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Compact Functional Test System
E2230C / TS-5040
The Keysight TS-5040 functional test system is a robust, and reliable test system that ensures an economical ownership experience. When coupled with Keysight software such as KS8400A PathWave Test Automation with KS8328A PathWave Test Executive for Manufacturing (PTEM) or TestExec SL with TS-5000 libraries, it provides a streamlined development process and accelerated deployment. The TS-5040 seamlessly integrates into heavily automated production areas. It is a minimalistic one-box solution for automotive and industrial applications that saves valuable rack and floor space.
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Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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RF Conducted Immunity Test System
RFCI61000-4-6
RFCI61000-4-6 RF Conducted Immunity Test System is an automatic test system which is for the conduction sensitivity testing, it is fully meets IEC61000-4-6.2006, ISO11452-4, GB/T17626.6-2008 and GTB152B-CS114 etc standards. RFCI61000-4-6 internal source and broadband power amplifier can be generated 3 voltage test levels: 1v, 3v and 10v, and has the function of the real detect output level. It has two operation software which is calibration software and test software. When measuring, the signal is in 1 KHZ sine wave amplitude modulation system (80%) to simulate the actual harassment, and can through the coupling/decoupling network (CDN or electromagnetic clamp) to make the harassment signal coupled to the device.
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Optics Test Systems
Front Window Scanner For Wedge Angle Measurement
Optik Elektronik Gerätetechnik GmbH
Scanning of complete automotive windshields to measure the wedge angle and thickness change, especially in the HUD area.
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All-In-One Battery Testing System
Integrating charge-discharge and temperature testing into one.
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Drive Controller Function Test – Universal Functional Test System for Industrial Electronics
General functional test system based on LXI instrumentation for high mix / low to medium volume manufacturing. DUTs are tested which are mainly used as communication and measurement modules in power plant technology, grid management and electrical drives.
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Cellular Base Station Factory Test Systems
*Factory Test System*Designed and Built by BCO*100% Functional Testing*Environmental Stress Screening Testing
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Goniophotometer Test System For Led Lamp
LCG-1680B
Shenzhen Chuangxin Instruments Co., Ltd.
Design according to IEC61341the test method of central luminous intensity and beam angle for reflecting light, this instrument can be used to test the cross section luminous intensity distribution curve, central luminous intensity and effective beam angle of LED assembled luminaries and LED lens system with diameter less than 180mm.
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Flying Probe PCB Test and Repair System
GRS500
Designed to help troubleshoot complex boards when fixture based tools are not a viable solution, the GRS500 is designed to help you compare the characteristics of good and faulty PCBs, using nodal impedance test, and a "Videosection" technique which presents you with high resolution images of a good board for use in live video comparison with the board under test,
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Portable Test System
MT781
Actual value, vector, curve displayCurrent and voltage generationerror measurementMeasurement of harmonics up to the 40th
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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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3-in-1 Test System
CIBANO 500
CIBANO 500 combines a micro-ohmmeter, timing analyzer, and a coil and motor supply. All important CB tests on all types of CBs can be carried out even when a station battery is not available.
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Massively Parallel Board Test System
I7090
The Keysight i7090 is a massively parallel board test system designed to help PCBA test engineers improve manufacturing efficiency while reducing costs. Unlike traditional in-circuit testers, the i7090 supports up to 20 In-Circuit Test cores in parallel, which means engineers can test multiple Units Under Test (UUTs) simultaneously without the need for multiple systems. This reduces scaling and infrastructure costs and frees up valuable testing space.
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
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Smart Sensing Systems
The Astronics Smart Aircraft System enables the gathering of information through sensor and IoT technology to help airlines gain the valuable insight needed to increase passenger satisfaction, improve operational efficiency, and lower costs.
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Various Types of Automatic Hardness Testing System
Various Types of Automatic Hardness Testing System
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Microtester Test Systems
With the micro probes and the fine-pitch adapters used on them, you are able to contact the finest test structures. E-tests, functional tests, IC tests or high-current tests are made to be affordable, efficient and with a short cycle time. With the integration of HF adapters we also enable the double-sided testing of HF substrates up to high frequency ranges.
