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Product
PCB Adapter, Receiver, QuadraPaddle ,192 Position, NI PXI-2532
510150141
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This solution works with NI Terminal Blocks: TB-2640, TB-2641, TB-2643 and TB-2644. Part does not include ribbon cables. Please see parts 510150142 and 510150143 for complete solutions with ribbon cables.
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
510140141-1
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, 160 Pin Female DIN
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Adapter, 2.4 mm (f) to APC-7, DC to 18 GHz
11902B
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The Keysight 11902B is a metrology grade, 2.4 mm female to APC-7 adapter with dc to 18 GHz operation.
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Product
Photonics Module Test System
58625
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Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Electronic Control Unit Functional Test
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End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, To NI PXI-2529
510150148
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This PCB Adapter was designed specifically for the NI PXI-2529, which uses 160 signals at 2 amps. This PCB Adapter will accommodate one or two NI TB-2634 terminal blocks. If 192 signals or 3 amps are needed for a different application; use # 510 150 155 which has 6 32-pin ribbon cable connectors capable of up to 3 amps each.
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Product
Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Interconnect Adapter, C-Size, Double Slot, 4 Module Positions
510109118
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Interconnect Adapters funnel wiring from modules to a VXI card. The adapter has removable side, top and bottom plates. Connector cover plates and cable clamps are ordered separately.
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Product
Antenna Test System
ATS1000
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Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Pull-Thru Adapter, Wired, QuadraPaddle, For NI PXI-6509
510140138-1
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Pull-Thru Adapter, Wired, QuadraPaddle, for NI PXI-6509
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
PCB Adapter, Receiver, QuadraPaddle, 192 Position, to PCB-Mounted 2 x 68-Pin FML VHDCI
510150126-1
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Single PCB adapter p/n 510150126 ships with 2 x 68-pin VHDCI male double-ended 2m cables, packaged separately. Available PXI card solutions for NI PXI-2535 and PXIe-7868.
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Product
AC Power Adapter For Handheld Component Testers
U1780A
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The Keysight U1780A consists of an AC Power Adapter and power cord (according to country). The adapter is to be used with the U1700 Series Handheld Capacitor and LCR meters. This optional adapter enables users to power up their U1700 Series handhelds without using the meter´s supplied battery.
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Product
HV Test System for Patient Monitors
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HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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Product
Application Software for Electronic Test & Instrumentation
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Application software provides configuration-based workflows for electronic test and instrumentation applications. Application software is part of the NI software portfolio.
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Product
PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
510140194
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PXI Pull-Thru Adapter, Wired, QuadraPaddle, to 78 Pin Female D-Sub
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Product
Pull-Thru Adapter, Wired, QuadraPaddle, to 68 Pin SCSI Female
510140251
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Pull-Thru Adapter, Wired, QuadraPaddle, to 68 Pin SCSI Female
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Product
Dynamic Test Systems
H3TRB | HTGB (HTGS) | RTGB (RTGS)
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Durability and reliability of wide-bandgap materials such as SiC and GaN are an important topic. The focus here is on new failure mechanisms whose effects are not visible with traditional H(3)TRB/HTGS – but which nevertheless have an influence on the real application.
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Product
6TL10 Table Top Test Base
H71001000
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The 6TL-08 base platform was designed to cover the most common testing and in-system programming (ISP) needs with a reduced initial budget. The system includes a robust manual linear push mechanism allowing a low-cost fixture strategy thanks to the exchangeable cassettes.The platform enclosure features an 8-Slot fixture receiver, compatible with VPC 90 Series Mass Interconnect Module, as well as 6TL intelligent YAVModules (YAV90MMU &YAV90059), with room for fast ISP devices, optional PXI chassis and various power supplies. A removable back panel allows easy placement of custom connectors or test auxiliary circuitry.
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Product
VITA 62, 3U Test Fixture
TF-3U-7B041-1
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This Power Supply test fixture is being proposed as a tool for checking Injector / Ejector operation, proper alignment of the VITA 62 connector and proper alignment of both keys on a Single slot, 3U, VITA 62/SOSA power supply.
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Product
Wired Adapter for PXI, for National Instruments PXI-4110
510109469
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Wired adapter or pull-thru from a 64 position TriPaddle receiver module to one 6 position Mini-Combicon plug and one 2 position Mini-Combicon plug.
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Product
NI-6581B, 100 MHz, 54 Single-Ended-Channel, Kintex-7 FPGA-Support, Digital I/O Adapter Module for FlexRIO
783887-01
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100 MHz, 54 Single-Ended-Channel, Kintex-7 FPGA-Support, Digital I/O Adapter Module for FlexRIO—The NI-6581B is a digital I/O adapter module that, when combined with a PXI FPGA Module for FlexRIO or the Controller for FlexRIO, creates a digital instrument for interfacing with 54 single-ended digital pins. A digital I/O adapter module for FlexRIO can be used to do real-time interfacing of standard protocols and implement customized protocols. The NI-6581B can operate sample digital waveforms at up to 100 MHz. It includes support for common transistor-to-transistor logic (TTL) voltage levels, or other voltage references can be sourced externally using a front panel connector.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Extendable Version
SL1720A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development.
