-
Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
-
Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
-
Product
4G Router
BB-SR30400315
-
SmartFlex, EMEA/LATAM/APAC, 2x ETH, 1x RS232, 1x RS485, Plastic, ACC Int. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
-
Product
4G Router
ICR-2834WA01
-
ICR-2800, EMEA, 2x Ethernet, 2× RS232/RS485, USB, Wi-Fi, Metal, EU ACC LTE Cat.4 with 3G/2G fallback. 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
-
Product
Wireless Router Test Platform
-
Promptlink Communications, Inc.
Promptlink's Wireless Router Test Platform (WRTP) is a complete functional router testing solution designed for the highest volume testing requirements. WRTP is the ultimate tool for accurate, high-demand testing of wireless routers. With added support for TR069 through Promptlink's own ACS, WRTP is the solution that gives you the ultimate power and productivity to keep your business moving forward.
-
Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
-
The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
-
Product
4G Router
BB-SR30419125
-
SmartFlex, EMEA/LATAM/APAC, 5x Ethernet, Wi-Fi, PoE PD, Metal, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2x SIM. LTE B1, B3, B5, B7, B8, B20 VPN router, Open Linux OS.
-
Product
LAN Router
ICR-2701W
-
ICR-2700, GLOBAL, 2× ETH, USB, WiFi, Metal, No ACC. 1.3 GB eMMC storage to host customer SW applications.
-
Product
4G Router
ICR-2834G-S1
-
ICR-2800-S1, EMEA, 2× Ethernet, 2× RS232/RS485, USB, GPS, Metal, Without Accessories LTE Cat.4 with 3G/2G fallback. Security based on IEC 62443-4-2 level 1 GNSS receiver 1.3 GB eMMC storage to host customer SW applications 2× SIM with cover, eSIM ready.
-
Product
In-Circuit Test (ICT) Fixtures
-
At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
-
Product
Display Driver Test System
T6391
-
High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
-
Product
SoC/Analog Test System
3650-S2
-
The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
-
Product
FPD Tester Model
27014
-
Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
-
Product
4G Router
ICR-2437-DE
-
ICR-2400, Germany, Austria, 2× Ethernet , 1× RS232, 1× RS485, Metal, Without Accessories
-
Product
Memory Test System
T5230
-
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
-
Product
VLSI Test System
3380P
-
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
Product
ARINC-429 Module
M4K429RTx
-
The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
-
Product
4G Router
BB-SR30400021
-
SmartFlex, EMEA/LATAM/APAC, 2× ETH, Metal, ACC EU LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA/LATAM/APAC, 2× SIM. LTE B1, B3, B5, B7, B8, B20, B38, B40, B41 Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
4G Router
BB-SR30819025-SWH
-
SmartFlex, AUS/NZ, 2x Ethernet, Wi-Fi, PoE PD, Metal, International Power Supply (EU, US, UK, AUS). LTE cat.4, 3G/HSPA+, GPRS/EDGE, AUS/NZ, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B28, B40. 2x Ethernet port with PoE support, DIN rail mounting.
-
Product
High Speed LAN Router
ICR-4401W1
-
ICR-4400, GLOBAL, 5× ETH, 1× RS232, 1× RS485, CAN, WIFI, SFP, USB, SD, No ACC. Quad-core CPU with 1 GB RAM, 5× Gigabit Ethernet.
-
Product
2-Module ICT System, I317x Series 6
E9902G
-
Keysight's family of i3070 Series 6 In-Circuit Test (ICT) systems are built on a proven technology foundation, and they improve test efficiency with time-tested software, hardware, and programmability. I3070 Series 6 ICT tester supports a wide range of printed circuit board assembly (PCBA) sizes for applications including IoT and 5G, as well as automotive and energy. The i3070 features a unique design that delivers the shortest signal path between measurement circuitry and devices under test to minimize undesired effects from parasitic capacitance, improve immunity to crosstalk, and eliminate stray signal coupling effects, delivering consistent and repeatable measurements. The Series 6 is fully backward compatible with previous systems and makes highly repeatable measurements.
