation applications. The R&S®AREG800A
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Product
NTS Platform
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Manufacturers all over the world are leveraging our NTS platform for products with rotating or otherwise moving parts, or produce sounds. Typical applications include mass production of air conditioning units, pumps or small electric motors, where errors in assembly can cause malfunctions or significantly shorten service life. This test platform is customized to your specification and application. Feasibility studies are available to ensure your solution is exactly what you are looking for.
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Product
Test Automation
TetraMAX®
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The Synopsys TestMAX™ family of products offers innovative, next-level test and diagnosis capabilities for all digital, memory and analog portions of a semiconductor device. The Synopsys TestMAX family contains unique capabilities for automotive test and functional safety as well as technologies that unlock new levels of test bandwidth and efficiency by leveraging high-speed interfaces common on many designs.
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Product
In-Circuit Tester
Sparrow MTS 30
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The Sparrow MTS 30 is a 19“ test system that can be integrated into any standard rack. The In-Circuit tester can also be used as benchtop test system. With this compact and flexible tester you can perform both analog and digital In-Circuit and functional tests.
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Product
PXIe Optical Test Modules
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Coherent Solutions’ expanding portfolio of PXIe optical test modules bring a wide range of new mixed-signal test capabilities to the PXI platform. The new modules offer seamless integration with PXI Platform and deliver reliable and repeatable results across a wide range of optical and mixed-signal test applications.
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Product
PXI High Voltage Amplifiers
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Pickering's PXI High Voltage Amplifiers are ideal for increasing the output voltage from other PXI modules, enabling users to easily generate the signal voltages commonly required in applications such as automotive test. Each amplifier can be independently programmed to a gain of 1, 2, 5, 10 or 20, enabling it to be used with modules with low output voltage capability. Inputs and outputs can be provided either on SMB connectors or on a D Type connector to suit the user’s wiring system.
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Product
6TL22 Off-Line Testing Platform
H71002200
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Learn about our Build to print service for Test Platforms. The 6TL22 Platform is a perfect base for the conception of a real modular Automatic Test Equipment for low to mid manufacturing volumes.A system designed around the 6TL22 is simple, easy to maintain and cost effective. The rack is prepared for the direct integration of the three platform based receivers from Virginia Panel, the S6, G12 and G12X.
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Product
Functional Test Trainer System
QT65
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Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Product
PCI-4462, 204.8 kS/s, 118 dB, 3.4 Hz AC/DC Coupled, 4-Input Sound and Vibration Device
779309-01
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The PCI‑4462 is a high-accuracy data acquisition module specifically designed for sound and vibration applications. It provides simultaneous four-channel dynamic signal acquisition with six programmable gain settings for making high-accuracy, frequency-domain measurements. The PCI‑4462 also includes software-configurable AC/DC coupling and integrated electronic piezoelectric (IEPE) conditioning to ensure precision measurements with microphones, accelerometers, and other transducers that have very large dynamic ranges. Common applications for dynamic signal acquisition devices include audio test; automotive test; noise, vibration, and harshness (NVH) analysis; and machine condition monitoring.
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Product
TD-SCDMA Analysis Using NI PXI RF Test Instruments
NI-RFmx TD-SCDMA
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The NI-RFmx TD-SCDMA personality is a highly optimized API for performing physical layer measurements on TD-SCDMA cellular standard signals. NI-RFmx TD-SCDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
MATCO BASIC MULTIMETER
MD251
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*Provides readings for volts, amps and ohms required for automotive electrical system tests, as well as diode and continuity tests*Beep-Jack audible warning beeps against improper a-terminal plug in and decreases the risk of damage
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Product
Automotive Radar Echo Generator
AREG100A
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The R&S®AREG100A Automotive Radar Echo Generator is a smart and robust solution for testing automotive radar sensors in production. With the R&S®AREG100A, production engineers profit from a perfect balance of flexibility of test cases and at the same time simple and robust operation.
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Product
Test Port Adapter Set, 3.5 Mm (Test Port) To Type-N
85130C
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The Keysight 85130C test port adapter is designed to protect the test set port when it would be directly connected to the device under test. These adapters have a special rugged female connector designed for connecting to the network analyzer test port. This special connector will not mate with a standard male connector, but converts the rugged test set port to a connection that can be mated with the device under test. The set contains a 3.5 mm to type-N male adapter and a 3.5 mm to type-N female adapter. The frequency range for these adapters is dc to 18 GHz with a return loss of 28 dB or better.
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Product
Single Site Test Handler
3210
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Chroma Single Site Test Handler 3210 supports various package types such as BGA series, QFP series, QFN, TSOP, and more. The handler is primarily designed for early device design and engineering validation.
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Product
Multiple Module Serial Bus Test Instrument
Bi4-Series
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The wide variety of serial buses used in defense and aerospace applications typically requires multiple single-purpose instruments. Too often, they are difficult to reconfigure in order to test a different application.The Bi4-Series provides all the capabilities needed for complete communications bus access test for up to four serial buses used in board level (SRA/SRU) and box level (WRA/LRU) equipment—all in a single VXI module.The instrument includes test applications, industry-compliant software drivers and hardware enabling straightforward integration into automatic test systems.With the configuration flexibility needed to effectively test every bus format used in defense and aerospace applications, the Bi4-Series instrument plays a key role in reducing implementation time and test system cost.
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Product
Advanced SoC/Analog Test System
3650
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Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Test Platforms
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Leverage 20+ Years of Test Industry Experience with Built-In IP for Maximum Reuse
