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Product
Magnetic Material Test Fixture
16454A
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The 16454A is designed for accurate permeability measurements of toroidal-shaped magnetic materials. Since the construction of this fixture creates one turn around the toroid (with no magnetic flux leakage), the need of winding a wire around the toroid is unnecessary. Complex permeability is calculated from the inductance with and without the toroid. When the E4991A/4291B with option 002 is used as the measurement instrument, direct readouts of complex permeability are possible. In addition, it is furnished with a small and a large fixture to adapt to a wide range of sizes.
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Product
In-Circuit Test System Rentals
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Forwessun offers flexible test system rental options to meet short-term or seasonal testing demands. Our rental systems are rigorously tested for reliability and performance, giving you access to high-quality equipment without the need for a full purchase commitment. Customised rental agreements allow you to return the equipment when it’s no longer required, providing an ideal solution for scaling up production or filling in during periods of high demand.
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Product
PCIe 4.0 Test Platform
PXP-400A
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The Teledyne LeCroy PXP-400A Test Platform provides a convenient means for testing PCIe 4.0 cards with a self-contained portable and powered passive backplane. The PXP-400A provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer.
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Product
Ethernet/LXI digitizerNETBOX 8 Bit High Speed Digitizer - 5 GS/s on 2 Channels, 1.5 GHz Bandwidth
DN2.223-02
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The digitizerNETBOX DN2.22x series allows recording of up to 8 channels with sampling rates of 5 GS/s and a bandwidth of 1.5 GHz. These Ethernet Remote instruments offer outstanding A/D features both in bandwidth and signal quality. The combination of high sampling rate and resolution makes these digitizers the top-of-the-range for applications that require high speed signal acquisition. The digitizerNETBOX can be installed anywhere in the company LAN and can be remotley controlled from a host PC.
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Product
PCIe 16 Bit High Speed Digitizer - 250 MS/s on 4 Channels
M4I.4421-X8
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The 6 models of the M4i.44xx-x8 Express series are designed for the fast and high quality data acquisition. Each of the input channels has its own A/D converter and its own programmable input amplifier. This allows the recording of signals simultaneously on all channels with 14 bit or 16 bit resolution without any phase delay between them. The card uses only one A/D converter even when running with 500 MS/s, guaranteeing best signal quality without any interleaving technology. The extremely large on-board memory allows long time recording even with the highest sampling rates.
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Product
BMS Manufacturing Test System
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The Battery Management System (BMS) Manufacturing Test System performs functional testing of product during end-of-line manufacturing. The system hardware includes all instrumentation to test a BMS, including multiple cell simulators, a mass interconnect for quick product transition and bed-of-nail fixtures to ensure less down time, higher throughput, and easy maintenance. The system application easily integrates into manufacturing processes, provides a method to test multiple product types, and optimizes tests to ensure only good product is released from manufacturing.
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Product
NI-9775 , ±10 V, Up to 20 MS/s/ch, 14-Bit, 4-Channel C Series Digitizer Module
784539-01
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The NI-9775 provides referenced single-ended analog inputs with two timing modes for applications such as fault detection in electrical transmission lines or structural failure events. You can use the NI-9775 to measure finite samples up to 20 MS/s/ch to capture fault detections or to measure continuously at up to 4 MS/s. You also can use the built-in analog reference trigger to assist with high speed phenomena. Additionally, the NI-9775 supports waveform streaming at a lower sample rate.
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Product
3.5 Digit Handheld Clamp Meters
U1190 Series
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Keysight’s U1190 Series clamp multimeters incorporate features to help you work more conveniently and safely. Housed in robust cases, these ergonomic handheld digital multimeters (DMM) fit comfortably in the palm of your hand and let you select functions with just a thumb press. A Keysight clamp multimeter is different from most other clamp multimeters because it also features handheld DMM functionality.
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Product
PXIe-5764, 16-Bit, 1 GS/s, 4-Channel PXI FlexRIO Digitizer
785169-01
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The PXIe-5764 is a PXI FlexRIO Digitizer that simultaneously samples four channels at 1 GS/s with 16 bits of resolution and features 400 MHz of analog input bandwidth. With up to 70 dB of SNR, the PXIe-5764 is ideal for applications that require a wide dynamic range with a wideband digitizer. The FlexRIO driver includes support for finite and continuous streaming modes, and you can implement custom algorithms and real-time signal processing on the LabVIEW-programmable Xilinx Kintex UltraScale FPGA. Available in AC and DC coupled variants, the PXIe-5764 is ideal for both time and frequency domain applications, including radar prototyping, LIDAR, communications, microscopy, OCT, event detection, and particle physics.
