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AIM Interface Modules
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AIM’s innovative, unique and successful ‘Common Core’ hardware design set new standards for onboard intelligence and performance when introduced to the market in 1998. Since then, further generations and evolutions of the Common Core approach have been introduced, offering improved performance, higher channel density, lower power consumption, the migration to smaller form factors as well as the support of new avionics bus and network communication standards.
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Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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1553 EBR to Ethernet Converter
ENET-1553-EBR
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ENET-1553-EBR-1D™ is an innovative product that provides “remoting” of 1553 AS5652 EBR operations on 10/100/1000 Ethernet IP/UDP local area networks (LAN). ENET-1553-EBR is a small, low-power, rugged device that provides connectivity for up to eight AS5652 RT devices, single BC or composite monitor.
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Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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USB-8506 , LIN Interface Device
784664-01
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1- or 2-Port, USB LIN Interface Device—The USB‑8506 is a Local Interconnect Network (LIN) interface for developing applications with the NI‑XNET driver. The USB‑8506 is powered over the USB bus and does not require external power. The USB‑8506 excels in applications requiring logging or manipulation of hundreds of LIN frames and signals, such as in-vehicle data logging, bus monitoring, automation control, and more. The NI‑XNET device-driven DMA engine enables the onboard processor to move LIN frames and signals between the interface and the user program without CPU interrupts, minimize message latency, and free host processor time. The USB‑8506 is available with a three‑pin COMBICON synchronization connector for triggering and synchronizing the internal hardware timebase with other devices.
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AINC 429 Multichannel Interface with Additional ARINC-717 Receive & Transmit Channels
DAS-429UNET/RT8-717
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The DAS-429UNET/RT8-717 is an ARINC 429, multichannel interface card with additional ARINC-717 receive and transmit channels. Its small size and ability to interface through USB or Ethernet interfaces make it a complete solution for developing, testing and performing system simulation of the ARINC 429 & ARINC-717 bus, both in the lab and in the field.Multiple units can operate via USB ports on the same computer. In addition, multiple units can operate on the same network, by programming each one with a unique IP address, and can be accessed from any computer on the network.The EXC-429UNET/RT8-717 adapter is supplied with C drivers, including source code and may be used with Exalt, Excalibur’s Analysis and Laboratory Tools, a Windows monitoring application (only versions 8.1 or higher).
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PCI, IEEE 488 GPIB Instrument Control Device for Windows, Low Profile
783007-01
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The PCI‑GPIB is a plug‑and‑play IEEE 488 interface for PCs and workstations with PCI expansion slots. The PCI‑GPIB can sustain data transfer rates of more than 1.5 MB/s using the IEEE 488.1 three‑wire interlocked handshake. It also implements the high-speed IEEE 488.1 noninterlocked handshake (HS488) for benchmarked data transfers at more than 7.7 MB/s. The onboard bus master DMA controller means that there are no microprocessor interruptions in data transfer.
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COM Express Type 7 10GbE SFP+ Network Adapter Card
CEI-2x10G SFP+
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- Support up to two 10GbE SFP+ interfaces- Inphi CS4227 inside- COM.0 R3.1 Type 7 compliant- Dedicated for Express-VR7
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ARINC 429 Multichannel Interface Card for Mini PCI Systems
DAS-429mPCI/RTx
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The DAS-429mPCI/RTx is an ARINC 429, multichannel interface card for Mini PCI systems. The card’s small size and suitability for Mini PCI notebook computers, make them a complete solution for developing and testing ARINC 429 interfaces and for performing system simulation of the ARINC-429 bus, both in the lab and in the field.The DAS-429mPCI/RTx is supplied with C drivers, including source code and Mystic application program.
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6U VME COTS System, Sensor Interface Unit
SIU6
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NAI's SIU6 is a highly configurable rugged COTS system or subsystem ideally suited for military, industrial, and commercial applications that require high-density I/O, communication, Ethernet switching, and processing. The SIU6 leverages NAI field-proven, 6U VME boards to deliver off-the-shelf, SWaP-optimized COTS solutions that "Accelerate Your-Time-to-Mission."
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LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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CAN Interface Device
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CAN Interface Devices communicate using onboard transceivers for High-Speed/Flexible Data-Rate, Low-Speed/Fault-Tolerant, and/or Single-Wire CAN as well as any external transceiver. Using the NI-XNET driver, you can create applications that require real-time, high-speed manipulation of hundreds of CAN frames and signals. You can also import, edit, and use signals from Fieldbus Exchange Format (FIBEX) and Database Container (DBC) files in integrated CAN databases. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time.
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6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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Interface
RAR-USB
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The RAR-USB is further evidence of Abaco Systems’ commitment to making available avionics solutions that are powerful and flexible, and that respond to the needs of customers.
