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Signal Patchcord, ITA, Mini Power, 50u Gold, 36", 14 AWG White Teflon, Single Ended, (40 Amps)
7-239912000-036
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Signal Patchcord, ITA, Mini Power, 50u Gold, 36", 14 AWG White Teflon, Single Ended, (40 Amps)
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Signal, Patchcord, ITA, 36", TriPaddle, 26 AWG Twisted Pair White/Black, Single Ended (1.5 Amps)
7-105426000-036
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Signal, ITA, TriPaddle (7 Amps) 26 AWG Twisted Pair White/Black (1.5 Amps)
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Conformance Test System
TS8980
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The R&S®TS8980 is the most compact full range conformance testing solution on the market for testing in line with requirements from GCF, PTCRB and regulatory bodies. It supports the entire device certification process for RF and RRM, covering the widest range of technologies including 5G NR based on 3GPP and carrier acceptance specifications. The test system is available in various configurations to cover the required scope of testing.
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FieldFox Handheld Microwave Signal Analyzer, 32 GHz
N9960B
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A lightweight, durable, software-enabled, microwave signal analyzer, interference analyzer, distance-tracking generator, preamplifier, power meter, and more.
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PXI Breadboard Module, 1-Slot, 9-Pin D-Type
40-220A-701
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The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
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Product
Signal, Contact, ITA, TriPaddle, 7 Amp, .025" Square Post for Wire Wrap
610110113
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Primary mating contact 610110177. (May mate with other Receiver contacts, as well.)Plated with 30µ" gold.
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Test Fixture (SMD Components)
16034E
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Perform impedance evaluation on a minimum SMD size of 1.6(L) x 0.8(W) [mm]
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ESD Test System
58154 Series
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ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Combination Board Functional Test System
QT 4256 ATE
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Qmax Test Technologies Pvt. Ltd.
QT 4256 ATE is a combination Board Functional Test System , a main frame Automated Test Equipment (ATE) which can be configured up to maximum of 1280 Bi-directional digital channels ideal for testing circuit card assemblies of high level of complexity and whether it is a legacy or new generation PCB.
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In-Line Test Fixture for 6TL33/6TL36
AB799/AT799
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Fixture Kit for Platforms featuring receiver Virginia Panel 9025 and external pusher system. Its heavy duty design supports more than 1.000N.nnThe fixture kit includes the Base fixture (probe plate) as well as the Puhsers plate.
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Multichannel Signal Generator for DOCSIS 3.1 Downstream & Upstream
CLGD DOCSIS
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The R&S®CLGD is a multichannel signal generator for simulating a cable TV network with full channel loading. It generates broadband data signals for DOCSIS 3.1 as well as digital and analog TV channels. Signals can be freely combined in the downstream or upstream, allowing users to simulate any conceivable channel loading scenario in the lab.
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Fastest In-Circuit Test Platform
TestStation
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Teradyne’s TestStation in-circuit test systems provide electronics manufacturers with reliable high-quality, high-volume testing for the latest printed circuit board assembly (PCBA) technologies that are used in automotive, industrial, computing, consumer, communications, and defense end-products.
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PXI Vector Transceivers
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Get both signal generation and analysis in one PXIe module with real-time field-programmable gate array (FPGA)-accelerated measurements for faster throughput. The PXIe vector transceiver is perfect for manufacturing test of wireless devices, RF power amplifiers, and front-end modules.
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Pro- Benchtop Signal and Spectrum Analyzers
N9042B
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Test the real performance of your millimeter-wave (mmWave) innovations in 5G, satellite, radar, and more with our N9042B UXA X-Series signal analyzer and measurement applications. The N9042B provides the analysis bandwidth and deepest dynamic range to help you solve your most difficult mmWave challenges — tight design margins and timelines, complex modulation, and stringent standards.
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High Throughput Test Platform for Multi-Site & Index Parallel Applications
ETS-88
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The ETS-88 is an optimal test platform for testing a wide variety of devices including: simple analog, high precision, high voltage, high current / power, automotive, video, audio, complex mixed-signal, as well as emerging power processes like SiC and GaN.
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Automatic Test System
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Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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RF Signal Generator
SMB100B
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The new R&S®SMB100B RF signal generator is all about performance and versatility in a small footprint. Outstanding spectral purity and very high output power combined with comprehensive functionality and very simple operation are some of the impressive features of the R&S®SMB100B. It offers a frequency range from 8 kHz to 1 GHz, 3 GHz or 6 GHz.