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Product
PXI Semiconductor/IC Test System
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A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Product
VXI Digital Multimeters
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Maximize the use of your legacy test systems with our line of high-performance VXI digital multimeters.
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Product
Standalone Bench Test System for FCT, ICT, ISP and Boundary Scan
LEON Bench
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The LEONBench test system is a flexible and scalable test system that features an excellent signal integrity and a high-quality fixture interface. This is achieved by combining a cableless connection from ABex modules to Virginia panel interface connectors. The system is optimized for high pin count test applications. Furthermore, it can be equipped with vacuum and pneumatic. Support for multi-level contact fixtures enables separate contact levels for FCT and ICT. The Konrad ITA (Interchangeable Test Adapter) frame allows various fixture houses all over the world to build custom fixtures for the LEONBench. Up to 15U additional rack space allows adding a bunch of high-performance measurement devices from various manufactures. An integrated power distribution unit takes care about power on and off sequencing.As part of the LEON Family, LEONBench is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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Product
Industry Pack Carriers and Digital I/O
CPCI-4pack-6U
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The CPCI-4pack-6U module provides a high performance flexible I/O scheme, that supports industry standard Industry PacksÔ. For application requiring low cost, high density I/O or unique combinations, the CPCI-4pack-6U is the perfect solution. The Local DSP can be used to simply move data to and from the CPCI bus or provide pre processing functions such as local PID controls, FFT’s, digital filtering, etc. Custom application software can be downloaded to the DSPvia the CPCI bus or the local serial port.
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Product
PCI-6519, 32-Channel, ±30 V, 16 Sink/Source Inputs, 16 Sink Outputs, Bank-Isolated Digital I/O Device
779085-01
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The PCI-6519 is an industrial digital I/O interface, with two banks optically isolated channels. The device is ideal for industrial control and manufacturing test applications. The PCI-6519 module is an industrial digital I/O interface, with eight banks of isolated channels. You can wire each input bank in a source or sink configuration. With programmable power-up states, you can configure the initial output states in software, to ensure safe operation when connected to industrial actuators. If a computer or application fault occurs, the PCI-6519 can use digital I/O watchdogs to switch to a configurable safe output state to ensure detection and safe recovery from fault conditions.
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Product
Automated Aerospace and Defense Test
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Obsolescence management, evolving RF requirements, and design for test (DFT) challenges every test organization in the aerospace and defense industry. Organizations are transitioning from rack-and-stack box instruments and closed-architecture automated test equipment (ATE) systems to smarter test systems built on a modular platform that scales to meet current and future needs.
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Product
96-Ch Digital I/O PCI Card
PCI-1753
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Emulates mode 0 of 8255 PPIBuffered circuits for higher driving capacity than 8255Multiple-source interrupt handlingInterrupt output pin for simultaneously triggering external devices with the interruptOutput status read-back“Pattern match” and “Change of state” interrupt functions for critical I/O monitoringKeeps I/O setting and digital output values when hot system resetSupports dry contact and wet contactHigh-density 100-pin SCSI connector
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Product
Ethernet/LXI digitizerNETBOX 8 Bit High Speed Digitizer - 1.25 GS/s, 500 MHz Bandwidth
DN2.221-04
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The digitizerNETBOX DN2.22x series allows recording of up to 8 channels with sampling rates of 5 GS/s and a bandwidth of 1.5 GHz. These Ethernet Remote instruments offer outstanding A/D features both in bandwidth and signal quality. The combination of high sampling rate and resolution makes these digitizers the top-of-the-range for applications that require high speed signal acquisition. The digitizerNETBOX can be installed anywhere in the company LAN and can be remotley controlled from a host PC.
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Product
PXI-4071, 7½-Digit, ±1,000 V, Onboard 1.8 MS/s Isolated Digitizer, PXI Digital Multimeter
778271-01
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7½-Digit, ±1,000 V, Onboard 1.8 MS/s Isolated Digitizer, PXI Digital Multimeter - The PXI‑4071 is a high-performance 7½‑digit, 1,000 V DMM that provides the measurement capabilities found in two common test instruments: a high-resolution DMM and a digitizer. As a DMM, the PXI‑4071 delivers fast, accurate AC/DC voltage, AC/DC current, 2‑ or 4‑wire resistance, and frequency/period measurements, as well as diode tests. In the high-voltage, isolated digitizer mode, the PXI‑4071 can acquire waveforms at sample rates up to 1.8 MS/s.
