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Product
Bottom Electrode SMD Test Fixture
16198A
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Designed for impedance evaluations of bottom electrode SMDs and supports 201 (mm) and 402 (mm) sizes
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Product
Double Ridged Waveguide Horn
DRH67
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Frequency range: 6 GHz - 67 GHz VSWR (max): < 1.9:1Impedance: 50 O (Ohm)Connector: 1.85mm female Power (CW / Peak): 5W / 10 W
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Product
PCI Express 4.0 Test Platform
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The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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Product
Antenna, Octave Band Horn
EM-7021 | 2 GHz – 5 GHz
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Electro-Metrics offers three horn antennas, each covering an octave bandwidth from 1 to 10 GHz. The horns are individually calibrated and can be used for either receiving or transmitting applications. They are especially suited to radiated immunity testing and can be used to generate fields in excess of 200 Volts/meter. All three horns feature type “N” connectors and exhibit low VSWR to ensure compatibility with power amplifiers.
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Product
Ethernet and Fibre Channel Test Platform
SierraNet M648
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The SierraNet M648 Ethernet and Fibre Channel test platform provides best in class analysis, jamming and generation for traffic capture and manipulation for testing application and link characteristics. SierraNet M648 is the latest in the line of industry leading test and measurement tools from Teledyne LeCroy, designed for today’s high-speed storage and communications fabrics. SierraNet M648 supports examination and modification of Ethernet and Fibre Channel links utilizing both Pulse Amplitude Modulation 4 (PAM4) and legacy Non-Return to Zero (NRZ) technologies.
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Product
W-CDMA/HSPA+ Analysis Using NI PXI RF Test Instruments
RFmx W-CDMA/HSPA+
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The NI-RFmx W-CDMA personality is a highly optimized API for performing physical layer measurements on W-CDMA cellular standard signals. NI-RFmx W-CDMA is completely interoperable with all NI-RFmx APIs. It provides simple access to the most advanced optimization techniques such as multi-measurement parallelism and multi-DUT measurements. The result is extremely fast and high-quality measurements with minimal software development efforts.
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Product
Double Ridged Waveguide Horn
DRH818
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Frequency range: 7.5 GHz - 18 GHz VSWR (max): < 1.18:1Impedance: 50 O (Ohm) Power (CW / Peak): 1 kW / 2.5 kW
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Product
Double Ridged Waveguide Horn
TEMH20
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Frequency range: 1 GHz - 22 GHz VSWR (max): < 2.6:1Impedance: 50 O (Ohm)Connector: 3.50mm female Power (CW / Peak): 20 W / 50 W
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Product
Lower-Cost Small Footprint In-Circuit Test System
TestStation LHS
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The TestStation LHS in-circuit test system is a lower-cost, small footprint, feature scalable version of Teradyne’s popular, award winning TestStation product family. Compatible with existing TestStation LH fixtures.TestStation LH features the voltage accuracy and backdrive current measurement embedded in Teradyne’s SafeTest protection technology for accurate, reliable and safe powered-up testing of new low-voltage software.
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Product
Laser Diode Reliability Burn-In / Life-Test System
58602
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Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.
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Product
Conical Horn Antennas
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Conical gain horns are offered as both standard and custom models with either a circular or rectangular waveguide interface. While conical gain horns with a rectangular waveguide interface can only support linear polarization, models with a circular waveguide interface can support various polarization types including horizontal, vertical, left-handed circular, and right-handed circular polarization for broader applications. The listed models operate across the full waveguide band and offer 23 dB nominal gain, 12 degrees typical half power beamwidth, a 24 dB typical side lobe level and 1.15:1 VSWR at center frequency. The below standard offering covers the frequency range of 8.5 to 140 GHz. However, other frequencies and standard models with 10, 15, 20 and 25 dB gain are also available.
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Product
Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
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Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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Product
VLSI Test System
3380
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The 3380 VSLI test system equipped with a maximum of 1280 I/O channels, 256 VI sources, flexable architecture and comprehensive optional function boards (ADDA/Hi-voltage DPS) can meet the high parallel multi-test tendency.
