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Product
DRAM SO-DIMM DDR4 Memory
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Improve performance up to 50% (compared to SO-DDR3.) with Advantech! We offer industrial grade SO-DDR4 2666/2400/2133 memory with 30μ" gold plating connector (260 pin) featuring 1.2v low operating voltage with faster burst accesses.
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Product
SO-DIMM DDR Memory
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Extend operating temperatures of memory with Advantech. We offer industrial grade SO-DDR 400 memory with 30μ" gold plating connector (200 pin) supporting 2.5v operating voltage and wide operating temperature ranges from 0 ~ 95℃ (32 ~ 203℉).
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Product
FADEC/EEC Test Platform
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The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
EOL RF Functional Test
AS652
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With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
Memory Interface Chips
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Providing memory bandwidth and capacity to unleash the power of multicore processors
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Product
Memory Burn-in Tester
B6700 Series
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B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Product
Laser Distance Meter for 40m With 10 Memories and Min. Measurement
MS-LDM340
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*Measuring distance: 0.05 to 40m*Accuracy: ±1.5mm (±0.06in)*Unit conversion: mm/in/ft*Laser classification: Class 2*Laser type: 635nm <1mW*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement
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Product
6TL24 Combinational Base Test Platform
H71002400
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The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
OLED Lifetime Test System
58131
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The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Industrial Memory DDR2 Memory
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SQRAM DDR2 memory modules deliver 667/800 MT/s frequency with longevity support for legacy markets.
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Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
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*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
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Product
Ultra-High Performance FLASH and DRAM Memories Test Solution
Magnum V
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Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
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Product
Full Load Testing For Self Priming Pumps With Pneumatic System For Loading & Unloading Of Pumps
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Aarohi Embedded Systems Pvt. Ltd
While manufacturing of self priming pumps testing time is very important to avoid bottleneck. Aarohi developed semi automatic performance testing system with pneumatic system for loading & unloading of pumps which helps to enhance productivity & work efficiency.
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Product
In-Circuit Test Systems For Sale
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Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
4-CH 16-Bit 10/40 MS/s PCI Digitizers with 512 MB Memory
PCI-9816/9846
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The ADLINK PCI-9816/9846 are 10MS/s, 40MS/s sampling 16-bit 4-CH digitizers designed for digitizing high frequency and wide dynamic range signals with an input frequency up to 20 MHz. The analog input range can be programmed via software to ±1 V or ±0.2 V and ±5 V or ±1 V. With a deep onboard acquisition memory up to 512 MB, the PCI-9816/PCI-9846 are not limited by the data transfer rate of the PCI bus to enable the recording of waveforms for extended periods of time.
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Product
Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Product
In-Line RF Test Station
AP770
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ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
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Product
Memory Diagnostic Utility
MemTest86
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MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
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Product
Test Probes / Test Fixtures
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INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
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Product
Industrial Flash & Memory Solutions
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Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
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Product
Flight Control System Test Platform
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The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
In-Circuit Testing and Test Engineering
Teradyne Z1820
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2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
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Product
Material Testing & Physical Testing
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Meeting the specifications put out by testing equipment manufacturers is critical when conducting quality control testing. We carry a wide variety of materials testing and physical testing products that are ideal for quality control testing along with research applications, letting you evaluate and test materials such as plastics, coatings, and chemicals. Physical properties testing products range from force and torque instruments, to hardness and thickness gauges, to viscometers and spectrometers.
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Product
Reflective Memory
VME-5565
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The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
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Product
SSD Test Systems
MPT3000ES / MPT3000ES2
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Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
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Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
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ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
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Product
Spring Clip Fixture
16092A
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Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
