Pull off Force
strength necessary to extract.
See Also: Force, Compression, Crimp Force, Pull Force, Push Pull Force, Peeling, Tension, Gravity, Electrical, Magnetic
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Benchtop Thermal Forcing System
Wewon Environmental Chambers Co, Ltd.
Benchtop thermal forcing system from Wewon Environmental Chambers Co., Ltd. has a mini body structure and affordable machine price. The machine can test a wide temperature range, Since no compressor is required for refrigeration, so the benchtop temperature forcing unit’s energy consumption is very low. The repeated resistance degree of the tested sample in the instantaneous extremely high temperature and extremely low temperature continuous environment can detect the chemical changes and physical damage caused by thermal expansion and cold contraction of the sample in the shortest time, so as to achieve the goal of confirming the quality of the tested sample.https://www.wewontech.com/benchtop-thermal-forcing-system/
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Shear Beam Force Sensors For Pull/push Direction
INELTA Sensorsysteme GmbH & Co. KG
Inelta Force Sensors operate with foil strain gauges
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60kw off grid power inverter 110/220V split-phase output converter
SDP-60KW
Zhejiang Sandi Electric Co., Ltd
Our SDP series Off Grid Pure sine wave inverter is one of the most advanced DC to AC conversion products in the world, it is suitable use for areas without electricity, vehicles, ships, solar energy, wind turbine and other renewable energy systems and etc, can supply power and provide guarantee effectively for the areas with traffic inconveniences, in the mountains, pastoral, border, island and other areas without electricity.
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Ergonomic Force Gauges
DMG Series
AMETEK Sensors, Test & Calibration
The DMG ergonomic gauge lets you objectively measure manual muscle strength and functional task requirements for almost any application.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type Q, Ø0.80mm, 305gf
K100-Q080305-SKAU
K100 Series, Pitch 100mil, Tip Style Q, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Atomic Force Microscopy
Bruker’s industry-leading AFM microscopes provide the highest levels of performance, flexibility and productivity, and incorporate the very latest advances in atomic force microscopy techniques. Applications range from materials science to biology, from semiconductors to data storage devices, from polymers to optics with measurement of nanoscale topography, nano-mechanical, nano-electrical and nanoscale chemical mapping.
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Force, Materials & Torque
Physical Property Testers Group
We are specialists in force, materials and torque testing solutions for quality control in production line environments and research and development laboratories.
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Atomic Force Microscope for SEM/FIB
AFSEM® AFM Insert
AFSEM is an atomic force microscope (AFM), designed for integration in a SEM or Dualbeam (SEM/FIB) microscope. Its open access design allows you to simultaneously operate SEM and AFM inside the SEM vacuum chamber. The correlated image data of AFM and SEM enable unique characterization of your sample, and the combination of complementary techniques is a key success factor for gaining new insights into the micro and nano worlds. AFSEM enables you to easily combine two of the most powerful analysis techniques to greatly extend your correlative microscopy and analysis possibilities.
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Force Gauge
Shenzhen Graigar Technology Co.,Ltd.
A force gauge is a small measuring instrument used across all industries to measure the force during a push or pull test. Applications exist in research and development, laboratory, quality, production and field environment.
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Centor Easy, graphical force gauge
CNR EA
The Centor Easy force gauges are designed to meet the production needs of its users. This group offers several features which are indispensable today for quality control, for example : ease of reading with its large backlit graphical display, RS232 output, memory of the last 100 values and ability to set thresholds with visual and sound alarms.
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Standard Flexiforce Sensors for Force Measurement
FlexiForce
FlexiForce force sensors are ultra-thin and flexible printed circuits, which can be easily integrated into force measurement applications. These sensors are available for purchase in our online store.
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High Force Type Spring Probes
Total length of spring probes for high force is longer than standard type and is more optimized to use for testing PCB. We have 1mm to 2.54mm pitch and you can choose not only tip type but also spring force for each pitch. This makes it possible for you to choose spring probe suits the best for your use.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type H, Ø0.80mm, 230gf
K100-H080230-SKAU
K100 Series, Pitch 100mil, Tip Style H, Tip Diameter Ø0.80mm, Spring force 230gf, Steel with Gold Plating.
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Centor Easy R, digital force gauge with external sensor
CNR EAR
The Centor Easy R force gauges are designed to meet the production needs of its users. This group offers several features which are indispensable today for Quality Control, for example: ease of reading with its large backlit graphical display, RS232 output, memory of the last 100 values and ability to set thresholds with visual and sound alarms.
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High Force Type Prbobe For PCB, K100 Series 100 Mil Pitch, Receptacle
KR100
K100 Series, Pitch 100mil, Receptacle, no wire wrap pin. Brass with gold finish.
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Force gauge management software
CNR LOCK
CENTOR Manager is a simple, user-friendly utility that enables you to communicate with your CENTOR Easy, Star or Dual memory.It enables you to:– modify the calibration date,– reset the overload counter to zero if the sensor has not been damaged,– block access to the menus and configuration.
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Ergonomic Force Gauges
MSE100 Series
AMETEK Sensors, Test & Calibration
The MSE100 ergonomic gauge is a simple-to-use, ergonomically designed mechanical instrument ideal for muscle strength evaluations and job task analysis.
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On / Off Control Of Temperature
ULP-28
Unitech Scales And Measurements Pvt. Ltd
Unitech on/off temperature control module through relay with present value and set value display.
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AFM (Atomic Force Microscope) Optical Platform
The AFM platform allows fully-integrated use of confocal Raman microscopy and AFM for Tip-Enhanced Optical Spectroscopies (such as Tip-Enhanced Raman Spectroscopy (TERS) and Tip-Enhanced PhotoLuminescence (TEPL)), but also for truly co-localized AFM-Raman measurements.The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source). TERS and TEPL can provide nanoscale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type C, Ø1.50mm, 305gf
K100-C150305-SKAU
K100 Series, Pitch 100mil, Tip Style C, Tip Diameter Ø1.50mm, Spring force 305gf, Steel with Gold Plating.
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High Force Type Probe For PCB, K100 Series 100mil Pitch, Type A, Ø0.80mm, 305gf
K100-A080305-SKAU
K100 Series, Pitch 100mil, Tip Style A, Tip Diameter Ø0.80mm, Spring force 305gf, Steel with Gold Plating.
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Force Sensor Elements
The STL Force Sensing Tension Links are a series of unique force sensors. The Tension Links utilize the internal strain gage process sucessfully and are used in bolts, load pins and flat load cells. The sensing element consists of a strain gage bridge circuit internally installed in a small hole along the longitudinal axis. This unique arrangement provides a most effective means for the protective sealing of the internal electronics while minimizing the adverse effects of extraneous torsion and bending loads.