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Product
Automated Test Systems
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WinSoft designs, develops and integrates automated functional test systems for use in aerospace, military, high tech and commercial applications
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Product
H(3)TRB & HTGB Test Systems
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SET offers two H(3)TRB and HTGB product lines which differ in the number of test object channels and the range of technical possibilities. The innovative systems are scalable, modular and standardized.
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Product
Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
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Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V and power options between 100 and 300 kW including a Performance Bundle to increase the power up to 330 kW. The new high-voltage SiC (silicon carbide) technology provides a high energy efficiency on a small footprint and helps to minimize your operating costs.
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Product
Dual Polarized Horn
ZLB7-SJ18-40G-833
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Dual Polarized Horn, Frequency 18~40GHz, Gain12dBi, VSWR 2.0, Dual Polarization, 2.92mm-Female
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Product
Wireless Test Standards Software
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Generate and analyze signals for cellular and connectivity standards with NI PXI RF instrumentationPerform advanced automated test with the easy-to-use NI-RFmx software APISave on all NI RF wireless test software under a single license
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Product
Double Ridged Waveguide Horn
QRH400
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Frequency range: 400 MHz - 6 GHz VSWR (max): < 2.3 :1Impedance: 50 O (Ohm)Connector: 2xN female Power (CW / Peak): 350 W / 350 W
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Product
Regenerative Battery Pack Test System
17040E
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High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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Product
Audio and Acoustic Functional Test Solution
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With the growing popularity of Internet of Things devices worldwide, many electrical products are adopting voice commands as their user interface. This means that acoustic and audio test challenges are likely to impact more products than ever before. Test teams must meet extended test coverage requirements to ensure product quality while maintaining throughput and operational efficiency. For a solution to meet these sorts of demands, it must:
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Product
FADEC/EEC Test Platform
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The FADEC/EEC Test Platform provides a hardware in-the-loop (HIL) closed-loop test environment for dynamic and maintenance testing of full-authority digital engine control (FADEC) and electronic engine control (EEC) units of both rotary- and fixed-wing airframes. The system simulates one or more turbofan engines, including its sensors and actuators for use with the most sophisticated FADECs and EECs on the market. The system delivers repeatable, cost-effective testing in a fraction of the time needed with typical in-house simulation test systems.
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Product
EOL RF Functional Test
AS652
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With this RF test platform, integrable according to the specific needs of the product, we cover a very wide range of test needs with manual feeding.Ergonomics have been fully observed in the design, including the option of servo adjustment of the working height according to the operator.
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Product
Antenna, Pyramidal Horn
EM-6119 | 1.7 GHz – 1.9 GHz
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The EM-6119 Pyramidal Horn Antenna is specifically designed for operation in the PCS and DCS bands (1700 MHz to 1900 MHz). Over this frequency range this antenna exhibits a typical gain of 10 dBi, and provides an excellent match with typical VSWR of <1.2:1. This antenna is useful in transmitting as well as receiving signals in this band.
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Product
6TL24 Combinational Base Test Platform
H71002400
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The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
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Product
OLED Lifetime Test System
58131
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The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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Product
Standard Gain Horns
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Standard gain horns can be used to experimentally determine the gain of other antennas by using the substitution method. The standard gain horn and the antenna under test are alternately connected to a well matched detector system in order to compare their relative power levels. The power level difference is then added to the appropriate level of the calibration curve to determine the absolute gain of the antenna under test.View more Standard Gain Horn Antennas
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Product
In-Circuit Test Systems For Sale
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Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Product
Double Ridged Waveguide Horn
DRH30
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Frequency range: 2.5GHz - 30 GHz VSWR (max): < 1.55:1Impedance: 50 O (Ohm)Connector: K female Power (CW / Peak): 25W / 50 W
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Product
Wireless Device Functional Test Reference Solution
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The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
