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Product
80 DIOs, 8AIs, 8AOs JTAG Boundary Scan Resources Unit Expansion
YAV9JTAH
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80 DIOs8 Ais8 AOsCompatible with all JTAG vendors
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Product
Test Port Cable, 1 Mm
11500K
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Connect test ports to devices, fixtures, or probe tips with this 20-cm cable featuring a return loss of 16 dB minimum
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Product
Diffusion Cell Testing
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Teledyne LABS Phoenix™ Dry‐Heat Systems make diffusion‐cell testing faster, easier, and more economical. The Phoenix Systemincludes an advanced diffusion cell design. Options include the compact Phoenix DB-6 six‐cell manual sampling system and the Phoenix RDS automated sampling system capable of handling up to 24 diffusion cells at once.An important advantage of the Phoenix System is the speed with which receptor cell contents are homogenized. Visual testing with red dye placed on the surface of the media at the top of the sampling arm shows complete dispersion occurs within a few seconds.Explore the pages in this section to learn more and to configure your own system.
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Product
Load Cell Simulator
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A High-Stability adjustable Load Cell Simulator.It is specifically designed for Load Cell Fault and System Fault Diagnosis. It also provides a useful Development Tool for any System which relies upon Load Cells. The Output Signal is adjustable from -0.1 to +3.1 mV/V.
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Product
Load Cells
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We make it our business to stay on top of emerging industry demands so that the load cells we provide help you meet your ever-changing test requirements. Our broad selection of competitively priced load products will help you meet the most demanding test and measurement requirements. Used in automotive, aerospace and defense, R&D, and process control applications, our drop-in replacement load cells are designed to provide years of dependable performance.
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Product
S-Type Load Cells
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S-Type load cells are low-cost and high performance side mounted load cells suitable for a number of weighing and general force measurement applications. They come with a 6-foot strain relieved integral cable with pigtail leads that are stripped and tinned for electrical interface.
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Product
EBIRST 78-pin D-type To 68-pin Male SCSI Adapter
93-006-401
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eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Product
Bottom Electrode SMD Test Fixture
16197A
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The 16197A is designed for impedance evaluations of bottom electrode SMDs. It achieves stable frequency characteristics up to 3 GHz and provides highly repeatable measurements. The Keysight 16197A supports various SMD sizes, as small as 1005 (mm)/0402 (inch) and as large as 3225 (mm)/1210 (inch). Accommodation of the 0603 (mm)/0201 (inch) size is available with option 001.
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Product
Image Sensor Test System
IP750
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Teradyne's IP750 series dominates the image sensor tester market with its superior performance and low cost of test. The IP750 delivers high throughput and high parallel test efficiency, broad device test coverage from CCD and CIS, analog and digital capture, and concurrent image sensor and logic testing. In addition, Teradyne's IG-XL software environment provides easy, shorter test program development and easy maintenance.
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Product
Mini Low Profile Load Cell Universal/ Tension or Compression
MLP SERIES
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The model MLP Series load cells were designed with economy as first priority. They are a scaled down version of our successful LPO Series Load Cells. MLP-10 through MLP-300 are anodized aluminum and the MLP-500 through MLP-1K are made from 17-4ph heat treated stainless steel. The unique low profile design of the MLP Series provides excellent stability for in line applications for tension and/or compression, while saving space at the same time.
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Product
Iridium Physical Layer Test Systems
PLTS
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Averna has worked with Iridium to ensure you have the right equipment to support their test coverage. The Iridium PLTS verifies product performance to Iridium’s standards. Find out more!
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Product
Noise Figure Analysis Using NI PXI RF Test Instruments
NI-RFmx Noise Figure
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Measure noise figure, gain, Y-factor, effective temperatures, hot and cold power, and moreOptimized calibration and measurement routines for multi-DUT test using Y-factor and cold sourceSupports the PXIe-5668R 26.5 GHz VSA, the PXIe-5698 26.5 GHz preamplifier, and VSTsDesigned for use with industry-standard noise sources such as the Noisecom NC346 Series
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Product
Press Force Load Cell
6000 Series
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Press Force Load Cells are strain gage based transducers for press-force monitoring. This type offers capacities up to 100 kN with compensated temperature performances. Cable is contained within a stainless steel spring for strain relief purposes for additional protection.
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Product
2-Quadrant Source/Measure Unit for Functional Test, 20 V, 1 A or 6 V, 3 A, 20 W
N6782A
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The Keysight N6782A is a source/measure unit (SMU) designed specifically for advanced functional testing of a device. The ability to modulate the output up to 100 kHz along with capability to source and sink current (2-quadrant operation) makes the N6782A a perfect fit for advanced functional test of a variety of devices such as DC/DC converters, power management units, power amplifiers, and power management ICs. The input stage of the DUT can be stimulated by the fast sourcing and waveform capabilities. While the output stage can be loaded down and measured with the electronic load capabilities, providing a total test solution.