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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High Performance PCIe-GPIB Interface Card
82351B
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Convert your PCI computer directly into an intrumentation control; install easily with plug-and-play configuration.
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NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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PXIe-1487, 8 Input, 8 Output, or 4 Input/4 Output PXI FlexRIO GMSL™ Interface Module
787456-01
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The PXIe-1487 combines the Maxim Integrated Gigabit Multimedia Serial Link™ (GMSL™) interface with the Xilinx FPGA for high-throughput vision and imaging applications. This module provides a … high-speed digital interface for using and testing modern advanced driver assistance systems (ADAS) and autonomous drive (AD) camera sensors and electronic control units (ECUs). Additionally, the PXIe-1487 makes use of a combination of GMSL™ serializers and deserializers with a Xilinx FPGA to provide a high-throughput and customizable GMSL™ interface on PXI. The included FlexRIO driver, with LabVIEW FPGA examples, provides access and control for power-over-coax, I²C back-channel communication, and general-purpose input/output (GPIO) communication on the GMSL™ channels. The PXIe-1487 is ideal for applications such as in-vehicle data logging, lab-based playback, or hardware-in-the-loop (HIL). GMSL is a trademark of Maxim Integrated Products, Inc.
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Ethernet Bridge Converter for MIL-STD-1553 and ARINC
ENETX-MA4
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eNetX-MA4™ is an innovative product for “remoting” 1553 & ARINC-429/717 operations on 10/100/1000 Ethernet local area networks (LAN). eNetX-MA4 is a very small, low-power, rugged device that provides real-time UDP connectivity to for 1-2 dual redundant 1553 (A/B) busses and 4 ARINC channels. Tested to MIL-STD-704F/810G/461F and DO160.
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Product
NI-9881, 1-Port C Series CANopen Interface Module
781673-02
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The NI‑9881 is a high-speed CANopen interface for developing CANopen applications in LabVIEW software on CompactRIO hardware. CANopen is the application layer that sits on top of the CAN physical layer often used for industrial automation … applications. It was designed for motion-oriented machine control networks, such as handling systems, but now it is used in a variety of applications, including medical equipment, off-road vehicles, maritime electronics, public transportation, and building automation. The NI‑9881 can transmit/receive process data objects (PDOs) and service data objects (SDOs) according to CiA‑DS 301. The NI‑9881 is compatible with only CompactRIO systems.
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Product
EBIRST 50-pin D-type To 37-pin D-type Adapter
93-005-418
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eBIRST adapters allow extension to other switching system connectors, including SMB
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*C Series CAN Interface Module
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C Series CAN Interface Modules communicate using onboard transceivers for High-Speed/Flexible Data‑Rate or Low-Speed/Fault Tolerant CAN. C Series CAN Interface Modules are either compatible with NI-XNET or the NI-985x driver, depending on model.Using NI-XNET, you can create applications that require real-time, high-speed manipulation of hundreds of CAN frames and signals. The NI-XNET device-driven DMA engine enables the onboard processor to move CAN frames and signals between the interface and the user program without CPU interrupts, minimizing message latency and freeing host processor time. C Series CAN Interface Modules work well in applications such as hardware-in-the-loop (HIL) simulation, rapid control prototyping, bus monitoring, and automation control.
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Optimize Throughput And Cost For MmWave 5G Device Functional Test
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Test engineers always have faced tough new test-coverage challenges. Those introduced by 5G measurements at mmWave are no exception, as they require over-the-air (OTA) radiated test solutions. But never have these pressures seen today’s intense time-to-market, manufacturing volume, and operational expectations! A solution that meets these demands must:
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High Performance PXI Functional Test System with Mac Panel Interface
TS-5400
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The Keysight TS-5400 PXI Series Functional Test System provides automotive, aerospace and defense and industrial control manufacturers with an off-the-shelf PXI hardware and software platform with support for single or multiple DUT test. Designed for testing electronics control modules such as, power train control, complex body electronics and industrial controllers, the TS-5400 PXI Series helps manufacturers achieve higher throughput for their design validation and manufacturing functional test needs with the capacity to empower them to anticipate future functional test needs.
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Product
Digital/Pattern/PE Card
PA64S
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The PA64S represents a new level of performance and capabilities for PXI-based digital instrumentation. The PA64S offers high performance pin electronics and 16 sites of TMU/SPI/I2C/CLK generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be integrated, supporting up to 256 sites (16 boards).
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IEEE 488 PXI GPIB Instrument Control Module
778039-01
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The PXI‑GPIB is an IEEE 488 controller module for PXI systems. You can use this module to integrate non-PXI instruments into your PXI system using GPIB. The PXI‑GPIB achieves maximum IEEE 488.2 transfer rates. This module … includes a license for the NI‑488.2 driver software, which provides maximum reliability for connecting to third-party instruments with GPIB.