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High Voltage Battery Test System
The increasing use of electric drive systems both in the automotive industry and in transportation requires the development of new high-performance energy storage systems. In order to support you in the development and production of these systems, S.E.A. develops individually configurable test systems which are scalable and can be used flexibly for the respective requirements.
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Integration of Inline Test Systems
The test system and adapter can also be integrated in inline test systems. Additional communication can take place via interfaces (e.g. RS232, DLL). We have already created numerous integrations for different manufacturers.
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MB-OFDM Protocol Test System
WiMedia Explorer 300
The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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Battery Test and Analysis System
BTAS-16
The task of testing an aircraft’s Nickel-Cadmium batteries is complicated and involved because of the high number of cell voltage readings that need to be taken during testing. Taking voltage readings from all 20 cells in the typical nickle-cadmium aviation battery multiple times is laborious and error prone, but must be done to properly estimate the condition of the battery under test.
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Software for Testing Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
We offer extensive and powerful software packages for our systems. All of our testing systems are controlled with our Hillgus testing software and the test results are stored in our open file formats. With our evaluation software Oculus, the findings can be subsequently evaluated and documented. Both Hillgus and Oculus were developed in-house and are constantly being improved. Due to the modular structure, the software can be optimized for every requirement and expanded at any time.
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Mezzanine System
3556
The 3556 provides two removable Micro SD flash memory sites, and fourteen bits of general purpose digital I/O. The Micro SD sites are each capable of Gigabytes of storage. A retention mechanism holds the Micro SD card securely in place preventing movement due to vibration or shock.
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LT-500A Aging-Life Test System For LED Luminaires
Hangzhou Everfine Photo-E-Info Co., LTD
LT-500A system is widely used for normal /accelerated aging, lumen maintenance measuring, chromaticity shift measuring, lifetime evaluation and temperature characteristic testing for LED luminaires, arrays, and modules. The extrapolation of lifetime by programmable models is also available to estimate the lifetime of LED luminaires.
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Automatic Transformer Test System
TH2829AX-48
Changzhou Tonghui Electronic Co., Ltd.
Number of Test PIN: 48 ■ Frequency: 20Hz-200kHz, Resolution: 0.5mHz ■ Signal Level: 5mV-2Vrms(Option:2mV-10Vrms) ■ Test Speed: max. 13ms ■ 7-inch TFT LCD display with a resolution of 800×RGB×480
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Speed Switch Sensor & System Testing Device
The SpeedMaster with Pulse Pilot provides independent, real time, and complete verification of an entire speed monitoring system to ensure that alarms and shutdowns are working as expected.
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Benchtop Automated Functional Test
midUTS
Combining bench-top portability with powerful automated test functionality, the midUTS is an extremely versatile yet cost-effective solution for your electronics functional test needs. Comprised of high-performance commercial-off-the-shelf (COTS) instruments, along with Bloomy’s medium-density signal-routing PCBAs, a built-in or USB-connected PC, and a pair of high-integrity, production-grade cables connected to an adjacent benchtop fixture, the midUTS can be used in engineering for PCBA bring up, as well as scaled to manufacturing to perform high-volume PCBA and sub-assembly functional testing. It is also ideal for depot diagnostic test, debug, and repair of field returns. The two mass-interconnected cables connect the midUTS to as many as 320 test points on the unit under test (UUT), supporting an extreme wide variety of products using bed-of-nails as well as cable-connected UUT test fixtures. Most importantly, the midUTS helps you automate sequences of functional tests using NI TestStand and the Bloomy EFT Module for TestStand. This ideal balance between powerful features and affordable cost allow you to automate earlier in the product development lifecycle, substantially increasing product quality and minimizing time-to-market!
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PXI System for LRU Test
ARINC 629
PXI System for LRU Test Support. The system shown here was developed in support of Boeing 777 LRU Production Test.