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Product
In-Circuit Test (ICT) Fixtures
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At Forwessun we support and manufacture In-Circuit Test Fixtures for a range of Test Systems. We regularly build fixtures that are supported on a range of systems including - - HP3070- Agilent- Keysight- GenRad- TeradyneWith over 50 years in the industry, we provide a weatlth of knowledge and support to our customers. We are a global company and can support businesses all over the world with the help of over 30 experienced test engineers.
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Product
Display Driver Test System
T6391
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High-resolution flat-panel displays (LCDs / OLEDs) are becoming increasingly integrated. It is common for today's display driver ICs (DDIs) to contain a multitude of logic/analog circuits to manage advanced operations including touch-sensor functions. At the same time, the rapidly growing applications of LCDs / OLEDs in mobile electronics are driving demand for DDI's with smaller sizes and greater capabilities. These factors present serious IC-testing challenges. ADVANTEST's T6391 system is designed to address these needs along with DDIs' increasing number of pins and faster interfaces.
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Product
SoC/Analog Test System
3650-S2
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The Chroma 3650-S2 is specifically designed for high-throughput and high-parallel testing to provide the most cost-effective solution for fabless, IDM and testing houses.
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Product
FPD Tester Model
27014
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Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.
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Product
Load Cells
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Morehouse Instrument Company Inc.
When high accuracy and low risk are critical, customers rely on Morehouse Ultra-Precision Load Cells. These strain gauge type load cells are often the choice for companies that want their reference standard to have the lowest possible uncertainties. Lower uncertainties allow for shorter set up times, less frequent standard changes, and fewer standards to maintain.
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Product
Parallel Plate Dielectric Test Cell
LT-4203A
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The LT-4203A Parallel Plate Dielectric Test Cell is designed for measuring the AC loss characteristics and permittivity of solid laminates and panels per ASTM Standard D150‑98, and implements the guarded electrode (three terminal) measurement preferred as the referee method.
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Product
Low Profile Compression Only Load Column Load Cell with Mounting
CLC SERIES
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Our CLC Series is our high capacity compression only load cell, featuring low profile compact size for a wide range of portable and dedicated applications. The loading diameter (D1) is slightly convex for accurate load distribution. Low deflection through design results in ultra fast frequency response. All ranges are made from 17-4ph heat treated stainless steel and incorporate a stainless steel molded connector system designed to resist washdown and splash. The mating connector, sold separately, is available in three different cable lengths.
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Product
Memory Test System
T5230
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T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Product
VLSI Test System
3380P
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The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Product
ARINC-429 Module
M4K429RTx
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The M4K429RTx is an ARINC-429 multi-channel test and simulation module to be used on the Excalibur 4000 family of carrier boards. The module supports up to ten ARINC-429 channels in any combination of transmitters and receivers. Each of these channels feature error injection and detection capabilities. The receive channels allow for the storage of all selected Labels with status and time tag information appended to each word.
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Product
Cell Harvesters
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Speed and simplicity are the primary strengths of our universal cell harvester. It's a compact, versatile instrument that's ideally suited for use with:*Cell proliferation assays using tritiated thymidine uptake*Receptor binding assays*Adherent cell assays*Cytotoxicity assays*Nucleic acid degradation
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Product
Aviation Engine Test Cells
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1.Design, manufacture and installation: ● Thrust stand components: thrust measurement system, adapter, superstructure etc. ● Facility subsystems: DAQ, supply systems (fuel, oil) etc.2.Civil construction works: site survey, building works etc.3.Contracting: ● Turn-key – MERA is able to supply a “turn-key” test cell including civil works, thrust stand, DAQ, all necessary facility subsystems, specialized software, throttle control level and etc. ● Joint – MERA is capable to supply specified items such as thrust stand with DAQ and software. The Customer is able to procure necessary items such as test nacelle directly from OEM. 4.Project management in accordance to EPC (Engineering, Procurement, Construction, FIDIC) 5.Certification in accordance to international and local standards and rules (SAE 5305) Engine types: PD-14, PS-90, RD-93, RD-33MK, AL-31FN
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Product
Load Cells
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Flintec load cells are highly accurate and built to last. We pride ourselves on the quality of our products and the service we provide.Our sensors are available globally. If your application requires a Custom Solution, our expert engineers can help.
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Product
Bending Beam Load Cell
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Futek Advanced Sensor Technology, Inc.
Are the best fit for many measuring tasks. Here, the signal, on principle, depends on the bending moment.