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LitePoint RF Test System
J750
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The option of adding LitePoint instrumentation to the J750 system delivers a cost-effective, complete production test solution covering global wireless connectivity standards.
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PCI Express, Analyzer Software Included, IEEE 488 GPIB Instrument Control Device for Windows - Onboard GBIP Analyzer
780935-01
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The PCIe‑GPIB+ combines an IEEE 488 controller and an analyzer on one device for computers with PCIe slots. You can use this device to integrate an instrument into your system using GPIB as well as to troubleshoot and solve GPIB hardware and software problems. The PCIe‑GPIB+ achieves maximum IEEE 488.2 transfer rates. With an onboard bus master DMA controller, there is no microprocessor interruption in data transfers. The device includes a license for the NI‑488.2 driver software, providing maximum reliability for connecting to third-party instruments with GPIB.
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Product
6TL36 Inline Handler
AM304
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Test handler 6TL36 able to test DUTs inside Faraday ChamberDual line (bypass)
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PXIe-5820, 500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver
783967-01
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500 MHz, 1 GHz I/Q Bandwidth, Baseband PXI Vector Signal Transceiver—The PXIe‑5820 is the baseband model of the second-generation vector signal transceiver (VST) with 1 GHz of complex I/Q bandwidth. It combines a wideband I/Q digitizer, wideband I/Q arbitrary waveform generator, and high-performance user-programmable FPGA in a single 2-slot PXI Express module. You can use the VST for a variety of applications including baseband I/Q test of wireless and cellular chipsets; envelope tracking of digitally predistorted waveforms for power amplifiers; and the generation and analysis of new wireless standards such as 5G, 802.11ax, and LTE-Advanced Pro.
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Semiconductor Testers
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Our integrated team of semiconductor test innovators delivers a complete system tailored to achieve your specific objectives, incorporating:Test strategyHardware designSoftware development and integrationManufacturingInstallationProgram managementOngoing support
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MXG X-Series Microwave Analog Signal Generator, 9 kHz to 40 GHz
N5183B
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Get a fast, compact (2U) alternative to the PSG in the lab, depot or fieldAddress demanding tests of radar modules & systems with near-PSG levels of spectral purityCompensate for system loss & drive high-power amplifiers: +19 dBm output power, -55 dBc harmonics & -68 dBc spurious @ 20 GHzReduce calibration time with switching speed 600 sSimulate narrowband chirps & radar antenna scans with up to five internal function generators that can be used with AM, FM, OM pulse modulation
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40GHz MW Benchtop Signal Generator
LSX4094B
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The LSX4094B is a 40GHz Four Channel Microwave Signal Generator, offers industry leading performance, in an easy to use benchtop box. It features exceptionally fast switching speed, superior signal integrity and purity and all the necessary modulated signals for analog communication systems. The design offers excellent performance and abilities combined with an affordable price tag, needed from the R&D benches to the production lines.
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Memory Test System
T5833/T5833ES
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T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Signal Patchcord, ITA, 36", QuadraPaddle, 24 AWG Black Teflon, Single Ended
7-121024000-036
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Signal Patchcord, ITA, 36", QuadraPaddle, 24 AWG Black Teflon, Single Ended.
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NI's Wireless Connectivity Functional Test Solution
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The proliferation of wireless functionality in electronic devices is pressuring test developers to deliver more complex testers within shrinking project schedules. Evolving standards and the integration of multiple wireless technologies into new product designs mean developers must prioritize measurement speed and quality to maintain throughput and yield targets. For a solution to meet these sorts of demands, it must:
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Test Handler
M4872
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Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Asynchronous System Level Test Platform
Titan
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The Titan System Level Test (SLT) platform delivers maximum flexibility, scalability and density in semiconductor test environments that require the highest levels of system performance testing. Titan is Teradyne’s solution for high-volume mobile application processor SLT requirements.
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Product
PXI Breadboard Module, 1-Slot, 20-Pin GMCT
40-220A-801
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The 40-220A series of breadboard modules allow the user to construct their own circuit in situations where a suitable PXI module is not available. For example when it is required to integrate a non-switching function into a PXI chassis. Typical applications include: Creating custom circuitry that can be housed in on a 3U board, or to build special one-off switching modules.