-
Product
Automotive Test Platform
ETS-800
-
Next-Gen Automotive Test Platform With the Industry’s Highest Throughput and Fastest Time to Market
-
Product
4G Router
BB-SR31000315
-
SmartFlex, Global, 2× ETH, 1× RS232, 1× RS485, Plastic, ACC Int. LTE Cat.4, 3G/HSPA+, GPRS/EDGE, Global, 2x SIM. LTE B1, B2, B3, B4, B5, B7, B8, B12, B13, B18, B19, B20, B25, B26, B28, B38, B39, B40, B41. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
Regenerative Battery Pack Test System
17020
-
Chroma's 17020 is a high precision system specifically designed for secondary battery modules and pack tests. Accurate sources and measurements ensure the test quality that is suitable to perform repetitive and reliable tests that are crucial for battery modules / packs, for both incoming or outgoing inspections as well as capacity, performance, production and qualification testing. Chroma's 17020 system architecture offers regenerative discharge designed to recycle the electric energy sourced by the battery module ei ther back to the channel s in the sys tem performing a charging function or to the utility mains in the most energy efficient manner. This feature saves electricity, reduces the facilities thermal foot print and provides a green solution by reducing the environmental impact on our planet. Chroma's 17020 system is equipped with multiple independent channels to support dedicated charge / discharge tests, on multiple battery modules / packs, each with discrete test characteristics. The channels can easily be paralleled to support higher current requirements. This feature provides the ultimate flexibility between high channel count and high current testing.
-
Product
Test Workflow Pro
-
Test Workflow equips engineers with application-specific tools so that they can choose the right one for the job—from graphical programing environments to no-code and interactive software applications. Engineers can use Test Workflow software to perform quick ad-hoc tests, build an automated test system, automate data analysis and reporting, develop test sequences, and more.
-
Product
Routers & Switches
-
Take advantage of our robust reliability coupled with advanced security and minimal SWaP - they're all hallmarks of Abaco's product range.
-
Product
4G Router
ICR-3231-EL
-
ICR-3200, EMEA, 2× Ethernet, 1× RS232, 1× RS485, Metal, EdgeLink, Without Accessories. LTE cat.4, 3G/HSPA+, GPRS/EDGE, EMEA, 2× SIM. EdgeLink Router App. LTE B1, B3, B7, B8, B20, B28, B38, B40, B41. Powerful CPU and Memory, Hosting of SW IoT applications.
-
Product
JTAG Functional Test
JFT
-
JFT comprises a series of software modules that support boundary-scan test and programming activities under Python, National Instruments LabVIEW and Microsoft .NET framework. Using JFT users can create JTAG/boundary-scan test application scripts, VIs or programs for PCB assemblies and systems that control individual driver/sensor pins, groups of pins declared as variables or register bits. These applications are typically used to test logic devices or mixed signal clusters and can also be transformed into re-usable test 'modules'. Pairing JFT with JTAG CoreCommander emulative test modules gives an effective, low-cost system for performing tests through embedded device peripherals (ADCs, Memory Controllers etc..)
-
Product
EOL/Functional Testing
-
Whether you are testing RF LRU modules as a defense contractor, or implementing the next power supply tester for EV charge stations, ARC can create a custom, flexible automated end of line test solution for a variety of needs, with your budget in mind.Leverage our expertise with PXI mixed signal modular instruments, RF test capabilities and switching to complete your next solutions. Shorten your test development times, improve hardware and software standardization, and control your future test development costs by partnering with ARC on your next project.
-
Product
Custom Test System Solutions
-
No time to think about test? One-size-fits-all testers not ideal? Existing solution no longer fits your needs? Then count on integrated test solutions from Astronics. We’ll assist you with your test strategy and your test system, setting you on the path to market at a pace and ROI that ensures your program success.
-
Product
Fixture Self-Test Controller and Calibration Check
AQ818
-
The module AQ818 includes all the electronic blocks required to perform an effective test platform self-test. Thanks to this module, a chain of tests can be performed, which will end up not only with a report of the defective instruments or switch modules, but also with the relay contacts live expectancy report.
