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Product
Semiconductor Test System
TS-960e
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The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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Product
NI-5752B, 50 MS/s, 12-Bit, 32-Channel, Kintex-7 FPGA Support, Digitizer Adapter Module for FlexRIO
784062-01
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The NI‑5752B is a digitizer adapter module that, when combined with a PXI FPGA Module for FlexRIO, creates a high-speed digitizer that simultaneously samples 32 channels at 50 MS/s. You can use the NI‑5752 to do real-time processing and streaming of analog data with high-performance A/D converters. The Digitizer Adapter Module for FlexRIO is ideal for applications that require in-line data processing, high data streaming rates, and deployed high-performance solutions. The NI‑5752B is compatible only with PXI FPGA Modules for FlexRIO that have Kintex‑7 FPGAs.
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Product
Functional Test Fixtures
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Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
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Product
PXI Digitizer 16-Bit, 20MSa/s
M9217A
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The M9217A PXIe Digitizer is a single slot with 2 isolated input channels that supports up to ±256V and a sample rate of 20MSa/s and 16-bit resolution.
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Product
Active Alignment Assembly & Test Platform
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Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
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Product
Ethernet/LXI digitizerNETBOX 16-Bit Multi-purpose Digitizer - 5 MS/s on 24 Channels
DN6.591-24
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The digitizerNETBOX DN6.59x series allows recording of up to 48 synchronous channels with sampling rates of 20 MS/s up to 125 MS/s. These products offer outstanding A/D features both in resolution and speed as a remote instrument. The powerful A/D amplifier section offers 6 different input ranges, programmable offset and a software switching from single-ended (full number of input channels) to true differential (half number of input channels).
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Product
NI HIL and Real-Time Test Software Suite
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Suites combine LabVIEW Professional Development System with NI's most popular application softwareIncludes LabVIEW Professional, VeriStand, and the LabVIEW Real-Time and LabVIEW FPGA modulesEach new suite includes a one-year NI Training and Certification membershipSoftware is shipped on USB 3.0 media with NI device drivers included to speed up your installationConfigure real-time test applications quickly and easily; add custom functionality
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Product
Scienlab Battery Test System — Cell Level
SL1002A
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Test System with up to 36 Channels.The Keysight SL1002A provides sink and source with 0 to 6 V, 100 to 600 A, 0.6 to 3.6 kW and 36 channels for battery cells.
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Product
Non-Signaling RF Test Platform for Validation & Production
Universal Wireless Tester
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Wireless communication standards are increasingly integrated into vehicles as well as smart home and Internet-of-Things applications. They form the basis for connected services, advanced HMIs, and autonomous driving. The combination of constantly evolving standards and the integration of multiple wireless technologies with many RF channels into new product designs means that measurement speed and quality are becoming a priority.
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Product
PXI Integration Platform
ATS-3100
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The new ATS-3100 enables you to rise above the module level and shift your focus to the sophisticated test solution you’re actually building. Simply add your instruments, software, and customization to create a complete solution. Or, if you're short on time or resources, ask Astronics Test Systems to do the finishing work for you.
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Product
PXI FlexRay Digitizer
PXD7113
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The PXD7113 FlexRay Digitizer features a 100MS/s input with 16Bit resolution, input voltages up to ±10V and a bandwidth up to 10MHz. The PXD7113 FleyRay Digitizer has a 2MB memory which allows up to1 million samples. The device has a high common mode rejection ratio (CMRR).
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Product
Fully-Automated CTIA-Compliant OTA Test System
TS8991
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The R&S®TS8991 OTA performance test system measures the spatial radiation and sensitivity characteristic as specified by CTIA and 3GPP.The system software provides ready-to-use test templates for OTA measurements and supports all wireless standards.The integrated report function collects all measured test data such as graphics or numeric results, test environments, EUT information and hardware setup in one document.
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Product
VLSI Test Systems
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50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Product
Photonics Module Test System
58625
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Chroma 58625 provides characterization testing for 3D sensing illumination devices. various test modules are combined for validation testing under precise temperature control.
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Product
PXIe 8 Bit High Speed Digitizer - 1.25 GS/s on 1 Channel, 500 MHz Bandwidth
M4X.2210-X4
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The 9 models of the M4x.22xx-x4 Express series are designed for the high speed data acquisition. Each of the input channels has its own A/D converter and its own programmable input amplifier. This allows the recording of signals simultaneously on all channels without any phase delay between them. The extremely large on-board memory allows long time recording even with the highest sampling rates.
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Product
Electronics Functional Test
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Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
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Product
Electronic Control Unit Functional Test
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End-of-line tests are critical to ensure passenger safety in the era of smarter vehicles. A flexible test solution is needed to ensure extensive test coverage and high test throughput with a low total cost of ownership.
