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Product
PCIe-8244, 4-Port, USB3 Vision Frame Grabber Device
782890-01
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The PCIe‑8244 is a USB 3.0 interface device designed for use with USB3 Vision cameras. USB 3.0 is ideal for high-data-rate machine vision applications. USB3 Vision cameras also offer plug‑and‑play functionality and ease of use through a standardized catalog of functions.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
PXI-8430/2 , 2-Port, RS232 PXI Serial Interface Module
778982-01
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2-Port, RS232 PXI Serial Interface Module - The PXI‑8430/2 is a high-performance interface for high-speed communication with RS232 devices. It features high-performance DMA transfers, multithreading, and multiprocessor support. NI serial interfaces also appear as standard COM ports … for compatibility with programs that use serial communications.
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Product
Common Rail Injector Tester
ICR-4 Tester
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ICR-4 tester is used to control electromagnetic and piezoelectric injectors used in the common rail injection systems. It is possible to control up to four injectors of a type at a time. The signal generated by the tester which controls the injectors, corresponds to the signal which appears in the car engine controller.
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Product
sbRIO-9881, Non-Enclosed, 1-Port C Series CANopen Interface Module
785966-01
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The sbRIO‑9881 is a high-speed CANopen interface for developing CANopen applications in LabVIEW software on CompactRIO hardware. CANopen is the application layer that sits on top of the CAN physical layer often used for industrial automation applications. The sbRIO‑9881 can transmit/receive process data objects (PDOs) and service data objects (SDOs) according to CiA‑DS 301. The sbRIO‑9881 is compatible with only CompactRIO systems. Non-enclosed modules are designed for OEM applications.
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Product
Test & Simulation Interface for PCI
PCI-C1760
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Avionics Interface Technologies
HS1760/MIL-STD-1760E Test & Simulation Interface for PCI
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Product
sbRIO-9866, Non-Enclosed, 1-Port C Series LIN Interface Module
785965-01
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Non-Enclosed, 1-Port C Series LIN Interface Module—The sbRIO‑9866 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The sbRIO‑9866 excels in applications requiring real-time, high-speed manipulation of hundreds of LIN frames and signals such as hardware‑in‑the‑loop (HIL) simulation, rapid control prototyping, bus monitoring, automation control, and more. You can perform this manipulation while taking other DAQ measurements in the same CompactDAQ hardware platform or while performing low-level FPGA control and embedded monitoring in the same CompactRIO Chassis. Non-enclosed modules are designed for OEM applications.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Interface
RCEI-830A
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Designed for embedded, laboratory and simulator applications, the RCEI-830A supports maximum data throughput on all channels while providing onboard message scheduling, label filtering, multiple buffering options, receive message time-tagging and error detection, and IRIG-B receiver (AM or DC/TTL) and generator (DC/TTL).
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Product
PXIe-1486, 8 Input, 8 Output, or 4 Input/4 Output PXI FlexRIO FPD-Link™ Interface Module
787453-01
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The PXIe-1486 combines the Texas Instruments Flat Panel Display Link™ (FPD-Link™) interface with the Xilinx FPGA for high-throughput vision and imaging applications. This module provides a … high-speed digital interface for using and testing modern advanced driver assistance systems (ADAS) and autonomous drive (AD) camera sensors and electronic control units (ECUs). Additionally, the PXIe-1486 makes use of a combination of FPD-Link™ serializers and deserializers with a Xilinx FPGA to provide a high-throughput and customizable FPD-Link™ interface on PXI. The included FlexRIO driver, with LabVIEW FPGA examples, provides access and control for power-over-coax, I²C back-channel communication, and general-purpose input/output (GPIO) communication on the FPD-Link™ channels. The PXIe-1486 is ideal for applications such as in-vehicle data logging, lab-based playback, or hardware-in-the-loop (HIL). FPD-Link is a trademark of Texas Instruments.
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Product
PCI GPIB (IEEE-488) Interface Card - PCI-GPIB
PCI-GPIB
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PCI IEEE-488 interface card (PCI Card for Windows OS)
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
3U CompactPCI Serial 4-Port USB 3.2/2-Port Ethernet Card
cPCI-A3USB
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- Follow PICMG® CompactPCI® Serial design guide- CompactPCI® Serial, 3U 4HP- 4x USB3.2 Gen 1 ports and 2x RJ45 2.5G LAN ports in front panel- 1x USB2.0 port on board- Operating temperature: -40°C to +85°C- Designed to meet EN50155 standards
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Product
FPGA UDP Packet Interface Connnecting 3-4 Channels of MIL-STD-1553 to Ethernet in Real-Time
ENETX-1553
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ENETX-1553™ is an innovative product that provides “remoting” of 1553 operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). ENETX-1553 is a small, low-power, rugged device that provides real-time Ethernet connectivity to for three or four dual redundant 1553 (A/B) buses (channels). Ideal for remoting 1553 connections for in-field applications or point-point lab usage. AltaAPI provides and highly portable BSD SDK and National Instruments LabVIEW and LabWindows. ENET products are unique in the market as they have a hardware, FPGA real-time UDP engine – no OS or IP stacks – provides maximum throughput and ultimate virus protection.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
USB 1553 and ARINC Appliance
USB-MA4
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The industry’s first USB 3.0 SuperSpeed Multi-channel MIL-STD-1553 and/or ARINC-429 appliance!1-2 1553 Dual Redundant Channelsand/or 8 ARINC-429 Channels (4 RX/TX and 4 RX)Supports ARINC-717 (shared with 429 channels)
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
