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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Coupling/Decoupling Network
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Suzhou 3ctest Electronic Co.,Ltd.
coupling/decoupling network is to test the capacity of high speed communication line for surge test. Data transmission rate is up to 1,000MBit/s. It is designed to meet the requirements of figure 14 in IEC/EN 61000-4-5: 2005. The material of decoupling device is high conductive magnetic material. Stable decoupling capacity and transmission rate, easy to use and compact size.
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Product
Mini OTDR
FiberPal OT-8700
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FiberPal OT-8700 series instruments, with power meter built-in, are new miniature, high performance optical time domain reflectometer which is designed as fiber troubleshooter for locating fiber connector, break and imperfections for access networks. It detects event locations along the optical fiber and displays the results on a 7” color LCD display. FiberPal OT-8700 series are light, reliable and easy to use, hence it is ideal for FTTX testing. The Application Software equipped is used for data analysis, processing and storage. With the USB Interface port, enabling FiberPal OT-8700 series to transfer test data to computer easily.
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Product
AC Power Source Control And Data Capture Software
PowerTRAC™
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Program and run your power source remotely via PC. Easily gather data and analyze test results like never before.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
RF In Line Digital Power Meter
DPM-50
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DPM-50 features high dynamic range, high accuracy and high stability, it works with PC monitoring software and optional handheld monitor to perform real-time in-line monitoring on entire antenna system and saves test data for analysis and evaluation.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
PXIe-8822 2.4 GHz Quad-Core Processor PXI Controller
787881-01
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The PXIe8822 is an Intel Core i3based embedded controller for PXI systems. You can use the PXI-8822 to create a compact or portable PC-based platform for industrial control, data acquisition, and test and measurement applications. This PXI Controller includes a 10/100/1000/2500 BASET Gigabit Ethernet port, two HiSpeed USB ports, two USB 3.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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Product
Online OK Tester for Electronic Ballast and CFL
WT-1
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• Test 6 pieces at one time, suitable for mass testing in assembly line. • Measure parameter: Vrms, lrms, W, PF. • Freely set upper and lower limit for lrms, W, PF, alarm when value out of limits. • Freely set test duration in range: 0-99.9s, tested data automatically locked. • Test range: 1) Vrms: 10.0-300.0V 2) lrms: 5-999mA 3) W: 0.1-300.0W 4) PF: 0.0001-1.000 • Accuracy: 0.5% • Digital display on 6 windows is easy to read • Print port and communication port available (optional)
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
Probe Card Analyzers
PB6800
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The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt’s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Battery Test & Automation Solutions
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Chroma specifically developed battery cell test solution which is an integrated solution for battery cell formation & grading processes. From battery cell formation procedure to grouping process, Chroma 17900 series are customized with professional planning service which includes manufacturing flow path planning, test station/ equipment planning, test data management and so on to create high performance manufacturing capability.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
Airborne Network Flight Test Recorder
TTC nREC-7000
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Curtiss-Wright Defense Solutions
The nREC-7000 is a high speed network recorder for use with Flight Test Data Acquisition and Multiplexing units. The nREC-7000 accepts data for recording on two 10GBASE-SR ports and two 1000BASE-T ports that can store data at sustained speeds of up to 1,000 MBps per 10GbE port. The recorder is also capable of acquiring, formatting (using PCAP, DARv3 or IRIG-106 Chapter 10/11), and recording 10GBASE-SR Ethernet at line rate.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Dual Function Slot MOSA Data Concentrator Unit (DCU)
NIU2A-DCU-01
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NIU2A-DCU-01 is a Modular Open Systems Approach (MOSA) Data Concentrator Unit with low power high performance ARM Cortex -A9 processing. 512 MB RAM, 32 GB SATA Flash, 2 x 10/100/1000Base-T Ethernet and optional Fiber Optic Ethernet support
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Product
Software for Jazz® and M90™/M91™ - All-in-One OLC and HMI Applications in One Environment
U90 Ladder
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All-in-One software enables you to:- Develop your PLC and HMI applications in one environment- Configure Hardware & Communications- Establish modem and data communications- Test and debug your programs
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Product
2-Module ICT System, I317x Series 6
E9902G
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Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
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Product
Automotive Test Platform
ETS-800
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Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
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Product
Regenerative Battery Pack Test System
17020
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Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
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Product
100GBASE LR4/ER4 Wavelength Selective Power Meter
KI6512
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KI6512 is an easy and economical handheld 100GBASE LR4/ER4 Wavelength Selective Power Meter for testing multi-λ single mode fiber optic systems. It scans and stores the absolute or relative power levels of all 4 channels in 0.8 seconds. Test data can be viewed in graphical or numerical form, and reference values can be stored for easy loss testing. An extra 50/125u power meter port gives additional flexibility at 850 / 1300 / 1550 nm. This port only supports basic functions, but is very handy for first-in fault finding and investigation.
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Product
Test Workflow Pro
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Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
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Product
JTAG Functional Test
JFT
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JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
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Product
EOL/Functional Testing
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Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
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Product
PXIe-8821, 2.6 GHz Dual Core Processor PXI Controller
785158-33
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PXIe, 2.6 GHz Dual Core Processor PXI Controller—The PXIe‑8821 is an Intel Core i3‑based embedded controller for PXI systems. You use it to create a compact and/or portable PC-based platform for industrial control, data acquisition, and test and measurement applications. The PXIe‑8821 includes a 10/100/1000 BASE‑TX (Gigabit) Ethernet port, two Hi‑Speed USB ports, two USB 3.0 ports, as well as an integrated hard drive, serial port, and other peripheral I/O.
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Product
Custom Test System Solutions
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No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
