-
Product
Laser Distance Meter for 40m With 10 Memories and Min. Measurement
MS-LDM340
-
*Measuring distance: 0.05 to 40m*Accuracy: ±1.5mm (±0.06in)*Unit conversion: mm/in/ft*Laser classification: Class 2*Laser type: 635nm <1mW*Dynamic measurement*Area, volume measurement*Pythagorean proposition measurement
-
Product
6TL24 Combinational Base Test Platform
H71002400
-
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
-
Product
OLED Lifetime Test System
58131
-
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
-
Product
Industrial Memory DDR2 Memory
-
SQRAM DDR2 memory modules deliver 667/800 MT/s frequency with longevity support for legacy markets.
-
Product
Acute 4GS/s 136 Channel Logic Analyzer With 32Gb Memory
Acute LA3136E+
-
*LA3000E+/B+ series logic analyzer*PC-based*68 / 136 channels*USB 3.0 interface, 12V power adaptor*4GHz Timing Analysis / 250MHz State Analysis*32Gb RAM
-
Product
Ultra-High Performance FLASH and DRAM Memories Test Solution
Magnum V
-
Teradyne’s Magnum V systems delivers high throughput and high parallel test efficiency for ultra-high performance FLASH and DRAM memories. Magnum V’s largest configuration delivers up to 20,480 digital channels at 1600Mbps per channel.
-
Product
In-Circuit Test Systems For Sale
-
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
-
Product
4-CH 16-Bit 10/40 MS/s PCI Digitizers with 512 MB Memory
PCI-9816/9846
-
The ADLINK PCI-9816/9846 are 10MS/s, 40MS/s sampling 16-bit 4-CH digitizers designed for digitizing high frequency and wide dynamic range signals with an input frequency up to 20 MHz. The analog input range can be programmed via software to ±1 V or ±0.2 V and ±5 V or ±1 V. With a deep onboard acquisition memory up to 512 MB, the PCI-9816/PCI-9846 are not limited by the data transfer rate of the PCI bus to enable the recording of waveforms for extended periods of time.
-
-
Product
Wireless Device Functional Test Reference Solution
-
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
-
Product
In-Line RF Test Station
AP770
-
ICT, Functional, Hipot, Vision, ISP and RF test with low cost fixtures in a very compact test station footprint Works with PCBs up to 450×550 mm or with palletized devices Space for up to 25 VPC mass interconnect modules or YAV switching units
-
Product
Memory Diagnostic Utility
MemTest86
-
MemTest86 is the original, free, stand alone memory testing software for x86 computers. MemTest86 boots from a USB flash drive or CD and tests the RAM in your computer for faults using a series of comprehensive algorithms and test patterns.
-
Product
Test Probes / Test Fixtures
-
INGUN has an unbeatable assortment of test probes and test fixtures for individual testing tasks.Thanks to many years of experience in the testing equipment field, INGUN offers the suitable test solution for every test requirement.
-
Product
Industrial Flash & Memory Solutions
-
Advantech provides a full range of industrial storage module, memory module, and embedded I/O module.
-
Product
Flight Control System Test Platform
-
The Flight Control System Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of Flight Control Systems (FCS) of both commercial and military aircraft. The system simulates control surface activities from multiple combinations of rudder, flaps, elevator, aileron, and engine controls to the FCS. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
-
Product
In-Circuit Testing and Test Engineering
Teradyne Z1820
-
2048 Pure Pin Test Nodes3 & 6-wire Analog MeasurementsVector Test for VLSI, PLCC’s & ASICSMultiscan II Vectorless TestingIEEE Functional Interface BoardLarge Custom Vector Library
-
Product
Material Testing & Physical Testing
-
Meeting the specifications put out by testing equipment manufacturers is critical when conducting quality control testing. We carry a wide variety of materials testing and physical testing products that are ideal for quality control testing along with research applications, letting you evaluate and test materials such as plastics, coatings, and chemicals. Physical properties testing products range from force and torque instruments, to hardness and thickness gauges, to viscometers and spectrometers.
