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Product
Medalist i1000D
U9401B
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The Keysight Medalist i1000D is now even better. Improving from its previous state of an analog-only ICT, the new digital release of the system now features per pin programmable digital cards and a whole new set of intuitive software graphical user interfaces (GUIs) that makes programming and development effortless.
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Product
VXI Data Acquisition Modules
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Keysight's VXI Data Acquisition Modules provide a range of switching solutions from DC to microwave with multiple switch topologies.
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Product
Configurable Functional Test System
ATS-5000
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Maximize the uptime of your most critical electronics with the ATS-5000 Functional Test System from Astronics Test Systems. Deployed globally for more than 20 years, the newest version of this tester provides a configurable, affordable solution that delivers just enough test.
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Product
VXI 12-Channel Digital-to-Analog
65DA2-55
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NAI’s 65DA2-55 is a 12-channel Digital-to-Analog Instrument on a VXI board. This single-slot, message-based board provides twelve independent, single-ended, 16-bit, Digital-to-Analog (D/A) channels.
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Product
Bottom Electrode SMD Test Fixture
16198A
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Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
VXI Video Processor System
65VP1
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NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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Product
Modular VXI Switch Card Carrier
1260-101
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The 1260-101 Switch Carrier accommodates two plug-in switch cards in a single slot VXI module.
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Product
VXI Digital IO
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Keysight Technologies offers digital I/O modules to meet your needs for digital sensing and control of simple devices, and digital functional testing.
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
VXI Plug & Play Adapter Plate for Racal Instruments 9U Chassis
310113272
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VXI Plug & Play Plate is used with the Single Tier VXI Receiver (Part # 310 104 127) to mount the Receiver to the VXI Chassis. Flanges must be purchased from the manufacturer.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
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The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Powered VXI Crates
VXI-C Size 6021
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WIENER C-size VXI mainframes of the 6021 deliver highest performance and reliability. Incorporating high density & lowest noise power supply technology the 6021 VXI series is the best choice for any demanding test and measurement VXI application.
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
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The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
VXI 11 Slot C-Size
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High-Performance 11 Slot C Size VXI Monolithic Backplane with High Current Din Conncectors.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
VXI 11 Slot C-Size
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High-Performance 11 Slot C Size VXI Monolithic Backplane with High Current Din Conncectors.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
VXI J1-J2 Series
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VXI is a prime example of the old saying, “if it isn’t broken, don’t fix it.” Since the late 1980’s, VXI has been a trusted standard in the world of testing solutions as a more compact and robust predecessor of the GPIB standard. Arising initially to soothe the need for a more compact and integral open testing standard, VXI is still as necessary and impactful as it was more than 30 years ago.
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Powered VXI Crates
VXI-D size 6021
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WIENER D-size VXI mainframes of the 6021 deliver highest performance and reliability. Incorporating high density & lowest noise power supply technology the 6021 VXI series is the best choice for any demanding test and measurement VXI application.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
VXI Precision PLL Waveform Synthesizer
3152B
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The Racal Instruments™ 3152B Waveform Synthesizer combines 250 MS/s waveform generation performance, versatility, and compact size into a single-slot VXIbus format.The 3152B is a greatly improved version of a fi eld-proven instrument ideal for VXI test stimulus generation. It replaces the 3152A which is standard on many military and commercial test platforms
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Product
Wireless Test Standards Software
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Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Blank Module, VXI Receiver, 2 Module Positions
510104178
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Blank Modules are made from black anodized aluminum or black PEI thermoplastic and are for unused module slots. The Blank Shielding Module fills a module slot and shields signals between the modules. Blank Modules fit either ITA or Receiver positions.
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Product
Regenerative Battery Pack Test System
17040E
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High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Audio and Acoustic Functional Test Solution
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With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
MIL-STD-1553 VXI Module
QVXI2-1553X
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The QVXI-1553X provides new levels of performance and flexibility for MIL-STD-1553A and B Notice II on a C-size card. Available in commercial, industrial and conductively cooled versions with one, two or four dual-redundant channels, the QVXI-1553X includes "abstract" API (Application Programming Interface) software that reduces application development time.