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Product
Ethernet/LXI digitizerNETBOX 14 Bit High Speed Digitizer - 400 MS/s on 12 Channels, 12 Single-Ended Inputs
DN6.448-12
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The digitizerNETBOX DN6.44x series allows recording of up to 24 synchronous channels with sampling rates of 130 MS/s up to 500 MS/s. These products offer outstanding A/D features in resolution, bandwidth and speed as a remote instrument. The powerful A/D amplifier section offers six different input ranges, two input paths, AC/DC coupling and noise reduction filters.
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Product
PCIe 14 Bit High Speed Digitizer - 400 MS/s on 2 Channels
M4I.4480-X8
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The 6 models of the M4i.44xx-x8 Express series are designed for the fast and high quality data acquisition. Each of the input channels has its own A/D converter and its own programmable input amplifier. This allows the recording of signals simultaneously on all channels with 14 bit or 16 bit resolution without any phase delay between them. The card uses only one A/D converter even when running with 500 MS/s, guaranteeing best signal quality without any interleaving technology. The extremely large on-board memory allows long time recording even with the highest sampling rates.
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Product
Digital Test Instruments
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Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Product
Ethernet/LXI digitizerNETBOX 14 Bit High Speed Digitizer - 500 MS/s on 4 Channels, 4 Single-Ended Inputs
DN2.445-04
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The digitizerNETBOX DN2.44x series allows recording of one, two, four or eight synchronous channels with sampling rates of 130 MS/s up to 500 MS/s. These products offer outstanding A/D features in resolution, bandwidth and speed as a remote instrument. The powerful A/D amplifier section offers six different input ranges, two input paths, AC/DC coupling and noise reduction filters.
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Product
PXIe 16 Bit High Speed Digitizer - 180 MS/s on 4 Channels
M4X.4471-X4
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The M4x.44xx-x4 series digitizers deliver the highest performance in both speed and resolution. The series includes PCIe cards with either two or four synchronous channels where each channel has its own dedicated ADC. The ADC’s can sample at rates from 130 MS/s up to 500 MS/s and are available with either 14 bit or 16 bit resolution. The combination of high sampling rate and resolution makes these digitizers the top-of-the-range for applications that require high quality signal acquisition.
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Product
Antenna Test System
ATS1000
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Offering measurements on active and passive devices - supporting also extreme temperature testing. 5G is all about data, speed and reliability using high frequency millimeter wave bands. The lack of conventional external RF connectors makes 5G antenna characterization challenging. 5G antenna, chipset and UE manufacturers as well as wireless market operators need a viable solution for research, diagnostics and debugging up to type approval.
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Product
Flex Socket Test Module
JT 2127/Flex Socket Test Module
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The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Product
Ethernet/LXI digitizerNETBOX 16 Bit Multi-purpose Digitizer - 125 MS/s on 16 Channels, 80 MS/s on 32 Channels, 32 Single-Ended Inputs, 16 True Differential Inputs
DN6.596-32
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The digitizerNETBOX DN6.59x series allows recording of up to 48 synchronous channels with sampling rates of 20 MS/s up to 125 MS/s. These products offer outstanding A/D features both in resolution and speed as a remote instrument. The powerful A/D amplifier section offers 6 different input ranges, programmable offset and a software switching from single-ended (full number of input channels) to true differential (half number of input channels).
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Product
Ethernet/LXI hybridNETBOX 14 Bit Digitizer and 16 Bit AWG - 500 MS/s Digitizer on 2 Channels, 1.25 GS/s AWG on 2 Channels
DN2.825-02
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The hybridNETBOX DN2.82x series internally consists of a Digitizer and an AWG that can run together or independently. That allows simultaneous data generation and data acquisition for stimulus-response tests, ATE applications, MIMO applications or closed-loop applications. Used independently, the digitizer can acquire test data in the field and the AWG can replay this test data in lab. The hybridNETBOX offers 14/16 bit resolution and is available with digitizer sampling rates of up to 500 MS/s and AWG sampling rates of up to 1.25 GS/s. The hybridNETBOX can be installed anywhere in the company LAN and can be remotely controlled from a host PC.
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Product
In-Line Test System
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With an Averna in-line test system, clients boost production/yields, catch defects invisible to the human eye, reduce equipment downtime, and ensure repeatable results.
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Product
Prototyping & Test Consulting Services Solutions
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Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
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Product
PCIe 2.0 Test Platform
PXP-100B
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The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Product
Ethernet/LXI digitizerNETBOX 16 Bit Multi-purpose Digitizer - 20 MS/s on 48 Channels
DN6.592-48
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The digitizerNETBOX DN6.59x series allows recording of up to 48 synchronous channels with sampling rates of 20 MS/s up to 125 MS/s. These products offer outstanding A/D features both in resolution and speed as a remote instrument. The powerful A/D amplifier section offers 6 different input ranges, programmable offset and a software switching from single-ended (full number of input channels) to true differential (half number of input channels).