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Product
32-Ch Isolated Digital Output EtherCAT Remote I/O Module
AMAX-4834
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Suitable for EtherCAT networks32-ch digital output with 2,500 VDC isolationWide output voltage range (5 ~ 40 VDC) and high output current (350 mA/ch)Quick removable European type connectorLED indicators for I/O statusSupports EtherCAT Distributed Clock (DC) mode and SyncManager modeTwo Rotary switches for up to 256 slave IDs
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Product
ARINC-708 Module
M4K708
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The M4K708 module is an ARINC-708 / 453 2-channel test and simulation module for the Weather Radar Display Databus. The M4K708 supports two ARINC-708 / 453 channels, each selectable as transmit or receive.
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Product
3-Axis Non-Robotic Automated Testing System
AT3
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The Instron AT3 is a space-efficient, highly adaptable 3-axis mechanical testing platform designed for automated execution of tensile, compression, flexural, and lap shear tests. Built to comply with a broad spectrum of ASTM and ISO standards, it’s well-suited for evaluating materials such as plastics, elastomers, thin films, foils, and metals. The system streamlines the entire testing workflow from specimen measurement and handling to strain measurement and specimen disposal—enabling users to load up to 160 samples and let the AT3 take care of the rest. Boost productivity, reduce manual intervention, and achieve consistent, dependable results with every test cycle.
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Product
Test Fixture, Axial And Radial
16047A
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The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
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Product
PXI/PXIe High Density Digital Input Module, 128-Channel, 50V
40-414-101
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The 40-414-101 (PXI) and 42-414-101 (PXIe) are 128-channel digital input modules with 50 V inputs and provide a convenient way of determining the status of input lines by comparing the input voltage with two threshold voltages - quickly establishing if the input is low, high or in an intermediate logic state.
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Product
Smart Bench Essentials Digital Multimeter
EDU34450A
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The Keysight EDU34450A is a modern benchtop digital multimeter (DMM) that is part of the Keysight Smart Bench Essentials (SBE) Series of four unique instruments that harness one powerful graphical interface to connect, control, and capture measurement data. It features 5.5 digits of resolution and up to 110 readings/s measuring rate for speed-critical tests
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Product
PXI 64-Channel Digital Output Module
40-412A-021
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The 40-412A-021 (PXI) and 42-412A-021 (PXIe) are 64-Channel Digital Output modules with high output voltage and current capability. The outputs can be used for high or low drive and each channel is capable of sourcing 0.5A from the high side or 0.5A sink on the low side. Accidental operation of both high and low side driver on the same channel is prevented by the supplied driver. Outputs are fully protected against over-voltage, over-current and thermal overload, ensuring robust and reliable operation in the toughest test environments. For high side driving, the voltage source is supplied externally, allowing the module to drive high capacity loads separate from the chassis power supply. For low side driving, the external source is not used and the module’s output operates an open collector or open drain driver.
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Product
12-Bit, 2.5 GSPS Digitizer Optimized for Pulse Detection
ADQ32-PDRX
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ADQ32-PDRX acquires the input signal via a single connector and uses an onboard splitter to separate the signal into two paths with different gain settings. The high gain path is used to accurately capture low-amplitude portions of the input signal whereas the low gain path ensures the acquisition of high-amplitude peaks without causing saturation. The two signal paths are then combined in real-time inside the onboard field-programmable gate array (FPGA) to create a digitized output with improved performance.PDRX increases the dynamic range by 3 bits and is fully integrated into the digitizer for fast and easy system-level integration. ADQ32-PDRX is therefore comparable with a 16-bit digitizer in terms of dynamic range, but with the benefit of offering a higher sampling rate.
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Product
SoC Test Systems
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Specifically designed for high-throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses. With the full functions of test capability, high accuracy, powerful software tools and excellent reliability, 3650-EX is ideal for testing consumer devices, high-performance microcontrollers, analog devices and SoC devices.
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Product
Memory Test System
T5851/T5851ES
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The T5851 system is designed to provide a cost-effective test solution for evaluating high-speed protocol NAND flash memories including UFS3.0 universal flash storage and PCIe Gen 4 NVMe solid-state drives (SSD), both of which are expected to be in high demand for the LTE 5G communications market.
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Product
PXIe-7822, PXI Express Digital RIO with Kintex-7 325T FPGA
783486-01
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Kintex 7 325T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7822 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7822 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7822 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.
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Product
In-Circuit Test
TestStation LH
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The TestStation LH in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne's popular, award winning TestStation product family. TestStation LH features SafeTest protection technologies for accurate, reliable, and safe testing of the latest low-voltage technologies.