-
Product
Reflective Memory
VME-5565
-
The VME-5565 Reflective Memory node card provides a high-speed, low latency, deterministic interface that allows data to be shared between up to 256 independent systems (nodes) at rates up to 170 Mbyte/s. Each Reflective Memory board can be configured with either 64 Mbyte or 128 Mbyte of onboard SDRAM. The local SDRAM provides fast Read access times to stored data.
-
Product
SSD Test Systems
MPT3000ES / MPT3000ES2
-
Using the same high-performance electronics and powerful software as all products in the MPT3000 family, the MPT3000ES and MPT3000ES2 engineering stations feature a small footprint configured to test up to eight SSDs in parallel. The system's small size and ability to plug into a standard AC outlet enable users to conduct program development and interactive device debugging in either office or lab settings.
-
Product
Flash Memory In-System Programming File Generation
ScanExpress Flash Generator
-
ScanExpress Flash Generator is a tool to quickly create Flash programming files for use with ScanExpress™ software. The application operates as a standalone utility or integrates into ScanExpress TPG for creation and reuse of boundary-scan test files for in-system programming (ISP).ScanExpress Flash Generator combines a board Netlist, scan chain description, and BSDL files to automatically create Flash Programming Information (FPI) files. These files include all information necessary for ScanExpress Runner™ or ScanExpress Programmer™ execution systems to perform read, write, erase, and verify operations—in-system using high performance Corelis hardware.
-
Product
Spring Clip Fixture
16092A
-
Use this test fixture with parallel electrodes for impedance evaluation of both lead and SMD components.
-
Product
Electrification Testing Solutions
-
When looking for a partner to assist with your electrification testing or power electronics testing challenge, Ball Systems has the expertise and experience to ensure your energy storage or power conversion project moves forward efficiently.
-
Product
Memory Tester
RAMCHECK LX DDR3
-
Quickly test DDR3 DIMM and SO-DIMM memory. In just seconds, RAMCHECK LX will perform a thorough test of the module and provide complete identification. Also tests expensive LRDIMM modules.
-
Product
Acute 2GHz, 34 Channel, TravelLogic Series Protocol & Logic Analyzer With 8Gb Memory
Acute TL4234B
-
The TravelLogic Series of Protocol & Logic Analyzers are small enough to fit into your shirt pocket, yet are truly sophisticated logic analyzers, capable of 2 GHz timing analysis, or 200 MHz state analysis, with up to 8 Gb total stackable memory for the 34 channels. They plug into a PC or Laptop USB port making them ideal for the field service technician or engineer, hopping from PC to PC, or taking with them for diagnosis on the road. Also remember that with USB, no additional power supply is needed.
-
Product
DDR1 Memory
-
SQRAM provides DDR1 memory modules for standard and extended temperature operations with extended longevity.
-
Product
EBIRST 50-pin D-type To 2x8-pin Power D-type Adapter
93-005-236
-
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
-
Product
PXIe Isolated Digitizer, 2-channels, 16-bit, 256 V, 32 Msa/Ch memory
M9217A
-
The M9217A PXIe digitizer is a single slot, 2 isolated input channels, supporting up to 256 V and sampling rate of 20 MSa/s and 16-bit resolution.
-
Product
In-Circuit Testing and Test Engineering
GenRad 2287
-
3560 Hybrid Test NodesWindows InterfaceTotal GenRad 227X Migration Capability20 Mhz Clock, Sync, and Trigger, 5 Mhz data ratesVector Test for VLSI, PLCC’s & ASICSTest Express Vectorless TestingMultiple Chain Boundary ScanAnalog Functional Test Module
-
Product
Usability Testing
-
Do your customers have to navigate through a maze of actions on your application to achieve what they need to? Are your customers leaving your website without completing the purchase since they could not find the right link or page?
-
Product
Microwave Testing
140
-
The PICOPROBE® MODEL 140, a high performance microwave probe which incorporates a WR-8 waveguide with our patented coaxial design techniques, has inherent low loss and low dispersion characteristics.
