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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
2D Antenna Pattern Measurements
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The world's top antenna manufacturers utilize MET Labs for 2D Antenna Pattern Measurements to compare an antenna's real-world performance versus its theoretical performance
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Product
Alternate 2.64 (75.00) - 6.50 (184.00) General Purpose Probe
EPA-2J40-1
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Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 160Full Travel (mm): 4.06Recommended Travel (mil): 107Recommended Travel (mm): 2.72Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 970Overall Length (mm): 24.64
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Product
100MS/s Four-Channel Arbitrary Waveform Generator
WW1074
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The WW1074 offer a 100 MS/s four-channel universal waveform synthesizer. Each is built in a small case size to save space and cost but without compromising bandwidth and signal integrity. The instrument outputs either standard or user-defined waveforms in the range of 100µHz and up to 50MHz.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
HD Arbitrary Waveform Generator,4 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing
T3AWG3354
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HD Arbitrary Waveform Generator,4 Ch,350 MHz,16 bit,128Mpts/Ch,6 Vpp output,AFG/AWG, Wave Sequencing.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
PXIe-5672, 2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator
779900-01
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2.7 GHz, 20 MHz Bandwidth Digital Upconverter Included, PXI Vector Signal Generator —The PXIe‑5672 features quadrature digital upconversion, which reduces waveform download and signal generation time. It is a general-purpose vector signal generator that can generate standard modulation formats such as AM, FM, PM, ASK, FSK, MSK, GMSK, PSK, QPSK, PAM, and QAM. The PXIe‑5672 delivers a highly flexible and powerful solution for scientific research, consumer electronics, communications, aerospace/defense, and semiconductor test applications as well as emerging areas including software defined radio, radio frequency identification (RFID), and wireless sensor networks. For specific communications standards, you can use various software add-ons to generate modulated signals according to standards such as WCDMA, DVB‑H, and ZigBee.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
16-channel, 1GHz, 1Mb/ch USB Logic Analyzer Plus 8-Channel Pattern Generator
LA-Gold-16
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A maximum sampling rate of 1 GHz is available on all channels. The LA-Gold-16 has a large data buffer of 1 Mega samples per channel for sampling rates of up to 500 MHz on all 16 channels. The large buffer allows long capture times at high sampling rates. The digital logger function is for capturing very slow varying signals, e.g. room temperature.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3A-1
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
High Definition Arbitrary Waveform Generator
T3AWG Series
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T3AWG3K Series consists of six high definition high performance Arbitrary Waveform Generators (HD AWG) consisting of 2, 4 and 8 channels, 16 bit vertical resolution, 12 Vpp max output voltage (50Ω into 50Ω), 128 Mpts/ch memory (optional 1 Gpts/ch), a maximum sampling rate of 1.2 GS/s and a max sinewave frequency of 250 MHz and 350 MHz respectively. The baseline HW voltage offset capability provide the unmatched ability to generate ±24 V or 48V output voltage window (50Ω into High Impedance).
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Product
VXG Vector Signal Generator
M9484C
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The M9484C VXG is the industry’s first dual-channel vector signal generator capable of generating signals up to 54 GHz with 2.5 GHz of modulation bandwidth per channel. The VXG vector signal generator helps you deliver the next frontier of wireless technology such as 5G and satellite communications with a fully integrated, calibrated, and synchronized solution.
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Product
1.25GS/s 16Bit 1GS Mem 8CH 8 Markers AWG
P1288D
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The Proteus P1288D, is a 1.25GS/s, eight channel arbitrary waveform generator packaged in a 4U, half 19” dedicated chassis, offering technologically advanced options and configurations that integrate the ability to transmit, receive and perform digital signal processing all in a single instrument. The P1288D offers industry leading performance Including an innovative task oriented programming, real time data streaming, fast feedback loop for environment dependent waveform generation and user customizable FPGA for application specific solutions.
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Product
NTSC Test Signal Generators
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Provides an economical means for generating the most common SD analog composite video reference timing signals required to operate various SD analog composite video switchers, effects generators, VTRs/VCRs, cameras, video edit controllers, and other professional video equipment.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Standard 0.70 (2.00) - 1.70 (4.80) General Purpose Probe
P2662AG-1Q1S
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Current Rating (Amps): 3Average DC Resistance lower than (mOhm): 30Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 710Overall Length (mm): 18.03
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
Standard 1.55 (44.00) - 3.20 (91.00) General Purpose Probe
HPA-50D
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Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 50Full Travel (mm): 1.27Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 590Overall Length (mm): 14.99
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Product
3GHz Single Channel Signal Generator 19" 1U Rack Module
LS3081R
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The LS3081R, 3GHz Single Channel RF Analog Signal Generator, offers industry leading performance, in a 1U, 19” rack-mounted box. The LS3081R features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The LS3081R was designed to offer excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Product
Alternate 2.52 (71.00) - 6.50 (184.00) General Purpose Probe
EPA-3J-1
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Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Product
Waveform Generators
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Waveform Generators produce large, complex analog waveforms in a sequential manner or using real-time streaming. These instruments are ideal for applications in scientific research and testing of consumer electronics, automotive, and aerospace/defense.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
ACCUplace Dot Patterns
AP-D Series
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All machine vision lenses will show some type of distortion. Minimizing or correcting that distortion is crucial in most applications. The ACCUplace Dot Patterns target is designed to check, verify, or quantify barrel distortion in vision systems, alignment between multiple optical systems, and can calibrate instruments with both vision and motion systems. The indexed columns and rows of dot features provide reference points that make alignment and distortion detection simple and straightforward. The AP-D is offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Product
PCI-5412, 100 MS/s, 14-Bit Waveform Generator Device
779177-03
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The PCI‑5412 can generate user-defined, arbitrary waveforms and standard functions, including sine, square, triangle, and ramp. This arbitrary waveform generator can generate signals from -6 V to +6 V and uses direct digital synthesis (DDS) to precisely generate waveforms.
