Switching Systems
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Threaded Switch Probes
Product sensing - microswitch in a probe - plastic or metal cup - adjustable height.
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Alternate 1.10 (31.18) - 7.20 (204.00) Switch Probe
TSP100-C100-2
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,990Overall Length (mm): 50.60Switch Point (mil): 59Switch Point (mm): 1.50
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2x8 USB Solid State Switch Matrix, 300 KHz To 6.5 GHz
P9165A
P9165A 2x8 USB solid state switch matrix, 300 KHz to 6.5 GHz is a full cross-bar switch matrix that provides a switch based multiport VNA solution in the form of compact USB controlled involving larger scale of multi-DUT or multiport measurements such as 5G massive MIMO antenna measurement and others.
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PXI Single 2 Channel (M Mode) SC 50 Cons
40-855-212-M50
Fiber Optic MEMS Switching cards available in many high density formats with a choice of five different connector styles to suit most applications
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Mezzanine System
5041
ECM P/N 5041 provides eight channels of RS485 / RS422 I/O with fixed 120 ohm termination for each channel. Speeds are up to 30M bits per second. All channels power up as inputs. Also transceiver inputs are always enabled for loop back diagnostic use when the outputs are enabled. Software can enable outputs on a channel by channel basis.
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Automatic Test System
Automatic Test system is the ultimate solution for power electronic testing. The system includes a wide range of hardware choice such as AC/DC Sources, Electronic Loads, DMM, Oscillate Scope, Noise Analyzer and Short /OVP Tester. This flexibility combined with its open architecture software platform-PowerPro III, gives users a flexible, powerful and cost effective test system for almost all types of power supply testing.
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Battery Management (BMS) Environmental Test System
The BMS Environmental Test System is a configurable platform simulating the essential signals used by Battery Management Systems (BMS) and cell-monitoring modules with the ability to perform environmental testing on multiple BMS units simultaneously. The system implements single-point value testing to evaluate specific BMS functions such as cell over and under voltage scenarios, cell leakage current, lost communications, or faulty system IO.
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Regenerative Battery Pack Test System
17040E
High-power testing equipment up to 1,700V/ 4800A/ 1.2MW Multiple safety protections for personnel safety risk management and control of battery testing Flexible Integration for automated battery verification solutions
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PXI/PXIe MEMS Optical Switch, Triple Insert/Bypass, Single-Mode, 9/125 Fiber, MU Connectors, With Interlock
42-860A-332-HI
The 40/42-860A-332-HI is a PXI/PXIe triple insert/bypass switch with MU connectors, includes hardware interlock and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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16-Ch SPST 10A-277VAC High Current
YAV90086
16 power relays SPST Switching up to 2770VA 16A Switching 125Vac 10A Switching 277Vac CAN Control (or Ethernet with Ethernet to CAN Gateway) Drivers dll & VIs available
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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8-Sites ISP & I2C/SPI Interface
YAV90ISP
Industrial Programmers Interface up to 8 targetsRelay BarrierDemultiplexer module up to 32 devicesCommunication Interfaces I2C and SPI
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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NI Semiconductor Test Systems
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
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Smart Aircraft System
The Astronics Smart Aircraft System makes that possible. Our patented system enables the immediate, cabin-wide gathering of thousands of data points using sensors & IoT (Internet of Things) technology. The result? You get the insightyou need—when you need it. Insight that helps you on every flight. Insight that allows you to improve your operational efficiency, your cabin safety, and your overall passenger experience.
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General Purpose PXI Relay Switch Modules
PXI relay switch modules offer reliable switching in a variety of configurations. They consist of multiple independent single-pole single-throw (SPST), single-pole double throw (SPDT), double-pole single-throw (DPST) and double-pole double-throw (DPDT) relays. Our PXI relay switch modules come in a variety of relay types including reed relays, electromechanical relays (EMR) and solid state relays—offering you the optimum switching performance for your application.
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PXI Dual Microwave Transfer Switch 18GHz 50 SMA
40-782A-522
The 40-782A-522 is a dual transfer switch and is part of our range of PXI microwave switching modules. It has a characteristic impedance of 50Ω and a maximum operating frequency of 18GHz. Connections are made via front panel mounted high quality SMA coaxial connectors.
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PXI 10A Fault Insertion Switch 6-chan 2-bus
40-192-012
This PXI fault insertion switch uses solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test: Open-Circuit. Short-Circuit between UUT connections. Short-Circuit to external signals. Through relays on each channel enable signals to the UUT to be set open-circuit. Fault Insertion Buses allow any channel to be shorted to any other channel and also enable any channel to be connected to an external signal such as Power, Ignition or Ground to simulate fault conditions. The module is supplied with 2 fault buses.
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PXI/PXIe RF Switch, Octal SPDT, Terminated, 8GHz, 50Ω, SMA
40-880B-004
The 40-880B-004 (PXI) and 42-880B-004 are octal SPDT 50Ω RF switches with 8GHz bandwidth. The 40/42-880B range have automatic termination of unused signals and are available as a dual switch in a 1-slot, a quad switch in 2-slots or hex and octal switches in 3-slots.
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Switch Probes
Switch point flexibilityDesigned for long life and reliable performanceVariety of tip options
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Component Test Systems
These products include test peripherals used with test systems, such as interfaces that connect semiconductor devices with test systems, and handlers that transport semiconductors to the test system. System-level test equipment and software are also included in this category.
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In-Circuit Test System Repairs
Forwessun provides expert repair services for a wide range of Test Systems, helping you maintain optimal performance and extend the life of your equipment. Our team of skilled technicians quickly identifies and addresses issues, ensuring that your system is back in operation with minimal downtime. We handle both routine and complex repairs, offering comprehensive solutions to keep your systems running efficiently and reliably.
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Source / Measure Unit (SMU) Modules, N6700 Power System
The Keysight N6780 family of source/measure units (SMUs) provide advanced features and precise control and measurements of voltage and current down to the microampere and nanoampere regions. They provide stable, glitch-free output voltage and current during high-speed load changes, fast output modulation, and high-speed measurements of both voltage and current simultaneous.
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LTE RRM Test System
T4010S
The T4020S LTE RRM tester is the Keysight platform for LTE RRM conformance testing of LTE UEs. T4020S belongs to the Keysight LTE product family and, as the other LTE T4000S test platforms, is based on the T2010A LTE Wireless Communications Test Set.
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PXIe Microwave Transfer Switch, Single, 26.5 GHz, 50 Ω, SMA, Failsafe, Remote Mount
42-782B-531-E
The 40-782B-531-E (PXI) and 42-782B-531-E (PXIe) single failsafe transfer switches with remotely mounted relays are part of our range of PXI microwave switching modules. They have a characteristic impedance of 50 Ω and a maximum operating frequency of 26.5 GHz. Connections are made via front panel mounted high quality SMA coaxial connectors.
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PXIe Flexible Microwave Module, Dual SP4T Terminated 40 GHz, Single SPDT 40 GHz, 50 Ω, SMA
42-890-002
The 40-890 (PXI) and 42-890 (PXIe) range of PXI microwave modules allows users to specify the mix of relay types, frequencies and quantities based on the application requirements within the capabilities of the module driver card. Choose from the extensive relay selection already available in the Pickering microwave range to create a flexible solution.
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PXI Hybrid Coaxial Switch: DC to 40 GHz, Dual Transfer
M9156CH40
The Keysight M9156CH40 PXI hybrid dual transfer switch module provides an exceptional 0.03 dB insertion loss repeatability, high isolation, low SWR with a long operating life up to 10 million cycles.
