-
Product
Configurable Functional Test System
ATS-5000
-
Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
-
Product
4G Router
BB-SR30409025
-
SmartFlex, EMEA/LATAM/APAC, 2x Ethernet, PoE PD, Metal, International Power Supply (EU, US, UK, AUS) LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
-
Product
Bottom Electrode SMD Test Fixture
16198A
-
Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
-
Product
4G Router
BB-SR30418120
-
SmartFlex, EMEA/LATAM/APAC, 5x Ethernet, Wi-Fi, PoE PSE, Metal, Without Accessories. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
-
Product
4G Router
ICR-2834WA02
-
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Metal, UK ACC LTE Cat.4 with 3G/2G fallback 1.3 GB eMMC storage to host customer SW applications. 2× SIM with cover, eSIM ready.
-
Product
Compact 4G Router
ICR-1601G
-
ICR-1600, EMEA/LATAM/APAC, 2x Ethernet, GPS, Metal, Without Accessories
-
Product
PCI Express 4.0 Test Platform
-
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
-
Product
High Speed LAN Router
ICR-4401WS
-
ICR-4400, GLOBAL, 5x Ethernet, 1x RS232, 1x RS485, CAN, PoE PSE+, Wi-Fi, SFP, USB, SD, Without Accessories. Quad-core CPU with 1 GB RAM, 5× Gigabit Ethernet, 4× POE+ PSE (PoE use is limited – see the ICR-4401 user manual).
-
Product
4G Router
BB-SR30910320-SWH
-
SmartFlex, Korea, 2x Ethernet, 1x RS232, 1x RS485, Wi-Fi, Metal, Without Accessories. LTE cat.4, 3G/HSPA+, GPRS/EDGE, Korea, 2x SIM - SKT carrier only (KT and LG U+ are not supported). LTE B1, B3, B5, B7, B8, B20, B38, B40, B41. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
4G Router
BB-SR30910120-SWH
-
SmartFlex, Korea, 5x Ethernet, Wi-Fi, Metal, Without Accessories. LTE cat.4, 3G/HSPA+, GPRS/EDGE, Korea, 2x SIM - SKT carrier only (KT and LG U+ are not supported). LTE B1, B3, B5, B7, B8, B20, B38, B40, B41. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
4G Router
BB-SR30408010
-
SmartFlex, EMEA/LATAM/APAC, 2x ETH, PoE PSE, Plastic, No ACC. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
-
Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
-
The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
-
Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
-
The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
-
Product
LAN Router
BB-SR30010111
-
SmartFlex, Global, 5x Ethernet, Wi-Fi, Plastic, EU Accessories. VPN, Multiple LAN/WAN configuration, DIN rail mounting. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
4G Router
BB-SR30408420
-
SmartFlex, EMEA/LATAM/APAC, 3× ETH, 1× RS232, 1× RS485, PoE PSE, Metal, No ACC. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2× SIM. LTE B1, B3, B5, B7, B8, B20, B38, B40, B41 Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
LAN Router
ICR-3201
-
ICR-3200, Global LAN, 2x Ethernet, 1x RS232, 1x RS485, Metal, Without Accessories. LAN VPN Gateway for Industrial IoT applications. Powerful CPU with 1.3 GB storage to host customer SW applications.
-
Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
-
The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
-
Product
5G Router
ICR-4272W
-
ICR-4200, GLOBAL, 2× ETH, 2× Serial RS232/RS485, 4× DI, 2× DO, GNSS, WiFi, USB, SD, Without Accessories. 5G NR Cellular Connectivity, Sub-6GHz. 3GPP Release 16, Supports both NSA and SA modes. Quad-core CPU with 1 GB RAM.
-
Product
Entry Level LAN Routers - ICR-2000
-
LAN routers provide routing and firewall options without cellular connectivity and Ethernet 10/100 ports for connection.
-
Product
Compact 4G Router
ICR-1642G-EU-A
-
ICR-1600, EMEA, 2× ETH, 1× RS232/RS485, GNSS, Antennas included
-
Product
LAN Router
BB-SR30018120-SWH
-
SmartFlex, Global, 5x Ethernet, Wi-Fi, PoE PSE, Metal, Without Accessories. VPN, Multiple LAN/WAN configuration, DIN rail mounting. Powerful CPU and Memory, Hosting of SW IoT applications.
-
-
Product
Industrial LAN Routers (Wi-Fi Optional)
-
Industrial LAN routers with firewall features and Ethernet plus serial ports for connectivity including optional WiFi.
-
Product
LAN Router
ICR-2701WA02
-
ICR-2700, GLOBAL, 2× ETH, USB, WiFi, Metal, UK Power Supply. 1.3 GB eMMC storage to host customer SW applications. 2× Ethernet 10/100 WiFi 802.11n.
-
Product
Laser Diode Reliability Burn-In / Life-Test System
58602
-
Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
-
Product
4G Router
ICR-2834GPA01
-
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, GPS, Plastic, EU ACC LTE Cat.4 with 3G/2G fallback. GNSS receiver 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
-
Product
LAN Router
ICR-2701PA01
-
ICR-2700, EMEA, 2x Ethernet, USB, Plastic, EU Accessories. 1.3 GB eMMC storage to host customer SW applications.
-
Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
-
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
-
Product
4G Router
BB-SR30800315-SWH
-
SmartFlex, AUS/NZ, 2x Ethernet, 1x RS232, 1x RS485, Plastic, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, AUS/NZ, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B28, B40. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
VLSI Test System
3380
-
The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
