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Product
Ethernet/LXI digitizerNETBOX 16 Bit Multi-purpose Digitizer - 20 MS/s on 4 Channels, 4 Single-Ended Inputs
DN2.592-04
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The digitizerNETBOX DN2.59x series allows recording of one, two, four, eight or 16 synchronous channels with sampling rates of 20 MS/s up to 125 MS/s. These products offer outstanding A/D features both in resolution and speed as a remote instrument. The powerful A/D amplifier section offers 6 different input ranges, programmable offset and a software switching from single-ended (full number of input channels) to true differential (half number of input channels).
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
Handheld Digital Multimeter Transit Case, Aluminum-clad
U1172A
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Use this aluminum-clad case to transport your handheld digital multimeters (DMMs).
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Product
Synchro to Digital-Resolver to Digital Converters
HSDC-HRDC
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Computer Conversions Corporation
HSDC & HRDC Series are Miniature, Tracking Synchro and Resolver to Digital Converters with programmable resolution, 8/16 Bit data bus controls, continuous Built-In Self-Test report, and forced angle test modes used for functional validations on command for military and industrial applications.
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Product
C68-C68-D4 Unshielded Cable, 2X68-Position VHDCI Offset, 1 m
195949-01
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68-Pin, Male VHDCI to 68-Pin, Male VHDCI, 50 Ω, Unshielded Digital Cable - The C68-C68-D4 Digital Cable connects NI 6535/6/7, 654x, 655x, and 657x digital instruments with other NI accessories like the CB-2162 Connector Block or SMB-2163 Terminal Block. You can also use it with certain Digital I/O Adapter Modules for FlexRIO, Digitizer Adapter Modules for FlexRIO, Signal Generator Adapter Modules for FlexRIO, and high-speed serial instruments. It is flexible and easily fits around custom test fixtures and other equipment. It is an unshielded, 50 Ω cable.
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Product
PCIe-5763, 16-Bit, 500 MS/s, 4-Channel PCI FlexRIO Digitizer Device
786166-01
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The PCIe-5763 is a PCI FlexRIO Digitizer Device that simultaneously samples four channels at 500 MS/s with 16 bits of resolution and features 225 MHz of analog input bandwidth. With over 73 dB of SNR, the PCIe-5763 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PCIe-5763 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
FPGA PXIe High-Performance Digital I/O Card
GX3700e
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The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded directly into the FPGA or via an on-board EEPROM.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
PXI Digital Multimeter, 6 digit, Enhanced Performance
M9183A
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The Keysight M9183A is a 6 digit PXI digital multimeter that measures common parameters such as DCV, DCI, ACV, ACI, 2- and 4-wire resistance, frequency, capacitance, and temperature. It offers40 ppm basic DCV measurement accuracy, excellent noise rejection, and handles inputs of up to 300 V.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
PCIe 16 Bit Multi-purpose Digitizer - up to 5 MS/s on 2 Channels
M2P.5911-X4
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The M2p.59xx series allows recording of up to eight single-ended channels or up to four differential channels both with sampling rates of up to 125 MS/s. These PCI Express cards offer outstanding A/D features both in resolution and speed. The cards can be switched between single-ended inputs with a programmable offset and true differential inputs. If used in differential mode each two inputs are connected together reducing the number of available channels by half. The 16 bit vertical resolution have four times the accuracy compared to 14 bit cards and sixteen times the accuracy if compared with a 12 bit card. All boards of the M2p.59xx series may use the whole installed on-board memory of up to 512 MSamples completely for the currently activated number of channels
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
Ethernet/LXI digitizerNETBOX 8 Bit High Speed Digitizer - 5 GS/s on 6 Channels, 2.5 GS/s on 12 Channels, 1.25 GS/s on 24 Channels
DN6.225-24
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The digitizerNETBOX DN6.22x series allows recording of up to 24 channels with sampling rates of up to 5 GS/s and a bandwidth of 1.5 GHz. These Ethernet Remote instruments offer outstanding A/D features both in bandwidth and signal quality. The combination of high sampling rate and resolution makes these digitizers the top-of-the-range for applications that require high speed signal acquisition. The digitizerNETBOX can be installed anywhere in the company LAN and can be remotley controlled from a host PC.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
PCIe 16 Bit High Speed Digitizer - 180 MS/s on 4 Channels
M4i.4471-x8
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The 6 models of the M4i.44xx-x8 Express series are designed for the fast and high quality data acquisition. Each of the input channels has its own A/D converter and its own programmable input amplifier. This allows the recording of signals simultaneously on all channels with 14 bit or 16 bit resolution without any phase delay between them.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
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Product
Fixture Self-Test Controller and Calibration Check
AQ818
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The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
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Product
IOL & Power Cycling Test Systems
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Our IOL & power cycling systems increase measurement quality and throughput and reduce testing costs on an open platform. The focus is on seamless monitoring and precise determination of all parameters of each DUT. In addition, the systems are equipped for the special requirements of wide-bandgap technology.
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Product
NI Automated Test Software Suite
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The NI Automated Test Software Suite features all three NI IDEs and NI's most popular application software and add-ons specifically for building your automated test system with confidence. This package offers the power of LabVIEW, LabWindows/CVI, and Measurement Studio combined with the TestStand ready-to-run, test executive and the Switch Executive intelligent switch management application
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Product
Digital I/O
IP-DIGITAL482
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IP-DIGITAL482 is a single-wide IndustryPack configured to maximize the number of digital I/O lines. The 48 lines are accessible as individual bits or as bytes. These lines may also be used for 8-bit and 16-bit I/O with handshake lines. IP-DIGITAL482 is a drop-in replacement for the IP-DIGITAL-48.
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Product
AXIe High-Speed Digitizer/DAQ, 8-bit, 1 GS/s, 32-ch
M9709A
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Based on the AXIe standard the M9709A is an 8-bit digitizer, able to capture signals from DC up to 500 MHz at 1 GS/s with excellent measurement accuracy across 32 synchronous channels within a single card. The digitizer also enables long acquisitions with its very large on-board memory of up to 16 GB.
